arXiv subjects

D. Spiga

Publications and source records attributed to D. Spiga.

32 records · Page 2Linked to original sources

arXiv2015

HEW simulations and quantification of the microroughness requirements for X-ray telescopes by means of numerical and analytical methods

Future X-ray telescopes like SIMBOL-X will operate in a wide band of the X-ray spectrum (from 0.1 to 80 keV); these telescopes will extend the optical performances of the existing soft X-ray telescopes to the hard X-ray band, and in particular they will be characterized by a angular resolution (conveniently expressed in terms of HEW, Half-Energy- Width) less than 20 arcsec. However, it is well known that the microroughness of the reflecting surfaces of the optics causes the scattering of X-rays. As a consequence, the imaging quality can be severely degraded. Moreover, the X-ray scattering can be the dominant problem in hard X-rays because its relevance is an increasing function of the photon energy. In this work we consistently apply a numerical method and an analytical one to evaluate the X-ray scattering impact on the HEW of an X-ray optic, as a function of the photon energy: both methods can also include the effects of figure errors in determining the final HEW. A comparison of the results obtained with the two methods for the particular case of the SIMBOL-X X-ray telescope will be presented.

astro-ph.IM↗

arXiv2015

Optical module HEW simulations for the X-ray telescopes SIMBOL-X, EDGE and XEUS

One of the most important parameters defining the angular resolution of an X-ray optical module is its Half-Energy Width (HEW) as a function of the photon energy. Future X-ray telescopes with imaging capabilities (SIMBOL-X, Constellation-X, NeXT, EDGE, XEUS,...) should be characterized by a very good angular resolution in soft (< 10 keV) and hard (> 10 keV) X-rays. As a consequence, an important point in the optics development for these telescopes is the simulation of the achievable HEW for a system of X-ray mirrors. This parameter depends on the single mirror profile and nesting accuracy, but also on the mirrors surface microroughness that causes X-ray Scattering (XRS). In particular, owing to its dependence on the photon energy, XRS can dominate the profile errors in hard X-rays: thus, its impact has to be accurately evaluated in every single case, in order to formulate surface finishing requirements for X-ray mirrors. In this work we provide with some simulations of the XRS term of the HEW for some future soft and hard X-ray telescopes.

astro-ph.IM↗

arXiv2015

Surface smoothness requirements for the mirrors of the IXO X-ray telescope

The International X-ray Observatory (IXO) is a very ambitious mission, aimed at the X-ray observation of the early Universe. This makes IXO extremely demanding in terms of effective area and angular resolution. In particular, the HEW requirement below 10 keV is 5 arcsec Half-Energy Width (HEW). At higher photon energies, the HEW is expected to increase, and the angular resolution to be correspondingly degraded, due to the increasing relevance of the X-ray scattering off the reflecting surfaces. Therefore, the HEW up to 40 keV is required to be better than 30 arcsec, even though the IXO goal is to achieve an angular resolution as close as possible to 5 arcsec also at this energy. To this end, the roughness of the reflecting surfaces has to not exceed a tolerance, expressed in terms of a surface roughness PSD (Power-Spectral-Density). In this work we provide such tolerances by simulating the HEW scattering term for IXO, assuming a specific configuration for the optical module and different hypotheses on the PSD of mirrors.

astro-ph.IM↗

arXiv2015

Profile reconstruction of grazing-incidence X-ray mirrors from intra-focal X-ray full imaging

The optics of a number of future X-ray telescopes will have very long focal lengths (10 - 20 m), and will consist of a number of nested/stacked thin, grazing-incidence mirrors. The optical quality characterization of a real mirror can be obtained via profile metrology, and the Point Spread Function of the mirror can be derived via one of the standard computation methods. However, in practical cases it can be difficult to access the optical surfaces of densely stacked mirror shells, after they have been assembled, using the widespread metrological tools. For this reason, the assessment of the imaging resolution of a system of mirrors is better obtained via a direct, full-illumination test in X-rays. If the focus cannot be reached, an intra-focus test can be performed, and the image can be compared with the simulation results based on the metrology, if available. However, until today no quantitative information was extracted from a full-illumination, intra-focal exposure. In this work we show that, if the detector is located at an optimal distance from the mirror, the intensity variations of the intra-focal, full-illumination image in single reflection can be used to reconstruct the profile of the mirror surface, without the need of a wavefront sensor. The Point Spread Function can be subsequently computed from the reconstructed mirror shape. We show the application of this method to an intra-focal (8 m distance from mirror) test performed at PANTER on an optical module prototype made of hot-slumped glass foils with a 20 m focal length, from which we could derive an expected imaging quality near 16 arcsec HEW.

astro-ph.IM↗

arXiv2015

Characterization of multilayer stack parameters from X-ray reflectivity data using the PPM program: measurements and comparison with TEM results

Future hard (10 -100 keV) X-ray telescopes (SIMBOL-X, Con-X, HEXIT-SAT, XEUS) will implement focusing optics with multilayer coatings: in view of the production of these optics we are exploring several deposition techniques for the reflective coatings. In order to evaluate the achievable optical performance X-Ray Reflectivity (XRR) measurements are performed, which are powerful tools for the in-depth characterization of multilayer properties (roughness, thickness and density distribution). An exact extraction of the stack parameters is however difficult because the XRR scans depend on them in a complex way. The PPM code, developed at ERSF in the past years, is able to derive the layer-by-layer properties of multilayer structures from semi-automatic XRR scan fittings by means of a global minimization procedure in the parameters space. In this work we will present the PPM modeling of some multilayer stacks (Pt/C and Ni/C) deposited by simple e-beam evaporation. Moreover, in order to verify the predictions of PPM, the obtained results are compared with TEM profiles taken on the same set of samples. As we will show, PPM results are in good agreement with the TEM findings. In addition, we show that the accurate fitting returns a physically correct evaluation of the variation of layers thickness through the stack, whereas the thickness trend derived from TEM profiles can be altered by the superposition of roughness profiles in the sample image.

astro-ph.IM↗

arXiv2015

A magnetic diverter for charged particle background rejection in the SIMBOL-X telescope

Minimization of charged particle background in X-ray telescopes is a well known issue. Charged particles (chiefly protons and electrons) naturally present in the cosmic environment constitute an important background source when they collide with the X-ray detector. Even worse, a serious degradation of spectroscopic performances of the X-ray detector was observed in Chandra and Newton-XMM, caused by soft protons with kinetic energies ranging between 100 keV and some MeV being collected by the grazing-incidence mirrors and funneled to the detector. For a focusing telescope like SIMBOL-X, the exposure of the soft X-ray detector to the proton flux can increase significantly the instrumental background, with a consequent loss of sensitivity. In the worst case, it can also seriously compromise the detector duration. A well-known countermeasure that can be adopted is the implementation of a properly-designed magnetic diverter, that should prevent high-energy particles from reaching the focal plane instruments of SIMBOL-X. Although Newton-XMM and Swift-XRT are equipped with magnetic diverters for electrons, the magnetic fields used are insufficient to effectively act on protons. In this paper, we simulate the behavior of a magnetic diverter for SIMBOL-X, consisting of commercially-available permanent magnets. The effects of SIMBOL-X optics is simulated through GEANT4 libraries, whereas the effect of the intense required magnetic fields is simulated along with specifically-written numerical codes in IDL.

astro-ph.IM↗

arXiv2015

Development of mirrors made of chemically tempered glass foils for future X-ray telescopes

Thin slumped glass foils are considered good candidates for the realization of future X-ray telescopes with large effective area and high spatial resolution. However, the hot slumping process affects the glass strength, and this can be an issue during the launch of the satellite because of the high kinematical and static loads occurring during that phase. In the present work we have investigated the possible use of Gorilla glass (produced by Corning), a chemical tempered glass that, thanks to its strength characteristics, would be ideal. The un-tempered glass foils were curved by means of an innovative hot slumping technique and subsequently chemically tempered. In this paper we show that the chemical tempering process applied to Gorilla glass foils does not affect the surface micro-roughness of the mirrors. On the other end, the stress introduced by the tempering process causes a reduction in the amplitude of the longitudinal profile errors with a lateral size close to the mirror length. The effect of the overall shape changes in the final resolution performance of the glass mirrors was studied by simulating the glass foils integration with our innovative approach based on glass reinforcing ribs. The preliminary tests performed so far suggest that this approach has the potential to be applied to the X-ray telescopes of the next generation.

astro-ph.IM↗

arXiv2014

Evaluation of the surface strength of glass plates shaped by hot slumping process

The Hot Slumping Technology is under development by several research groups in the world for the realization of grazing-incidence segmented mirrors for X-ray astronomy, based on thin glass plates shaped over a mould at temperatures above the transformation point. The performed thermal cycle and related operations might have effects on the strength characteristics of the glass, with consequences on the structural design of the elemental optical modules and consecutively on the entire X-ray optic for large astronomical missions like IXO and ATHENA. The mechanical strength of glass plates after they underwent the slumping process was tested through destructive double-ring tests in the context of a study performed by the Astronomical Observatory of Brera with the collaboration of Stazione Sperimentale del Vetro and BCV Progetti. The entire study has been realized on more than 200 D263 Schott borosilicate glass specimens of dimension 100 mm x 100 mm and thickness 0.4 mm, either flat or bent at a Radius of Curvature of 1000 mm through the particular pressure assisted hot slumping process developed by INAF-OAB. The collected experimental data have been compared to non-linear FEM analyses and treated with Weibull statistic to assess the current IXO glass X-ray telescope design, in terms of survival probability, when subject to static and acoustic loads characteristic of the launch phase. The paper describes the activities performed and presents the obtained results.

astro-ph.IM↗

arXiv2014

The imaging properties of the Gas Pixel Detector as a focal plane polarimeter

X-rays are particularly suited to probe the physics of extreme objects. However, despite the enormous improvements of X-ray Astronomy in imaging, spectroscopy and timing, polarimetry remains largely unexplored. We propose the photoelectric polarimeter Gas Pixel Detector (GPD) as an instrument candidate to fill the gap of more than thirty years of lack of measurements. The GPD, in the focus of a telescope, will increase the sensitivity of orders of magnitude. Moreover, since it can measure the energy, the position, the arrival time and the polarization angle of every single photon, allows to perform polarimetry of subsets of data singled out from the spectrum, the light curve or the image of source. The GPD has an intrinsic very fine imaging capability and in this work we report on the calibration campaign carried out in 2012 at the PANTER X-ray test facility of the Max-Planck-Institut für extraterrestrische Physik of Garching (Germany) in which, for the first time, we coupled it to a JET-X optics module with a focal length of 3.5 m and an angular resolution of 18 arcsec at 4.5 keV. This configuration was proposed in 2012 aboard the X-ray Imaging Polarimetry Explorer (XIPE) in response to the ESA call for a small mission. We derived the imaging and polarimetric performance for extended sources like Pulsar Wind Nebulae and Supernova Remnants as case studies for the XIPE configuration, discussing also possible improvements by coupling the detector with advanced optics, having finer angular resolution and larger effective area, to study with more details extended objects.

astro-ph.IM↗

arXiv2013

X-ray scattering of periodic and graded multilayers: comparison of experiments to simulations from surface microroughness characterization

To enhance the reflectivity of X-ray mirrors beyond the critical angle, multilayer coatings are required. Interface imperfections in the multilayer growth process are known to cause non-specular scattering and degrade the mirror optical performance; therefore, it is important to predict the amount of X-ray scattering from the rough topography of the outer surface of the coating, which can be directly measured, e.g., with an Atomic Force Microscope (AFM). This kind of characterization, combined with X-ray reflectivity measurements to assess the deep multilayer stack structure, can be used to model the layer roughening during the growth process via a well-known roughness evolution model. In this work, X-ray scattering measurements are performed and compared with simulations obtained from the modeled interfacial Power Spectral Densities (PSDs) and the modeled Crossed Spectral Densities for all the couples of interfaces. We already used this approach in a previous work for periodic multilayers; we now show how this method can be extended to graded multilayers. The upgraded code is validated for both periodic and graded multilayers, with a good accord between experimental data and model findings. Doing this, different kind of defects observed in AFM scans are included in the PSD analysis. The subsequent data-model comparison enables us to recognize them as surface contamination or interfacial defects that contribute to the X-ray scattering of the multilayer.

physics.optics↗

arXiv2013

X-ray beam-shaping via deformable mirrors: analytical computation of the required mirror profile

X-ray mirrors with high focusing performances are in use in both mirror modules for X-ray telescopes and in synchrotron and FEL (Free Electron Laser) beamlines. A degradation of the focus sharpness arises in general from geometrical deformations and surface roughness, the former usually described by geometrical optics and the latter by physical optics. In general, technological developments are aimed at a very tight focusing, which requires the mirror profile to comply with the nominal shape as much as possible and to keep the roughness at a negligible level. However, a deliberate deformation of the mirror can be made to endow the focus with a desired size and distribution, via piezo actuators as done at the EIS-TIMEX beamline of FERMI@Elettra. The resulting profile can be characterized with a Long Trace Profilometer and correlated with the expected optical quality via a wavefront propagation code. However, if the roughness contribution can be neglected, the computation can be performed via a ray-tracing routine, and, under opportune assumptions, the focal spot profile (the Point Spread Function, PSF) can even be predicted analytically. The advantage of this approach is that the analytical relation can be reversed; i.e, from the desired PSF the required mirror profile can be computed easily, thereby avoiding the use of complex and time-consuming numerical codes. The method can also be suited in the case of spatially inhomogeneous beam intensities, as commonly experienced at Synchrotrons and FELs. In this work we expose the analytical method and the application to the beam shaping problem.

physics.optics↗

arXiv2009

Analytical computation of the off-axis Effective Area of grazing incidence X-ray mirrors

Focusing mirrors for X-ray telescopes in grazing incidence, introduced in the 70s, are characterized in terms of their performance by their imaging quality and effective area, which in turn determines their sensitivity. Even though the on-axis effective area is assumed in general to characterize the collecting power of an X-ray optic, the telescope capability of imaging extended X-ray sources is also determined by the variation in its effective area with the off-axis angle. [...] The complex task of designing optics for future X-ray telescopes entails detailed computations of both imaging quality and effective area on- and off-axis. Because of their apparent complexity, both aspects have been, so far, treated by using ray-tracing routines aimed at simulating the interaction of X-ray photons with the reflecting surfaces of a given focusing system. Although this approach has been widely exploited and proven to be effective, it would also be attractive to regard the same problem from an analytical viewpoint, to assess an optical design of an X-ray optical module with a simpler calculation than a ray-tracing routine. [...] We have developed useful analytical formulae for the off-axis effective area of a double-reflection mirror in the double cone approximation, requiring only an integration and the standard routines to calculate the X-ray coating reflectivity for a given incidence angle. [...] Algebraic expressions are provided for the mirror geometric area, as a function of the off-axis angle. Finally, the results of the analytical computations presented here are validated by comparison with the corresponding predictions of a ray-tracing code.

astro-ph.IM↗

arXiv2009

Simbol-X Hard X-ray Focusing Mirrors: Results Obtained During the Phase A Study

Simbol-X will push grazing incidence imaging up to 80 keV, providing a strong improvement both in sensitivity and angular resolution compared to all instruments that have operated so far above 10 keV. The superb hard X-ray imaging capability will be guaranteed by a mirror module of 100 electroformed Nickel shells with a multilayer reflecting coating. Here we will describe the technogical development and solutions adopted for the fabrication of the mirror module, that must guarantee an Half Energy Width (HEW) better than 20 arcsec from 0.5 up to 30 keV and a goal of 40 arcsec at 60 keV. During the phase A, terminated at the end of 2008, we have developed three engineering models with two, two and three shells, respectively. The most critical aspects in the development of the Simbol-X mirrors are i) the production of the 100 mandrels with very good surface quality within the timeline of the mission; ii) the replication of shells that must be very thin (a factor of 2 thinner than those of XMM-Newton) and still have very good image quality up to 80 keV; iii) the development of an integration process that allows us to integrate these very thin mirrors maintaining their intrinsic good image quality. The Phase A study has shown that we can fabricate the mandrels with the needed quality and that we have developed a valid integration process. The shells that we have produced so far have a quite good image quality, e.g. HEW <~30 arcsec at 30 keV, and effective area. However, we still need to make some improvements to reach the requirements. We will briefly present these results and discuss the possible improvements that we will investigate during phase B.

astro-ph.IM↗

arXiv2008

Estimation of X-ray scattering impact in imaging degradation for the SIMBOL-X telescope

The imaging performance of X-ray optics (expressed in terms of HEW, Half-Energy-Width) can be severely affected by X-ray scattering caused by the surface roughness of the mirrors. The impact of X-ray scattering has an increasing relevance for increasing photon energy, and can be the dominant problem in a hard X-ray telescope like SIMBOL-X. In this work we show how, by means of a novel formalism, we can derive a surface roughness tolerance - in terms of its power spectrum - from a specific HEW requirement for the SIMBOL-X optical module.

astro-ph↗