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Bonggeun Shong

Publications and source records attributed to Bonggeun Shong.

3 recordsLinked to original sources

Role of surface states and band modulations in ultrathin ruthenium interconnects

Mitigating the RC delay from transistor miniaturization is essential for next-generation devices, driving a focus on interconnect electrical performance. Current copper-based interconnects face a critical challenge, that their resistivity sharply increases at the nanometer-scale due to surface and grain boundary scattering. Therefore, there is a pressing need for techniques that reduce resistance in ultrathin metal films. In this study, we employ the density functional theory to investigate how the intrinsic electronic structure of thin films impacts conductivity as a function of thickness. Notably, our analysis of ruthenium slab structures shows that surface states significantly influence thickness-dependent resistivity. It reveals that vacuum-terminated Ru slab exhibits decreasing resistivity with the decrease in thickness, whereas oxygen-terminated Ru slab shows the opposite trend. This difference is fundamentally attributed to the presence or absence of surface states, highlighting the importance of surface engineering in optimizing interconnect performance.

cond-mat.mtrl-sci

First-principles high-throughput screening of ruthenium compounds for advanced interconnects

As interconnect dimensions continue to shrink, the industry-standard copper faces a critical increase in resistivity, presenting a significant hurdle to overall device performance. To overcome this limitation, this work investigates the potential of ruthenium (Ru)-based compounds, encompassing binary, ternary, and quaternary systems, as viable alternatives to copper (Cu). Ruthenium is regarded as a strong candidate, owing to its inherent advantages in reliability and more favorable resistivity scaling at reduced dimensions. Moreover, forming compounds offers an effective strategy to engineer novel properties, expanding the material design space beyond the constraints of pure metals. Utilizing a high-throughput screening methodology, we systematically investigated a broad spectrum of 2,106 Ru-based compounds to identify candidates with superior electronic transport and reliability characteristics. Consequently, we successfully identified a total of 61 promising candidates that exhibit excellent resistivity scaling behavior and enhanced reliability. These findings demonstrate that Ru-based compounds offer a viable pathway to overcome the scaling limitations of next-generation interconnects.

cond-mat.mtrl-sci

Scale-robust Low Resistance Transport in Atomic Layer Deposited Topological Semimetal Wafers on Amorphous Substrate

As data-centric computing advances, energy-efficient interconnects are increasingly critical for AI-driven systems. Traditional metal conductors face severe limitations at nanoscale due to increased resistivity from surface scattering. In response, this study demonstrates the first wafer-scale realization of an amorphous topological semimetal, tantalum phosphide (TaP), grown directly on amorphous SiO2 substrates (without any seed layers) using low-temperature atomic layer deposition (ALD). The resulting TaP films exhibit unconventional resistivity scaling: decreasing resistivity with decreasing thickness, reaching 227 micro-ohm cm at ~2.3 nm film thickness. This behavior, observed without crystalline order or seed layers, indicates dominant surface conduction and establishes ALD-TaP as a promising candidate for back-end-of-line integration. The films also show excellent conformality, stoichiometry control, and thermal stability up to 600 degree C. A two-channel conduction model confirms surface-dominated transport in ultrathin regimes, further supported by enhanced conductivity in multi-stacked configurations. These findings highlight the potential of amorphous topological semimetals for future high-density, low-power electronic interconnects and expand the applicability of ALD for integrating novel quantum materials at scale.

cond-mat.mtrl-sci