arXiv subjects

Baskar Ganapathysubramanian

Publications and source records attributed to Baskar Ganapathysubramanian.

110 records · Page 7Linked to original sources

arXiv2011

A near real-time framework for extracting tip-sample forces in dynamic atomic force microscopy (dAFM)

The atomic force microscope (AFM) is a versatile, high-resolution tool used to characterize the topography and material properties of a large variety of specimens at nano-scale. The interaction of the micro-cantilever tip with the specimen causes cantilever deflections that are measured by an optical sensing mechanism and subsequently utilized to construct the sample topography. Recent years have seen increased interest in using the AFM to characterize soft specimens like gels and live cells. This remains challenging due to the complex and competing nature of tip-sample interaction forces - large tip-sample interaction force is necessary to achieve good signal-to-noise ratios; However, large force tends to deform and destroy soft samples. In situ estimation of the local tip-sample interaction force is needed to control the AFM cantilever motion and prevent destruction of soft samples while maintaining a good signal-to-noise ratio. This necessitates the ability to rapidly estimate the tip-sample forces from the cantilever deflection during operation. This paper proposes a first approach to a near real-time framework for tip-sample force inversion. We pose the inverse problem of extracting the tip-sample force as an unconstrained optimization problem. A fast, parallel forward solver is developed by utilizing graphical processing units (GPU). This forward solver shows an effective 30000 fold speed-up over a comparable CPU implementation, resulting in milli-second calculation times. The forward solver is coupled with a GPU based particle-swarm optimization implementation. We illustrate the framework on three classes of tip-sample interaction inversions. Each of these inversions is performed in sub-second timings, showing potential for integration with on-line AFM imaging and material characterization

cond-mat.mtrl-sci↗

arXiv2011

A novel graph-based formulation for characterizing morphology with application to organic solar cells

Organic solar cells have the potential for widespread usage due to their promise of low cost, roll-to-roll manufacturability, and mechanical flexibility. However, deployment is impeded by their relatively low power conversion efficiencies. The last decade has seen significant progress in enhancing the power conversion of these devices through various strategies. One such approach is based on morphology control. This is because morphology affects all phenomena involved in solar conversion: light absorption and electron-hole pair (exciton) generation; exciton diffusion and dissociation into free charges; and transport of charges to the electrodes. Progress in experimental characterization and computational modeling now allow reconstruction and imaging of the thin film morphology. This opens up the possibility of rationally linking fabrication with morphology, as well as morphology with performance. In this context, a comprehensive set of computational tools to rapidly quantify and classify the heterogeneous internal structure of thin films will be invaluable in linking process, structure and property. We present a novel graph-based framework to efficiently construct a broad suite of physically meaningful morphology descriptors. These morphology descriptors are further classified according to the physical subprocesses within an organic solar cells. The approach is motivated by the equivalence between a discretized morphology and a labeled, weighted, undirected graph. We utilize this approach to pose key questions related to structure characterization. We subsequently construct estimates and upper bounds of various efficiencies. The approach is showcased by characterizing the effect of thermal annealing on time-evolution of a thin film morphology. We conclude by formulating natural extensions to characterize crystallinity and anisotropy of the morphology using the framework.

cond-mat.mtrl-sci↗