arXiv subjects

Colum M. O'Leary

Publications and source records attributed to Colum M. O'Leary.

5 recordsLinked to original sources

arXiv2026

Three-dimensional imaging of individual carbon atoms

Carbon is fundamental to science and technology due to its diverse bonding configurations, structural versatility, and essential role in defining the mechanical, chemical, electronic, and quantum properties of materials. However, direct three-dimensional (3D) imaging of individual carbon atoms remains a long-standing challenge. Here, we use twisted bilayer graphene (TBG) as a model system and demonstrate ptychographic atomic electron tomography (pAET) for determining the 3D atomic coordinates of individual carbon atoms with a precision of 0.11 angstrom. The resulting 3D atomic model uncovers chiral lattice distortions driven by van der Waals interactions that exhibit meron-like and skyrmion-like structural textures. These findings provide direct insight into the interplay between 3D chiral lattice deformation and electronic properties in moire-engineered carbon systems. Beyond TBG, pAET offers a versatile approach for 3D atomic-scale imaging of carbon-based and other light-element materials that are central to advances in physics, chemistry, materials science, and nanotechnology.

cond-mat.mtrl-sci↗

arXiv2024

Three-dimensional imaging of buried heterointerfaces

We report three-dimensional (3D) structure determination of a twisted hexagonal boron nitride (h-BN) heterointerface from a single-view data set using multislice ptychography. We identify the buried heterointerface between two twisted h-BN flakes with a lateral resolution of 0.57 Å and a depth resolution of 2.5 nm. The latter is a significant improvement (~2.7 times) over the aperture-limited depth resolution of incoherent imaging modes such as annular-dark-field scanning transmission electron microscopy. This is attributed to the diffraction signal extending beyond the aperture edge with the depth resolution set by the curvature of the Ewald sphere. Future advances to this approach could improve the depth resolution to the sub-nanometer level and enable the identification of individual dopants, defects and color centers in twisted heterointerfaces and other materials.

cond-mat.mtrl-sci↗

arXiv2023

Direct Imaging of Charge Redistribution due to Bonding at Atomic Resolution via Electron Ptychography

Phase imaging in electron microscopy is sensitive to the local potential, including charge redistribution from bonding. We demonstrate that electron ptychography provides the necessary sensitivity to detect this subtle effect by directly imaging the charge redistribution in single layer boron nitride. Residual aberrations can be measured and corrected post-collection, and simultaneous atomic number contrast imaging provides unambiguous sub-lattice identification. Density functional theory calculations confirm the detection of charge redistribution.

cond-mat.mtrl-sci↗

arXiv2022

Deep Learning Coherent Diffractive Imaging

We report the development of deep learning coherent electron diffractive imaging at sub-angstrom resolution using convolutional neural networks (CNNs) trained with only simulated data. We experimentally demonstrate this method by applying the trained CNNs to directly recover the phase images from electron diffraction patterns of twisted hexagonal boron nitride, monolayer graphene and a Au nanoparticle with comparable quality to those reconstructed by a conventional ptychographic method. Fourier ring correlation between the CNN and ptychographic images indicates the achievement of a spatial resolution in the range of 0.70 and 0.55 angstrom (depending on different resolution criteria). The ability to replace iterative algorithms with CNNs and perform real-time imaging from coherent diffraction patterns is expected to find broad applications in the physical and biological sciences.

cond-mat.mtrl-sci↗

arXiv2021

Increasing Spatial Fidelity and SNR of 4D-STEM using Multi-frame Data Fusion

4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementing and increasingly replacing existing imaging approaches. However, at present the speed of those detectors, although having drastically improved in the recent years, is still 100 to 1,000 times slower than the current PMT technology operators are used to. Regrettably, this means environmental scanning-distortion often limits the overall performance of the recorded 4D data. Here we present an extension of existing STEM distortion correction techniques for the treatment of 4D-data series. Although applicable to 4D-data in general, we use electron ptychography and electric-field mapping as model cases and demonstrate an improvement in spatial-fidelity, signal-to-noise ratio (SNR), phase-precision and spatial-resolution.

physics.ins-det↗