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Barbara Putz

Publications and source records attributed to Barbara Putz.

3 recordsLinked to original sources

Microscale bending plasticity and fracture behavior of amorphous aluminum oxide films

Recent work has demonstrated microscale compressive plasticity in pulse laser deposited (PLD) amorphous alumina (a-Al2O3). This work explores microscale bending plasticity and fracture behavior of a-Al2O3 films deposited using three different methods-PLD, atomic layer deposition (ALD) and sputter deposition (SD). The three deposition routes produced amorphous films with similar stoichiometric compositions. We demonstrate, for the first time, bending plasticity in PLD and ALD a-Al2O3 films at microscale using in situ microcantilever bending experiments at room temperature. All tested PLD a-Al2O3 microcantilevers showed substantial ductile behavior in bending by accommodating total strains >10% without fracture. Half of the tested ALD a-Al2O3 cantilevers exhibited elastic brittle fracture while the other half showed bending plasticity, indicating that the observed deformation behavior is strongly influenced by the presence and distribution of defects within the tested volume. All SD a-Al2O3 microcantilevers showed elastic brittle failure attributed to their columnar growth microstructure. The microscale bending response was found to be highly dependent on the film deposition method highlighting the role of defects in suppressing plasticity mechanisms. Notched microcantilever bending tests on all three films showed brittle failure with similar fracture toughness value of 3.1 +/- 0.2 MPa.m0.5, effectively ruling out any localized crack tip plasticity. These findings underscore the importance of minimizing defects during fabrication in order to develop damage tolerant amorphous oxides. Nonetheless, the observation of bending plasticity in both PLD and ALD microcantilevers, which include a tensile stress component as well, suggests that the plastic deformation mechanisms in amorphous alumina are more general and are not exclusively governed by the deposition method.

cond-mat.mtrl-sci

Data-efficient 4D-STEM in SEM: Beyond 2D Materials to Metallic Materials

Four-dimensional scanning transmission electron microscopy (4D-STEM) is a powerful tool that allows for the simultaneous acquisition of spatial and diffraction information, driven by recent advancements in direct electron detector technology. Although 4D-STEM has been predominantly developed for and used in conventional TEM and STEM, efforts are being made to implement the technique in scanning electron microscopy (SEM). In this paper, we push the boundaries of 4D-STEM in SEM and extend its capabilities in three key aspects: (1) faster acquisition rate with reduced data size, (2) higher angular resolution, and (3) application to various materials including conventional alloys and focused ion beam (FIB) lamella. Specifically, operating the MiniPIX Timepix3 detector in the event-driven mode significantly improves the acquisition rate by a factor of a few tenths compared to conventional frame-based mode, thereby opening up possibilities for integrating 4D-STEM into various in situ SEM testing. Furthermore, with a novel stage-detector geometry, a camera length of 160 mm is achieved which improves the angular resolution amplifying its utility, for example, magnetic or electric field imaging. Lastly, we successfully imaged a nanostructured platinum-copper thin film with a grain size of 16 nm and a thickness of 20 nm, and identified annealing twins in FIB-prepared polycrystalline copper using virtual darkfield imaging and orientation mapping. This work demonstrates the potential of synergetic combination of 4D-STEM with in situ experiments, and broadening its applications across a wide range of materials.

cond-mat.mtrl-sci

Magnetron Sputtered Non-Toxic and Precious Element-Free Ti-Zr-Ge Metallic Glass Nanofilms with Enhanced Biocorrosion Resistance

The chemical composition and structural state of advanced alloys are the decisive factors in optimum biomedical performance. This contribution presents unique Ti-Zr-Ge metallic glass thin-film compositions fabricated by magnetron sputter deposition targeted for nanocoatings for biofouling prevention. The amorphous nanofilms with nanoscale roughness exhibit a large relaxation and supercooled liquid regions as revealed by flash differential scanning calorimetry. Ti\textsubscript{68}Zr\textsubscript{8}Ge\textsubscript{24} shows the lowest corrosion (0.17 \textmu A cm\textsuperscript{\textminus2}) and passivation (1.22 \textmu A cm\textsuperscript{\textminus2}) current densities, with the lowest corrosion potential of \textminus0.648 V and long-range stability against pitting, corroborating its excellent performance in phosphate buffer solution at 37 {\textdegree}C. The oxide layer is comprised of TiO\textsubscript{2}, TiO\textsubscript{\emph{x}} and ZrO\textsubscript{\emph{x}}, as determined using X-ray photoelectron spectroscopy by short-term ion-etching of the surface layer. The two orders of magnitude increase in the oxide and interface resistance (from 14 to 1257 {\textOmega} cm\textsuperscript{2}) along with an order of magnitude decrease in the capacitance parameter of the oxide interface (from 1.402 x 10\textsuperscript{\textminus5} to 1.677 x 10\textsuperscript{\textminus6} S s\textsuperscript{n} cm\textsuperscript{\textminus2}) of the same composition is linked to the formation of carbonyl groups and reduction of the native oxide layer during linear sweep voltammetry.

cond-mat.mtrl-sci