arXiv subjects

Christopher Habenschaden

Publications and source records attributed to Christopher Habenschaden.

2 recordsLinked to original sources

arXiv2026

On the influence of reference sample properties on magnetic force microscopy calibrations

Magnetic force microscopy (MFM) allows the characterization of magnetic stray field distributions with high sensitivity and spatial resolution. Based on a suitable calibration procedure, MFM can also yield quantitative magnetic field values. This process typically involves measuring a reference sample to determine the distribution of the tip's stray field or stray field gradient at the sample surface. This distribution is called the tip transfer function (TTF) and is derived through regularized deconvolution in Fourier space. The properties of the reference sample and the noise characteristics of the detection system significantly influence the derived TTF, thereby limiting its validity range. In a recent study, the tip stray field distribution, and hence the TTF, of an MFM tip was independently measured in real space using a nitrogen vacancy center as a quantum sensor, revealing considerable discrepancies with the reference-sample-based TTF. Here, we analyze the influence of the feature distribution of the reference sample and the MFM measurement parameters on the resulting TTF. We explain the observed differences between quantum-calibrated stray field distributions and the classical approach by attributing them to a loss of information due to missing or suppressed spectral components. Furthermore, we emphasize the importance of the spectral coverage of the TTF. Our findings indicate that for high-quality reconstruction of the stray field of a sample under test (SUT), it is more critical to ensure a strong overlap of frequency components between the reference sample and the SUT than to achieve an accurate real-space reconstruction of the tip stray field distribution.

cond-mat.mes-hall↗

arXiv2024

Magnetic Force Microscopy: High Quality-Factor Two-Pass Mode

Magnetic force microscopy (MFM) is a well-established technique in scanning probe microscopy that allows for the imaging of magnetic samples with a spatial resolution of tens of nm and stray fields down to the mT range. The spatial resolution and field sensitivity can be significantly improved by measuring in vacuum conditions. This improvement originates from the higher quality-factor (Q-factor) of the cantilever's oscillation in vacuum compared to ambient conditions. However, while high Q-factors are desirable as they directly enhance the magnetic measurement signal, they pose a challenge when performing standard MFM two-pass (lift) mode measurements. At high Q-factors, amplitude-based topography measurements become impossible, and the MFM phase response behaves non-linearly. Here, we present a modified two-pass mode implementation in a vacuum atomic force microscope (AFM) that addresses these issues. By controlling the Q-factor in the first pass and using a phase-locked loop (PLL) technique in the second pass, high Q-factor measurements in vacuum are enabled. Measuring the cantilever's frequency shift instead of the phase shift eliminates the issue of emerging nonlinearities. The improvements in MFM signal-to-noise ratio are demonstrated using a nano-patterned magnetic sample. The elimination of non-linear response is highlighted through measurements performed on a well-characterized multilayer reference sample. Finally, we discuss a technique that avoids topography-induced artifacts by following the average sample slope. The newly developed, sensitive, and distortion-free high quality-factor two-pass mode has the potential to be widely implemented in commercial setups, facilitating high-resolution MFM measurements and advancing studies of modern magnetic materials.

cond-mat.mes-hall↗