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B. Sorée

Publications and source records attributed to B. Sorée.

2 recordsLinked to original sources

Impact of gate voltage on switching field of perpendicular magnetic tunnel junctions with a synthetic antiferromagnetic free layer

We present micromagnetic simulations and experiments on voltage-assisted field switching in perpendicular magnetic tunnel junctions (MTJs) with a synthetic antiferromagnetic (SAF) free layer, where the magnetic state of one sublayer is detected via tunneling magnetoresistance (TMR). Simulations reveal that local modulation of perpendicular magnetic anisotropy (PMA) in one SAF sublayer leads to distinct switching characteristics. The switching field varies linearly with the anisotropy field, indicating voltage-controlled magnetic anisotropy (VCMA)-dominated dynamics similar to single free-layer devices. We then experimentally study the magnetic switching field of MTJ devices with SAF free layers under applied gate voltage. By varying the MgO tunnel barrier thickness to systematically modulate the resistance-area (RA) product, we enable quantitative separation of spin-transfer torque (STT), VCMA, and Joule heating contributions. Our findings indicate that VCMA dominates in devices with a high RA product, while low-RA devices exhibit nonlinear switching behavior due to enhanced contributions from STT and Joule heating. Furthermore, the effective fields derived from STT, VCMA, and Joule heating contributions under various gate voltages show minimal dependence on device critical dimensions, indicating favorable scaling behavior. This work presents a unified framework analyzing the roles of STT, VCMA, and Joule heating in SAF-based voltage-gated spin-orbit torque (SOT) MRAM, offering key insights for the optimization of performance, energy efficiency, and scalability in SOT-MRAM technologies.

cond-mat.mes-hall↗

Back-hopping in Spin-Transfer-Torque switching of perpendicularly magnetized tunnel junctions

We analyse the phenomenon of back-hopping in spin-torque induced switching of the magnetization in perpendicularly magnetized tunnel junctions. The analysis is based on single-shot time-resolved conductance measurements of the pulse-induced back-hopping. Studying several material variants reveals that the back-hopping is a feature of the nominally fixed system of the tunnel junction. The back-hopping is found to proceed by two sequential switching events that lead to a final state P' of conductance close to --but distinct from-- that of the conventional parallel state. The P' state does not exist at remanence. It generally relaxes to the conventional antiparallel state if the current is removed. The P' state involves a switching of the sole spin-polarizing part of the fixed layers. The analysis of literature indicates that back-hopping occurs only when the spin-polarizing layer is too weakly coupled to the rest of the fixed system, which justifies a posteriori the mitigation strategies of back-hopping that were implemented empirically in spin-transfer-torque magnetic random access memories.

cond-mat.mtrl-sci↗