arXiv subjects

Darren J. Batey

Publications and source records attributed to Darren J. Batey.

3 recordsLinked to original sources

arXiv2025

Quantitative phase nano-imaging with a laboratory source

Investigating the structure of matter at the nanoscale non destructively is a key capability enabled by X-ray imaging. One of the most powerful nano-imaging methods is X-ray ptychography, a coherent diffraction imaging technique that has become the go-to method at synchrotron facilities for applications ranging from brain imaging to battery materials. However, the requirements in terms of X-ray beam quality have limited its use to large synchrotron facilities and, to date, only one attempt has been made to translate the technique to a small-scale laboratory. To unleash the power of this technique to the broad user community of laboratory X-ray sources, there are outstanding questions to answer including whether the quantitativeness of the information is preserved in a laboratory despite the drastic decrease in X-ray flux of several orders of magnitude, with respect to synchrotron instruments. In this study not only we demonstrate that the quantitativeness of X-ray ptychography is preserved in a laboratory setting, but we also apply the method to the imaging of a brain tissue phantom. Finally, we describe the current challenges and limitations, and we set the basis for further development and future directions of quantitative nano-imaging with laboratory X-ray sources.

physics.comp-ph↗

arXiv2023

Imaging Light-Induced Migration of Dislocations in Halide Perovskites with 3D Nanoscale Strain Mapping

In recent years, halide perovskite materials have been used to make high performance solar cell and light-emitting devices. However, material defects still limit device performance and stability. Here, we use synchrotron-based Bragg Coherent Diffraction Imaging to visualise nanoscale strain fields, such as those local to defects, in halide perovskite microcrystals. We find significant strain heterogeneity within MAPbBr$_{3}$ (MA = CH$_{3}$NH$_{3}^{+}$) crystals in spite of their high optoelectronic quality, and identify both $\langle$100$\rangle$ and $\langle$110$\rangle$ edge dislocations through analysis of their local strain fields. By imaging these defects and strain fields in situ under continuous illumination, we uncover dramatic light-induced dislocation migration across hundreds of nanometres. Further, by selectively studying crystals that are damaged by the X-ray beam, we correlate large dislocation densities and increased nanoscale strains with material degradation and substantially altered optoelectronic properties assessed using photoluminescence microscopy measurements. Our results demonstrate the dynamic nature of extended defects and strain in halide perovskites and their direct impact on device performance and operational stability.

cond-mat.mtrl-sci↗

arXiv2021

X-ray Ptychography with a Laboratory Source

X-ray ptychography has revolutionised nanoscale phase contrast imaging at large-scale synchrotron sources in recent years. We present here the first successful demonstration of the technique in a small-scale laboratory setting. We conducted an experiment with a liquid metal-jet X-ray source and a single photon-counting detector with a high spectral resolution. The experiment used a spot size of 5 microns to produce a ptychographic phase image of a Siemens star test pattern with a sub-micron spatial resolution. The result and methodology presented show how high-resolution phase contrast imaging can now be performed at small-scale laboratory sources worldwide.

physics.app-ph↗