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Bruno Endres Forlin

Publications and source records attributed to Bruno Endres Forlin.

4 recordsLinked to original sources

Shooting Neutrons at Neurons: Radiation Testing of a Spiking Neural Network on Flash-Based FPGAs

Neuromorphic, or spiking, processors are increasingly being considered for use in harsh, radiation-prone environments such as space and avionics, where energy efficiency and graceful degradation are essential. In this study, we propose and experimentally validate a radiation-testing methodology specifically designed for neuromorphic processors that employ on-chip synaptic plasticity. We map the open-source ODIN SNN processor with Spike-Dependent Synaptic Plasticity (SDSP) onto the FPGA and expose it to a high-energy neutron beam while continuously monitoring MNIST classification accuracy and recording the synaptic state. From these measurements, we extract SEU cross-sections for ODIN's synaptic memory and develop a calibrated fault model to inform a complementary fault-injection campaign. By comparing inference-only and online-learning configurations, we demonstrate that enabling SDSP can significantly extend the time to application-level failure and enable partial recovery from accumulated bit flips, with modest hardware overhead.

cs.AR

InTreeger: An End-to-End Framework for Integer-Only Decision Tree Inference

Integer quantization has emerged as a critical technique to facilitate deployment on resource-constrained devices. Although they do reduce the complexity of the learning models, their inference performance is often prone to quantization-induced errors. To this end, we introduce InTreeger: an end-to-end framework that takes a training dataset as input, and outputs an architecture-agnostic integer-only C implementation of tree-based machine learning model, without loss of precision. This framework enables anyone, even those without prior experience in machine learning, to generate a highly optimized integer-only classification model that can run on any hardware simply by providing an input dataset and target variable. We evaluated our generated implementations across three different architectures (ARM, x86, and RISC-V), resulting in significant improvements in inference latency. In addition, we show the energy efficiency compared to typical decision tree implementations that rely on floating-point arithmetic. The results underscore the advantages of integer-only inference, making it particularly suitable for energy- and area-constrained devices such as embedded systems and edge computing platforms, while also enabling the execution of decision trees on existing ultra-low power devices.

cs.LG

FPGA Innovation Research in the Netherlands: Present Landscape and Future Outlook

FPGAs have transformed digital design by enabling versatile and customizable solutions that balance performance and power efficiency, yielding them essential for today's diverse computing challenges. Research in the Netherlands, both in academia and industry, plays a major role in developing new innovative FPGA solutions. This survey presents the current landscape of FPGA innovation research in the Netherlands by delving into ongoing projects, advancements, and breakthroughs in the field. Focusing on recent research outcome (within the past 5 years), we have identified five key research areas: a) FPGA architecture, b) FPGA robustness, c) data center infrastructure and high-performance computing, d) programming models and tools, and e) applications. This survey provides in-depth insights beyond a mere snapshot of the current innovation research landscape by highlighting future research directions within each key area; these insights can serve as a foundational resource to inform potential national-level investments in FPGA technology.

cs.AR

Trikarenos: Design and Experimental Characterization of a Fault-Tolerant 28nm RISC-V-based SoC

RISC-V-based fault-tolerant system-on-chip (SoC) designs are critical for the new generation of automotive and space SoC architectures. However, reliability assessment requires characterization under controlled radiation doses to accurately quantify the fault tolerance of the fabricated designs. This work analyzes the Trikarenos design, a SoC implemented in TSMC 28nm, for single event upset (SEU) vulnerability under atmospheric neutron and 200 MeV proton radiation, comparing these results to simulation-based fault injection. All faults in error correction codes (ECC) protected memory are corrected by a scrubber, showing an estimated cross-section per bit of up to $1.09 \times 10^{-14}$ cm$^2$ bit$^{-1}$. Furthermore, the triple-core lockstep (TCLS) mechanism implemented in Trikarenos is validated and is shown to correct errors affecting a cross-section up to $3.23 \times 10^{-11}$ cm$^2$, with the remaining uncorrectable vulnerability below $5.36 \times 10^{-12}$ cm$^2$. When augmenting the experimental analysis of fabricated chips with gate-level fault injection in simulation, 99.10 % of injections into the SoC produced correct results, while 100 % of injections in the TCLS-protected cores were handled correctly. With 12.28 % of all injected faults leading to a TCLS recovery, this indicates an approximate effective flip-flop cross-section of up to $1.28 \times 10^{-14}$ cm$^2$/FF.

physics.ins-det