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Daniel Hirt

Publications and source records attributed to Daniel Hirt.

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Tailoring phonon-driven responses in {\alpha}-MoO3 through isotopic enrichment

The implementation of polaritonic materials into nanoscale devices requires selective tuning of parameters to realize desired spectral or thermal responses. One robust material is {\alpha}-MoO3, which as an orthorhombic crystal boasts three distinct phonon dispersions, providing three polaritonic dispersions of hyperbolic phonon polaritons (HPhPs) across the mid-infrared (MIR). Here, the tunability of both optical and thermal responses in isotopically enriched {\alpha}-MoO3 (98MoO3, Mo18O3 and 98Mo18O3) are explored. A uniform ~5 % spectral redshift from 18O enrichment is observed in both Raman- and IR-active TO phonons. Both the in- and out-of-plane thermal conductivities for the isotopic variations are reported. Ab initio calculations both replicate experimental findings and analyze the select-mode three-phonon scattering contributions. The HPhPs from each isotopic variation are probed with s-SNOM and their Q- factors are reported. A Q-factor maxima increase of ~50 % along the [100] in the RB2 and ~100 % along the [001] in the RB3 are reported for HPhPs supported in 98Mo18O3. Observations in both real and Fourier space of higher-order HPhP modes propagating in single slabs of isotopically enriched {\alpha}-MoO3 without the use of a subdiffractional surface scatterer are presented here. This work illustrates the tunability of {\alpha}-MoO3 for thermal and nanophotonic applications.

cond-mat.mtrl-sci

Infrared Phonon Thermoreflectance in Polar Dielectrics

In this work, we investigate dielectric materials for thermoreflectance-based thermal sensing by extracting key optical parameters using temperature-dependent spectroscopic ellipsometry in the mid-infrared regime. Leveraging optical phonon resonances, we demonstrate that the thermoreflectance coefficients in polar dielectrics rival, and in some cases exceed by an order of magnitude, those observed in commonly used metals that are typically used as temperature transducers in thermoreflectance measurements. We introduce a transducer figure of merit (FOM) that combines pump absorption and probe reflectance modulation at different wavelengths, serving as a design-oriented screening metric for comparing thermoreflectance transducer performance across materials and spectral regions. Our results show that polar materials can exhibit performance up to eight times greater than that of metal transducers. To demonstrate practical capability, we perform transient thermoreflectance measurements on a 100 nm thermally grown SiO2 film on silicon. These results position dielectric materials as compelling candidates for next-generation thermal metrology, broadening the design space for optical thermometry, with strong implications for high-resolution thermal mapping and characterization of layered device structures based on phonon probing.

physics.optics