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Byeongdu Lee

Publications and source records attributed to Byeongdu Lee.

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Remote epitaxy beyond polarity

Remote epitaxy through a monolayer two-dimensional material-covered substrate establishes a crystallographic registry across the van der Waals (vdW) surface that enables the epitaxial growth, lift-off and transfer of single-crystalline films. A central belief in remote epitaxy is that the substrate facilitating the phenomenon must be a material with strong ionicity, as the interatomic electrostatic potential fluctuation in covalent and metallic materials is substantially attenuated by two-dimensional materials. Here, we show remote epitaxy is possible when the substrate is a metallic or covalently bonded material and experimentally demonstrate non-polar remote homo- and heteroepitaxy across a wide range of material systems, including both metals and semiconductors. The achieved non-polar remote interactions are designed and engineered by harnessing substrate conductivity and vicinal surface step-edge density. These findings indicate that remote epitaxy is universal and applicable to ionic, metallic, and covalent materials, expanding its capabilities and stimulating a plethora of new fundamental scientific questions about the mechanism of remote epitaxy.

cond-mat.mtrl-sci

Tomographic Phase Imaging with Randomized Probe Imaging

We demonstrate tomographic phase imaging of cubic gold nanoparticles with sub-100 nm resolution requiring just a single far-field coherent diffraction pattern per projection. By using randomized probe imaging (RPI), a real-space amplitude and phase image can be reconstructed from a single diffraction pattern. These phase images are then fed into a standard tomographic workflow to retrieve the 3D volume. Nanoscale X-ray phase tomography has often relied on ptychography, which requires slow 2D scanning for each projection. By using RPI, the data collection is greatly sped up at the cost of some resolution. We compare an RPI-tomography volume to a ptychography-tomography volume of the same sample, finding high consistency between the two methods. To the best of our knowledge, this is the first application of RPI to tomography.

physics.optics