arXiv subjects

Ataberk Olgun

Publications and source records attributed to Ataberk Olgun.

At least 19 recordsLinked to original sources

arXiv2026

CertiFlash: A Formal Verification Framework for Flash Translation Layers in Computational Solid State Drives

Data-intensive applications move large amounts of data from storage to the compute unit, incurring significant data movement overhead. Storage-centric computing reduces this overhead by moving computation near or inside solid-state drives (SSDs). Enabling it requires modifying SSD policies, e.g., address translation and garbage collection, which are part of the Flash Translation Layer (FTL), the SSD's firmware. Modifying the FTL is error-prone. Because FTL logic has direct access to security-critical device components, even a functionally correct FTL can leak data between tenants, drop integrity tags, or assign a flash block to the wrong tenant. We show that a faulty FTL can corrupt the device state at five surfaces inside the SSD, and demonstrate them on a DaisyPlus OpenSSD. Prior work verifies individual FTL designs, but has two limitations. (1) It establishes only functional correctness, so a modified FTL can violate isolation, integrity, and ownership and still pass verification. (2) It is tied to a single FTL design, so every modification requires redoing every proof. We propose CertiFlash, a formal verification framework for FTLs, mechanized in the Rocq proof assistant, that gives designers a machine-checked proof of security and correctness. CertiFlash models an FTL as a deterministic state machine with a single global invariant over mapping, isolation, integrity, ownership, and allocation. We prove once, over a general FTL model, that (i) every FTL operation preserves the invariant and (ii) the model refines an idealized block device. For a new design, a designer discharges five hypotheses about its own operations instead of redoing either proof. Across four case studies, a designer adds 27 to 3,231 lines against a 16,489-line framework, significantly reducing the verification effort. CertiFlash is open source.

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arXiv2026

Demystifying DRAM Read Disturbance: Bridging the Gap Between Experimental Characterization and Device-Level Modeling of RowHammer and RowPress Phenomena

DRAM read disturbance, like RowHammer and RowPress, is a critical robustness issue where accessing DRAM can cause unintended bitflips in other unaccessed DRAM locations. DRAM read disturbance bitflips significantly impact the safe, secure, and reliable operation of DRAM-based computing systems. Many prior works experimentally characterize these bitflips and propose mitigations based on empirical results. Other device-level works study their underlying physical mechanisms, but these mechanisms do not fully explain all major empirical observations. Our goal is to bridge the gap between experimental characterization and device-level modeling and understanding of RowHammer and RowPress, providing a principled foundation for future work on understanding, characterizing, and mitigating DRAM read disturbance. We first identify and demonstrate gaps and inconsistencies between the physical mechanisms of RowHammer and RowPress described by existing device-level models and experimental characterization of their bitflips. We focus on three fundamental metrics that should map to first-order physical mechanisms: 1) bitflip directions, 2) bitflip counts, and 3) the minimum number of aggressor row activations that trigger the first bitflips (i.e., ACmin). Second, we present a comprehensive and rigorous set of TCAD simulations that match phenomena observed in experimental characterizations of RowHammer and RowPress bitflips. From our results, we 1) summarize updated device-level error mechanisms for understanding RowHammer and RowPress bitflips, and 2) identify key modeling and simulation parameters that significantly affect whether simulation results match real-chip characterization. We discuss implications for 1) rigorous, comprehensive, and efficient experimental characterization methodologies of DRAM read disturbance bitflips, and 2) the design of DRAM read disturbance mitigation techniques.

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arXiv2026

Clutch: High Performance Vector-Scalar Comparison using DRAM via Chunked Temporal Coding

Vector-scalar comparison is a fundamental computation primitive that compares each element in a vector against a single scalar value. It is widely used in various data-intensive workloads from databases to machine learning. Due to its low computational intensity, its execution tends to be memory-bound, limiting the utilization of compute resources. Processing-using-DRAM (PuD) is an emerging computing paradigm that performs massively parallel bitwise operations directly inside DRAM arrays, alleviating off-chip data movement. Existing PuD-based approaches require many DRAM commands because the comparison's algorithmic complexity grows with operand bit-width in the bit-serial execution model. This command overhead becomes the dominant bottleneck, limiting application-level speedup. We propose Clutch, a data representation and comparison algorithm that accelerates vector-scalar comparisons in PuD systems with high efficiency and scalability. Clutch first uses temporal coding, encoding each vector value as a sequence of leading ones, which enables lookup-based comparison against a scalar by accessing the corresponding DRAM row. To avoid the prohibitive memory footprint of lookup tables at high precision, Clutch partitions operands into multiple multi-bit chunks, compares chunks independently using compact lookup tables, and merges the per-chunk results with a PuD-efficient procedure. By adjusting the number of chunks, Clutch provides a flexible tradeoff between throughput and memory usage. Across predicate evaluation and decision tree inference, Clutch improves end-to-end application throughput and energy efficiency by an average of 12x and 69x over highly optimized CPU and GPU execution, and by 2.9x and 3.0x over the state-of-the-art bit-serial PuD implementation. We also present the first mapping of decision tree inference to PuD execution, extending PuD to a new application domain.

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arXiv2026

DejaVu: Why You Should Write to Your DRAM Rows Twice, Carefully

We provide the first experimental demonstration of DejaVu, a phenomenon where the data previously written to DRAM cells affects DRAM's vulnerability to read disturbance. Our experimental characterization using 112 COTS DDR4 DRAM chips from all three major manufacturers shows that, compared to the baseline where we initialize the victim row by writing to it only once, 1) overwriting it with the opposite data reduces ACmin, the minimum aggressor row activation count to induce a bitflip, and 2) writing the same data twice increases ACmin. We provide two hypotheses to explain DejaVu. First, we hypothesize that overwriting the victim row with opposite data values causes under-restoration of charge in DRAM cells. Second, we hypothesize that overwriting the victim row changes charge trap states in the active region, affecting read-disturbance-induced cell leakage current. We conduct controlled characterization to provide insight into these hypotheses. We further characterize the reliability of Processing-Using-DRAM (PUD) operations with DRAM rows initialized with DejaVu patterns. Our characterization of 32-row MAJ-3 operation shows that overwriting the DRAM rows used in the operation reduces the number of bitlines that fail to reliably perform MAJ-3 by 32.7% on average compared to the baseline where rows are written only once. Based on our observations, we describe two major implications of DejaVu. We show how DRAM testing and characterization methodologies should account for DejaVu to accurately characterize read disturbance vulnerability under fixed data patterns and rigorously study data-pattern effects without unintended interference from DejaVu. We also evaluate the performance overhead of read disturbance mitigation techniques when thresholds need to be lowered to be secure against DejaVu, showing a 6.3% overhead when reducing the threshold by 20%.

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arXiv2026

ColumnKeeper: Efficient Solutions to the ColumnDisturb Vulnerability in DRAM-based Systems

Modern DRAM chips are vulnerable to read disturbance phenomena such as RowHammer and RowPress, which induce bitflips after accessing nearby rows a certain number of times (the read disturbance threshold). ColumnDisturb is a new, fundamentally different DRAM read disturbance phenomenon. Specifically, ColumnDisturb (i) disturbs DRAM columns instead of rows, and (ii) increases the number of affected DRAM cells from those in only a few neighboring rows to all cells across three consecutive DRAM subarrays. We propose ColumnKeeper, the first set of ColumnDisturb mitigations, in two variants: ColumnKeeper-D (CK-D), a deterministic mechanism, and ColumnKeeper-P (CK-P), a probabilistic one. CK-D exploits DRAM's open-bitline architecture to provide deterministic security guarantees at low performance and energy overheads: it uses two counters per subarray to track activations affecting the odd and even columns, and refreshes one row in a subarray when either counter reaches a predetermined threshold. CK-P instead refreshes one row in three consecutive subarrays upon a row activation in the middle subarray, with a predetermined probability, providing configurable security guarantees at low area overhead. Both mechanisms prevent ColumnDisturb bitflips at low performance, energy, and area overheads. At the current experimentally-demonstrated ColumnDisturb threshold (1M), CK-D and CK-P incur very low average single-core performance overheads of 0.15% and 0.36%, respectively. For near-future thresholds (128K), these rise to a still low average of 1.70% and 2.73%. Mitigating ColumnDisturb at low thresholds (e.g., 16K) remains possible by adopting smaller subarray sizes or enabling subarray-level parallelism. CK-D and CK-P require low area overheads of 0.1 mm^2 and 0.03 mm^2, respectively. ColumnKeeper is freely available at https://github.com/CMU-SAFARI/ColumnKeeper .

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arXiv2026

Memory-Centric Computing: Security Benefits and Challenges of Processing-in-DRAM

Today's computing systems are processor-centric: they require frequent data movement between processing elements (e.g., CPU) and main memory (DRAM), leading to significant inefficiencies in performance and energy consumption. Memory-centric computing instead moves computation to the data, enabling computation capability in and near all places where data is generated and stored, and greatly reducing the performance and energy overheads of data access and data movement. This shift from a processor-centric to a memory-centric paradigm has important and underexplored consequences for system security. Turning memory from a dumb, inactive store into an active computing substrate introduces benefits as well as challenges for system security: it can provide new in-memory security primitives and also reduce data exposure, but it can also expose new attack surfaces. This work discusses the security benefits and challenges of memory-centric computing, specifically Processing-in-DRAM (PiD), a paradigm where the operational characteristics of a DRAM chip are exploited and enhanced to perform computation on data stored in DRAM. Specifically, we describe 1) new state-of-the-art DRAM-based true random number generators that provide up to 16.05 Gb/s throughput and physical unclonable functions with 5.75% lower evaluation latency than the prior state-of-the-art, both on real DRAM chips and 2) two key security challenges of PiD: amplified DRAM read disturbance (e.g., 158x reduction in the minimum number of DRAM accesses required to induce the first bitflip) and high throughput memory timing channels (e.g., a communication throughput of 14.8Mb/s). We believe it is time to design, use, and program DRAM, and in general memory, not as an inactive storage substrate, but as a combined computation, storage, and security substrate, where computational capability, storage density, and security are all key goals.

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arXiv2026

PuDGhost: Experimental Analysis of Computation Result Corruption in Processing-using-DRAM Operations on Real DRAM Chips and Implications for Future Systems

Processing-using-DRAM (PuD) is a promising computation paradigm that alleviates frequent data movement between main memory and processing units by using each DRAM column as a computation engine via simultaneous multiple-row activation (SiMRA). Unfortunately, DRAM density scaling may hinder PuD's benefits: denser cell arrays bring rows and columns closer, making regular DRAM operations susceptible to noise and interference from neighboring cells. Yet no prior work investigates whether interference from rows or columns not intended to participate in computation can compromise PuD robustness. In this work, we reveal PuDGhost, an interference phenomenon where a PuD operation in a given column produces erroneous results due to interference from 1) data in non-activated DRAM rows and 2) data in other columns that compute concurrently under the same SiMRA operation. PuDGhost violates the ideal picture that each column's computation depends solely on its own operand data, threatening future PuD systems. We present the first extensive characterization of PuDGhost using 96 real DDR4 DRAM chips from 12 modules, quantifying these two interference sources under various conditions. Among our 15 new empirical observations, we highlight two major results: 1) data in adjacent non-activated rows affects SiMRA outputs by up to 10% for random inputs, and 2) data in concurrently computing columns affects SiMRA outputs by up to 48% for random inputs. Guided by these findings, we propose countermeasures across multiple layers of the PuD computing stack. Specifically, we evaluate on real DDR4 DRAM chips: 1) robust column screening that reduces the risk of using unreliable columns in the presence of PuDGhost, and 2) a compute row layout that mitigates PuDGhost via dedicated rows between compute rows. Our solutions greatly improve PuD computation accuracy and provide a foundation for robust future PuD systems.

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arXiv2026

In-DRAM Signature Generation Using Simultaneous Multiple-Row Activation: An Experimental Study of Off-The-Shelf DRAM Chips

We experimentally demonstrate that it is possible to generate unique, repeatable, and device-specific signatures suitable for use as Physical Unclonable Function (PUF) responses in commercial off-the-shelf (COTS) DRAM chips by leveraging simultaneous multiple-row activation (SiMRA). Based on a rigorous experimental characterization of 112 modern DDR4 DRAM chips (from 10 modules), we introduce SiMRA-PUF, the first DRAM-based PUF that uses SiMRA-generated signatures as PUF responses. We analyze SiMRA-PUF in terms of reliability, uniqueness, and evaluation latency for varying numbers of simultaneously activated DRAM rows (i.e., 2, 4, 8, 16, and 32), DRAM chip density & die revision, and evaluate how temperature affects the similarity of SiMRA-generated responses. Among our 8 key experimental observations, we highlight two major results. First, SiMRA-PUF provides average intra-Jaccard indices of 89.02%, 89.81%, 93.03%, 94.06%, and 94.86%, and average inter-Jaccard indices of 3.98%, 2.37%, 3.44%, 2.92%, and 3.24% for 2-, 4-, 8-, 16-, and 32-row activations, respectively, showing that SiMRA-generated signatures are both repeatable within a device and unique across devices. Second, 2-row activation-based SiMRA-PUF provides 5.75% lower evaluation latency than the state-of-the-art DRAM-based PUF. We open-source our infrastructure and datasets at https://github.com/CMU-SAFARI/SiMRA-PUF.

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arXiv2026

Extended Abstract: Re-Evaluating the Real-System Modeling Accuracy of Ramulator 2.0

Cycle-level DRAM simulators provide accurate and flexible models for DRAM and memory controller operations and enable research on current and future memory systems. Therefore, they are critical for improving the performance, efficiency, and robustness of DRAM-based memory systems. Ramulator 2.0 (successor of Ramulator) is a highly modular and extensible cycle-accurate DRAM simulator that enables rapid exploration of new ideas in DRAM-based memory systems. A MICRO 2024 best paper runner-up publication, A Mess of Memory System Benchmarking, Simulation and Application Profiling, which we refer to as "the Mess paper," with all three artifact badges awarded (including "Reproducible"), proposes a new benchmark to evaluate real and simulated memory system performance. While doing so, it makes strong negative claims about Ramulator 2.0 and shows unexpected results. In this talk and the associated extended abstract, we demonstrate that these results and claims in the Mess paper are incorrect and are due to configuration and simulator usage errors made in the Mess paper. We describe four best practices to aid users and developers of simulation tools to avoid such issues in the future. We emphasize the importance of contacting simulator authors and developers when unexpected results are observed (especially and importantly before publishing such results), to ensure these simulators are used with correct configurations and as intended. Our investigation also aims to stimulate discussion on artifact evaluation practices and on mechanisms for correcting results and artifacts after publication. To aid future works and reproduction of all our results, we open source all our code and scripts at https://github.com/CMU-SAFARI/Cleaning-up-the-Mess. We refer the reader to our full ISPASS 2026 paper and its artifact for the complete analysis, detailed methodology, and extended results.

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arXiv2026

A Modern Large-Scale Memory Characterization Laboratory

Real memory chip characterization yields insights into fundamental operational characteristics of modern memory, enabling new mechanisms that improve memory performance, robustness, security, and energy efficiency. We describe our large-scale DRAM characterization laboratory for understanding DRAM. A key building block of this laboratory is DRAM Bender, a versatile and easy-to-use modern DRAM characterization infrastructure. We have updated DRAM Bender to i) introduce support for new types of characterization experiments, ii) expand on its DRAM interface standard support, and iii) make it easier to use at large scale. This paper introduces these updates for the first time. We hope our infrastructure enables the community to discover new problems and solve critical memory scaling issues, enabling the overcoming of the huge memory bottleneck that plagues modern computing systems.

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arXiv2026

Ramulator 2.1: A Composable Memory System Simulator for Modern DRAM Systems

Ramulator 2.1 is a major overhaul of Ramulator 2.0 that substantially improves the simulator in three directions: 1) support of modern and emerging DRAM and memory-controller features, 2) better usability and extensibility of the simulator, and 3) more comprehensive tests and validation workflows. Ramulator 2.1 adds support for advanced features in recent and emerging DRAM standards and memory controllers, including HBM3/4, LPDDR5/6, and GDDR7. To improve usability and extensibility, Ramulator 2.1 introduces a Python-based modeling and configuration interface backed by a two-way code-generation framework that 1) hides low-level C++ code behind high-level DRAM specifications written in Python, and 2) automatically creates Python proxies for all components of the simulator. Doing so enables users to rapidly create variants of DRAM standards and automate design-space-exploration workflows. To improve trustworthiness in simulation results, Ramulator 2.1 provides a comprehensive testing and validation infrastructure that covers both 1) fine-grained validation of specific DRAM timing constraints and memory-controller scheduling behavior, and 2) system-level performance evaluation using latency-throughput curves. To aid performance analysis and debugging, Ramulator 2.1 also includes an easy-to-use and high-performance DRAM command trace visualizer. Ramulator 2.1 is open-source on GitHub and under active development.

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arXiv2026

ScaleDisturb: Exploiting Temporal Asymmetry to Amplify Read Disturbance in Modern DRAM Chips

DRAM suffers from read disturbance phenomena (e.g., RowHammer and RowPress), where repeatedly accessing or continuously keeping open a DRAM row (aggressor row) induces bitflips in other physically nearby unaccessed rows (victim rows). The disturbance mechanism is practically exploitable from the software stack and worsens across generations with continued density scaling. DRAM read disturbance is highly sensitive to memory access patterns, yet prior work explores read disturbance under only a limited set of access patterns. We present ScaleDisturb, a new DRAM access pattern that can amplify DRAM read disturbance by asymmetrically extending the open time of two aggressor rows. Our rigorous experimental characterization of 196 DDR4 and 3 HBM2 DRAM chips shows that ScaleDisturb (1) leads to bitflips at significantly fewer row activations, compared to state-of-the-art memory access patterns, (2) makes read disturbance attacks easier across all tested DRAM chips, (3) increases DRAM vulnerability to read disturbance as DRAM manufacturing technology scales down to smaller node sizes. We showcase a proof-of-concept attack on a real system where a user-level program leveraging ScaleDisturb induces more bitflips than state-of-the-art RowHammer and RowPress memory access patterns. We describe and evaluate four solutions for mitigating read disturbance bitflips in the presence of ScaleDisturb and call for more research on the topic.

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arXiv2026

DiscoRD: An Experimental Methodology for Quickly Discovering the Reliable Read Disturbance Threshold of Real DRAM Chips

State-of-the-art DRAM read disturbance mitigations rely on the read disturbance threshold (RDT) (e.g., the number of aggressor row activations needed to induce the first read disturbance bitflip) to securely and performance- and energy-efficiently prevent read disturbance bitflips. However, accurately and exhaustively characterizing the RDT of every DRAM row in a chip is time intensive. Rapidly determining RDT is important for enabling secure, performance- and energy-efficient systems. Our goal is to develop and evaluate a reliable and rapid read disturbance testing methodology. To that end, we develop DiscoRD building on the key results of an extensive experimental characterization study using 212 real DDR4 chips whereby we measure the RDT of hundreds of thousands of DRAM rows millions of times. We develop an empirical model for read disturbance bitflips and evaluate the probability of read-disturbance-induced uncorrectable errors when a read disturbance mechanism is configured using a single $RDT_{min}$ measurement. Using this model we demonstrate that 1) relying on a lightweight error-correcting code (ECC) alone yields relatively high uncorrectable error probability and 2) combining ECC, infrequent memory scrubbing, and configurable read disturbance mitigation mechanisms can greatly reduce the error probability. Building on our observations and analyses, we discuss the RDT of each individual row can be identified more precisely. Our results show that error tolerance, memory scrubbing, online profiling, and run-time configurable read disturbance mitigation techniques are important to enable secure and energy-efficient spatial-variation aware read disturbance mitigations. We hope that DiscoRD drives research that enables us to quantitatively navigate the performance/cost - reliability tradeoff space for read disturbance mitigation techniques.

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arXiv2025

In-DRAM True Random Number Generation Using Simultaneous Multiple-Row Activation: An Experimental Study of Real DRAM Chips

In this work, we experimentally demonstrate that it is possible to generate true random numbers at high throughput and low latency in commercial off-the-shelf (COTS) DRAM chips by leveraging simultaneous multiple-row activation (SiMRA) via an extensive characterization of 96 DDR4 DRAM chips. We rigorously analyze SiMRA's true random generation potential in terms of entropy, latency, and throughput for varying numbers of simultaneously activated DRAM rows (i.e., 2, 4, 8, 16, and 32), data patterns, temperature levels, and spatial variations. Among our 11 key experimental observations, we highlight four key results. First, we evaluate the quality of our TRNG designs using the commonly-used NIST statistical test suite for randomness and find that all SiMRA-based TRNG designs successfully pass each test. Second, 2-, 8-, 16-, and 32-row activation-based TRNG designs outperform the state-of-theart DRAM-based TRNG in throughput by up to 1.15x, 1.99x, 1.82x, and 1.39x, respectively. Third, SiMRA's entropy tends to increase with the number of simultaneously activated DRAM rows. Fourth, operational parameters and conditions (e.g., data pattern and temperature) significantly affect entropy. For example, for most of the tested modules, the average entropy of 32-row activation is 2.51x higher than that of 2-row activation. For example, increasing the temperature from 50{\deg}C to 90{\deg}C decreases SiMRA's entropy by 1.53x for 32-row activation. To aid future research and development, we open-source our infrastructure at https://github.com/CMU-SAFARI/SiMRA-TRNG.

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arXiv2025

Cleaning up the Mess: Re-Evaluating the Real-System Modeling Accuracy of Ramulator 2.0

A MICRO 2024 best paper runner-up publication (the Mess paper) with all three artifact badges awarded (including ``Reproducible'') proposes a new benchmark to evaluate real and simulated memory system performance. The publication contends that Ramulator 2.0 and DAMOV (ZSim+Ramulator) (along with other existing memory system simulators) ``poorly resemble the actual system performance'' and asserts that their simulator is better. In this paper, we show that the Mess paper has 1) demonstrable technical misconfigurations, 2) methodological errors in interpreting simulation statistics, and 3) an incomplete artifact that makes its key results irreproducible. We demonstrate that the Ramulator 2.0 simulation results reported in the Mess paper are incorrect due to multiple configuration errors instead of inherent simulation inaccuracy claimed by the Mess paper. We show that by correctly configuring Ramulator 2.0, Ramulator 2.0's simulated memory system performance actually resembles real system characteristics well, and thus a key claimed contribution of the Mess paper is factually incorrect. We also identify that the DAMOV simulation results in the Mess paper use wrong simulation statistics that are unrelated to the simulated DRAM performance. We show that DAMOV's simulated DRAM latency is not constant, in contrast to the Mess paper's claim. Moreover, the Mess paper's artifact repository lacks the necessary sources to fully reproduce all the Mess paper's results. We find that the experiment scripts use simulator executables and other resources that are neither described in the Mess paper nor found in the artifact repository. We strongly encourage the computer architecture community to consider our corrections to the Ramulator 2.0 and DAMOV results of the Mess paper to prevent the propagation of inaccurate and misleading results and to maintain the reliability of the scientific record.

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arXiv2025

ColumnDisturb: Understanding Column-based Read Disturbance in Real DRAM Chips and Implications for Future Systems

We experimentally demonstrate a new widespread read disturbance phenomenon, ColumnDisturb, in real commodity DRAM chips. By repeatedly opening or keeping a DRAM row (aggressor row) open, we show that it is possible to disturb DRAM cells through a DRAM column (i.e., bitline) and induce bitflips in DRAM cells sharing the same columns as the aggressor row (across multiple DRAM subarrays). With ColumnDisturb, the activation of a single row concurrently disturbs cells across as many as three subarrays (e.g., 3072 rows) as opposed to RowHammer/RowPress, which affect only a few neighboring rows of the aggressor row in a single subarray. We rigorously characterize ColumnDisturb and its characteristics under various operational conditions using 216 DDR4 and 4 HBM2 chips from three major manufacturers. Among our 27 key experimental observations, we highlight two major results and their implications. First, ColumnDisturb affects chips from all three major manufacturers and worsens as DRAM technology scales down to smaller node sizes (e.g., the minimum time to induce the first ColumnDisturb bitflip reduces by up to 5.06x). We observe that, in existing DRAM chips, ColumnDisturb induces bitflips within a standard DDR4 refresh window (e.g., in 63.6 ms) in multiple cells. We predict that, as DRAM technology node size reduces, ColumnDisturb would worsen in future DRAM chips, likely causing many more bitflips in the standard refresh window. Second, ColumnDisturb induces bitflips in many (up to 198x) more rows than retention failures. Therefore, ColumnDisturb has strong implications for retention-aware refresh mechanisms that leverage the heterogeneity in cell retention times: our detailed analyses show that ColumnDisturb greatly reduces the benefits of such mechanisms.

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arXiv2025

PuDHammer: Experimental Analysis of Read Disturbance Effects of Processing-using-DRAM in Real DRAM Chips

Processing-using-DRAM (PuD) is a promising paradigm for alleviating the data movement bottleneck using DRAM's massive internal parallelism and bandwidth to execute very wide operations. Performing a PuD operation involves activating multiple DRAM rows in quick succession or simultaneously, i.e., multiple-row activation. Multiple-row activation is fundamentally different from conventional memory access patterns that activate one DRAM row at a time. However, repeatedly activating even one DRAM row (e.g., RowHammer) can induce bitflips in unaccessed DRAM rows because modern DRAM is subject to read disturbance. Unfortunately, no prior work investigates the effects of multiple-row activation on DRAM read disturbance. In this paper, we present the first characterization study of read disturbance effects of multiple-row activation-based PuD (which we call PuDHammer) using 316 real DDR4 DRAM chips from four major DRAM manufacturers. Our detailed characterization show that 1) PuDHammer significantly exacerbates the read disturbance vulnerability, causing up to 158.58x reduction in the minimum hammer count required to induce the first bitflip ($HC_{first}$), compared to RowHammer, 2) PuDHammer is affected by various operational conditions and parameters, 3) combining RowHammer with PuDHammer is more effective than using RowHammer alone to induce read disturbance error, e.g., doing so reduces $HC_{first}$ by 1.66x on average, and 4) PuDHammer bypasses an in-DRAM RowHammer mitigation mechanism (Target Row Refresh) and induces more bitflips than RowHammer. To develop future robust PuD-enabled systems in the presence of PuDHammer, we 1) develop three countermeasures and 2) adapt and evaluate the state-of-the-art RowHammer mitigation standardized by industry, called Per Row Activation Counting (PRAC). We show that the adapted PRAC incurs large performance overheads (48.26%, on average).

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arXiv2025

EasyDRAM: An FPGA-based Infrastructure for Fast and Accurate End-to-End Evaluation of Emerging DRAM Techniques

DRAM is a critical component of modern computing systems. Recent works propose numerous techniques (that we call DRAM techniques) to enhance DRAM-based computing systems' throughput, reliability, and computing capabilities (e.g., in-DRAM bulk data copy). Evaluating the system-wide benefits of DRAM techniques is challenging as they often require modifications across multiple layers of the computing stack. Prior works propose FPGA-based platforms for rapid end-to-end evaluation of DRAM techniques on real DRAM chips. Unfortunately, existing platforms fall short in two major aspects: (1) they require deep expertise in hardware description languages, limiting accessibility; and (2) they are not designed to accurately model modern computing systems. We introduce EasyDRAM, an FPGA-based framework for rapid and accurate end-to-end evaluation of DRAM techniques on real DRAM chips. EasyDRAM overcomes the main drawbacks of prior FPGA-based platforms with two key ideas. First, EasyDRAM removes the need for hardware description language expertise by enabling developers to implement DRAM techniques using a high-level language (C++). At runtime, EasyDRAM executes the software-defined memory system design in a programmable memory controller. Second, EasyDRAM tackles a fundamental challenge in accurately modeling modern systems: real processors typically operate at higher clock frequencies than DRAM, a disparity that is difficult to replicate on FPGA platforms. EasyDRAM addresses this challenge by decoupling the processor-DRAM interface and advancing the system state using a novel technique we call time scaling, which faithfully captures the timing behavior of the modeled system. We believe and hope that EasyDRAM will enable innovative ideas in memory system design to rapidly come to fruition. To aid future research EasyDRAM implementation is open sourced at https://github.com/CMU-SAFARI/EasyDRAM.

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