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Chakkrit Tantithamthavorn

Publications and source records attributed to Chakkrit Tantithamthavorn.

56 records · Page 4Linked to original sources

The Impact of Automated Parameter Optimization on Defect Prediction Models

Defect prediction models---classifiers that identify defect-prone software modules---have configurable parameters that control their characteristics (e.g., the number of trees in a random forest). Recent studies show that these classifiers underperform when default settings are used. In this paper, we study the impact of automated parameter optimization on defect prediction models. Through a case study of 18 datasets, we find that automated parameter optimization: (1) improves AUC performance by up to 40 percentage points; (2) yields classifiers that are at least as stable as those trained using default settings; (3) substantially shifts the importance ranking of variables, with as few as 28% of the top-ranked variables in optimized classifiers also being top-ranked in non-optimized classifiers; (4) yields optimized settings for 17 of the 20 most sensitive parameters that transfer among datasets without a statistically significant drop in performance; and (5) adds less than 30 minutes of additional computation to 12 of the 26 studied classification techniques. While widely-used classification techniques like random forest and support vector machines are not optimization-sensitive, traditionally overlooked techniques like C5.0 and neural networks can actually outperform widely-used techniques after optimization is applied. This highlights the importance of exploring the parameter space when using parameter-sensitive classification techniques.

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The Impact of Correlated Metrics on Defect Models

Defect models are analytical models that are used to build empirical theories that are related to software quality. Prior studies often derive knowledge from such models using interpretation techniques, such as ANOVA Type-I. Recent work raises concerns that prior studies rarely remove correlated metrics when constructing such models. Such correlated metrics may impact the interpretation of models. Yet, the impact of correlated metrics in such models has not been investigated. In this paper, we set out to investigate the impact of correlated metrics, and the benefits and costs of removing correlated metrics on defect models. Through a case study of 15 publicly-available defect datasets, we find that (1) correlated metrics impact the ranking of the highest ranked metric for all of the 9 studied model interpretation techniques. On the other hand, removing correlated metrics (2) improves the consistency of the highest ranked metric regardless of how a model is specified for all of the studied interpretation techniques (except for ANOVA Type-I); and (3) negligibly impacts the performance and stability of defect models. Thus, researchers must (1) mitigate (e.g., remove) correlated metrics prior to constructing a defect model; and (2) avoid using ANOVA Type-I even if all correlated metrics are removed.

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