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Assia Benachir

Publications and source records attributed to Assia Benachir.

2 recordsLinked to original sources

Tunable Dynamic Speckle Generation for Random Illumination Microscopy

Speckled illumination enhances widefield fluorescence microscopy by enabling optical sectioning and super resolution. In random illumination microscopy, sequences of speckled illumination patterns are used to excite fluorescent samples and images are reconstructed based on a statistical analysis of the intensity fluctuations. Although random illumination microscopy has been shown to give excellent performance, its widespread implementation is hindered by the high cost and complexity of the generation of suitable speckled illumination patterns, which is achieved using digital micro-mirror devices or spatial light modulators. Here, we present a zwitterion-doped liquid crystal (LC) device capable of generating independent, high-contrast speckle patterns with a tunable decorrelation time in the 0.1 s to 0.1 ms range under visible laser illumination. This LC-based dynamic speckle generator is applied to widefield random illumination fluorescence microscopy of tissue and cell samples, where it enables optical sectioning with a 2 micron axial resolution, and a 1.5-fold improvement in lateral spatial resolution. Owing to its low cost and simplicity, this LC speckle generator offers an attractive alternative to digital micro-mirror and spatial light modulator devices for implementing widefield random illumination microscopy.

physics.optics

Widefield two-photon random illumination microscopy (2P-RIM)

Biological and biomedical samples are routinely examined using focused two-photon (2P) fluorescence microscopy due to its intrinsic axial sectioning and reduced out-of-focus bleaching. However, 2P imaging often requires excitation intensities that can damage samples through ionization and radical formation. Additionally, the lateral resolution of 2P microscopy is lower compared to linear one-photon (1P) fluorescence microscopy. Widefield 2P microscopy, using cameras, holds promise for reducing photo-toxicity while maintaining high image acquisition rates. Widefield imaging trades the high power and short integration times of sequential single point scanning for the low power and extended integration times of parallel detection across millions of pixels. However, generating effective axial sectioning over arbitrarily large fields of view (FOVs) has remained a challenge. In this work, we introduce 2P Random Illumination Microscopy (2P-RIM), an easy-to-implement 2P widefield technique, that achieves low photo-damage, fast imaging, micrometric axial sectioning, and enhanced lateral resolution for arbitrarily large FOVs. By using widefield speckled illuminations in conjunction with an image standard deviation matching algorithm, 2P-RIM demonstrated multicolor imaging over FOVs greater than 200 um, lateral resolution 220 nm, axial sectioning 2 um, and peak excitation powers about 10 times lower than those used in focused laser scanning microscopy.

physics.optics