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Chris Yannic Bohlemann

Publications and source records attributed to Chris Yannic Bohlemann.

2 recordsLinked to original sources

Controlling catalyst agglomeration in high-density unordered III-V nanowire growth using Au colloid solutions

III-V semiconductor nanowires (NWs) are a promising platform for optoelectronic and photoelectrochemical applications, where device performance strongly depends on NW density and spatial arrangement. While ordered arrays provide precise control, their fabrication requires complex and costly lithographic techniques. Unordered growth offers a scalable alternative but is limited by insufficient control over catalyst distribution and particle agglomeration. Here, we investigate the density scaling of unordered III-V NW arrays using commercially available Au colloid solutions as catalysts for NW growth via vapor-liquid-solid growth mode. Repeated deposition cycles yield a near-linear increase in particle density, which is ultimately limited by non-linear agglomeration effects not captured by simple stochastic models. To address this limitation, a previously established pre-anneal growth concept is transferred from patterned catalyst arrays to randomly deposited Au colloids, thereby suppressing thermally induced coalescence and stabilizing the catalyst distribution. This approach enables up to a tenfold increase in NW density while improving uniformity and vertical yield. The method is demonstrated for colloid diameters between 100 and 200 nm. Overall, this work provides a scalable, lithography-free route toward high-density III-V NW ensembles and offers insight into the role of particle dynamics in colloid-based growth processes.

cond-mat.mtrl-sci↗

On the origin of bulk-related anisotropies in surface optical spectra

Reflection anisotropy spectroscopy (RAS) is a powerful method for probing the optical properties of surfaces, used routinely in research and industrial applications, yet the origin of 'bulk-related' features that appear in the spectra of various surfaces has been debated for nearly 40 years. It is often argued that these features are related to surface-induced bulk anisotropy (SIBA) because they coincide with critical energies of the bulk dielectric function. In general, any quantitative RAS theory must include excitonic effects as they significantly influence the spectra and are believed to be the key to determining the origin of SIBA features. Here, we introduce a layer-resolved exciton localization (LREL) measure within the framework of many-body perturbation theory, which enables a quantitative analysis of the origins of 'bulk-related' RAS features. Applying LREL to arsenic-modified silicon reconstructions reveals that, depending on the surface reconstruction, the 'apparent' SIBA features arise primarily from states localized at the surface, with only a small contribution from the underlying layers. Our findings, further supported by the fact that the calculated spectra agree well with low-temperature RAS measurements, challenge the conventional explanation of 'bulk-related' RAS features. They indicate that in many instances bulk-enhanced surface anisotropies (BESA)-the opposite of SIBA-contribute to, or are even responsible for, 'bulk-related' RAS features. Therefore, we suggest that previously studied semiconductor surfaces, which exhibit 'bulk-related' features in their spectra, should be reanalyzed using the presented method.

cond-mat.mtrl-sci↗