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Cole Tait

Publications and source records attributed to Cole Tait.

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Separation of Homogeneous and Inhomogeneous Broadening using Two-Dimensional Coherent Spectroscopy

Separating the contributions of homogeneous dephasing from inhomogeneous broadening in spectral linewidths is essential for connecting optical spectra to microscopic dissipation and disorder mechanisms. Voigt fits to one-dimensional spectra, such as photoluminescence, yield strongly correlated Gaussian and Lorentzian widths, so that neither width can be determined independently with confidence. We quantitatively show that two-dimensional coherent spectroscopy (2DCS) reduces this degeneracy by providing orthogonal spectral slices, diagonal and cross-diagonal, with complementary sensitivity to homogeneous and inhomogeneous broadening processes. As a demonstration, we measure the exciton resonance in hBN-encapsulated MoSe$_2$ at 8 K. A joint uncertainty-weighted fit maps the full $\chi^2(\sigma,\gamma)$ landscape to quantify parameter covariance. Compared with linear Voigt analysis, 2DCS yields more compact confidence regions and markedly reduced parameter correlation, enabling reliable separation of the contributions to the excitonic linewidth.

physics.optics

Revealing Strain and Disorder in Transition-Metal Dichalcogenides Using Hyperspectral Photoluminescence Imaging

Hyperspectral photoluminescence (HSPL) imaging provides spatially resolved spectral information for monolayer transition-metal dichalcogenides (TMDs), enabling the detection of subtle variations in excitonic features that are not accessible with conventional optical or photoluminescence intensity imaging. We employ HSPL to map the microscopic spatial distribution of strain and disorder in hBN-encapsulated MoSe$_2$ and WSe$_2$ samples. Quantitative extraction of exciton, trion, and biexciton energies and linewidths reveals strain gradients and localized deformations, such as wrinkles and ripples. The technique allows for characterization of regions with uniform optical properties and identification of areas affected by micro-scale disorder, which may be missed by optical microscopy. Measurements on samples with different device architectures and fabrication processes demonstrate the general utility of hyperspectral PL imaging for assessing spatial heterogeneity and optoelectronic quality in two-dimensional materials.

cond-mat.mtrl-sci