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Christiana Chamon Garcia

Publications and source records attributed to Christiana Chamon Garcia.

2 recordsLinked to original sources

How Fragile Is On-Device Language Model Safety? Localizing Safety-Critical Parameters for Sparse Fault Analysis

As small language models (SLMs) are increasingly deployed on resource-constrained and on-device platforms, including as components of agentic systems, the integrity of locally stored model parameters becomes an important safety concern. We investigate whether safety-sensitive behavior in LLaMA-2-7B-Chat is concentrated within a sparse subset of parameters, creating a reduced fault surface for targeted analysis. We study two complementary localization methods: low-rank safety-associated subspace analysis and parameter-level safety--utility importance filtering. Both approaches reveal highly non-uniform safety sensitivity across the network, with the MLP down_proj consistently emerging as a prominent safety-sensitive component and o_proj providing a smaller contribution. Using parameter-level localization, modifying only 0.19% of model weights in down_proj yields 53% Basic ASR and 56% GCG ASR, while tinyBenchmarks accuracy remains at 51.6% compared with a 52.2% unmodified baseline. These results motivate targeted fault analysis and selective integrity protection for language models deployed in resource-constrained, on-device, and agentic settings.

cs.AI↗

BitFlipScope: Scalable Fault Localization and Recovery for Bit-Flip Corruptions in LLMs

Large Language Models (LLMs) deployed in practical and safety-critical settings are increasingly susceptible to bit-flip faults caused by hardware degradation, cosmic radiation, or deliberate fault-injection attacks such as Rowhammer. These faults silently corrupt internal parameters and can lead to unpredictable or dangerous model behavior. Localizing these corruptions is essential: without identifying the affected region, it is impossible to diagnose the source of degradation, apply targeted corrective measures, or restore model functionality without resorting to costly fine-tuning or full retraining. This work introduces BitFlipScope, a scalable, software-based framework for identifying fault-affected regions within transformer architectures under two deployment scenarios. When a clean reference model is available, BitFlipScope performs differential analysis of outputs, hidden states, and internal activations for detecting anomalous behavior indicative of corruption to pinpoint or localize faults. When no reference model exists, it uses residual-path perturbation and loss-sensitivity profiling to infer the fault-impacted region directly from the corrupted model. In both settings, the framework not only enables effective fault diagnosis but also supports lightweight performance recovery without fine-tuning, offering a practical path to restoring corrupted models. Together, these capabilities make BitFlipScope an important step toward trustworthy, fault-resilient LLM deployment in hardware-prone and adversarial environments.

cs.DC↗