arXiv subjects

Diandian Zhang

Publications and source records attributed to Diandian Zhang.

4 recordsLinked to original sources

arXiv2026

Sci-VBench: Evaluating Knowledge- and Reasoning-Intensive Video Generation in Science Domains

We introduce Sci-VBench, a comprehensive benchmark for evaluating knowledge- and reasoning-intensive video generation across scientific domains. It contains 1,253 expert-annotated examples spanning 60 subjects across four core disciplines: Natural Science, Healthcare, Humanities & Social Sciences, and Engineering. Each example requires models to generate temporally rich videos that demand scientific reasoning and knowledge-grounded synthesis, going beyond surface-level visual plausibility. We further establish a rubric-based evaluation protocol. Our analysis shows that, under this protocol, both non-expert human evaluators and MLLM-as-Judge systems can achieve relatively high agreement with expert judgments, supporting reproducible evaluation at scale. We benchmark 16 frontier proprietary and open-source models and find that, while automatic perceptual-quality scores cluster tightly across systems, performance on Prompt Grounding and Scientific and Causal Correctness varies substantially, with a pronounced proprietary-open-source gap. These findings show that advances in visual realism have not yet translated into reliable modeling of scientific and causal dynamics.

cs.CV↗

arXiv2025

Neutralizing Optical Defects in GeSn

Reports of photoluminescence from GeSn grown on Ge substrates by molecular beam epitaxy have been limited. We find that one limiting factor to observing photoluminescence is due to localized defect states marked by photoluminescence at 2400 nm and originating from the Ge substrate and buffer layer. In this study, we report on an optical study utilizing doped Ge(001) substrates to effectively suppress defect-related photoluminescence in GeSn layers by filling localized defect trap states. For this experiment, a GeSn layer with Sn content up to 10.5% was grown on a doped Ge(001) substrate. Analysis of the physics of the photoluminescence spectrum collected from the GeSn thin film shows an emission at the expected wavelength of 2300 nm for 10.5% Sn content and the absence of the typically observed defect related signal at 2400 nm. This understanding is further confirmed using short pulse optical excitation of the GeSn grown on undoped Ge substrates.

cond-mat.mtrl-sci↗

arXiv2025

Direct Bandgap Photoluminescence of GeSn grown on Si(100) substrate by Molecular Beam Epitaxy Growth

Group IV alloys of GeSn have gained significant attention for electronic and optoelectronic applications on a Si platform due to their compatibility with existing CMOS technology, tunable band structure, and potential for a direct bandgap at high Sn concentrations. However, synthesizing Sn-rich GeSn structures remains challenging due to the low solid solubility of Sn in Ge (less than 1%) and the substantial lattice mismatch ( about 14%) between Sn and Ge. In this work, we demonstrate the successful growth of high-quality, relaxed GeSn layers with Sn contents of 9.2% and 11.4% on Si(100) substrates via molecular beam epitaxy (MBE). As far as we know, this is the first report of direct bandgap photoluminescence observed from MBE-grown GeSn films without post-growth annealing. Structural characterizations including X-ray diffraction (XRD), secondary ion mass spectrometry (SIMS), and transmission electron microscopy (TEM) confirm uniform Sn incorporation with minimal defect formation. Atomic force microscopy (AFM) reveals smooth surfaces with low roughness. Temperature-dependent photoluminescence (PL) measurements further confirm direct bandgap emission, representing a new stage in the development of MBE-grown GeSn.

physics.app-ph↗

arXiv2024

Study of Group III-V Waveguides on Sapphire Platform for Photonic Integrated Circuits

Photonic integrated circuits (PICs) have been acknowledged as the promising platforms for the applications in data communication, Lidar in autonomous driving vehicles, innovative sensor technology, etc. Since the demonstration of optical components individually, integration of both electronics and photonics for functional devices on a common platform has been a key technology driver enhancing the stability and scalability of integrated photonic technologies. Recently, we proposed to use sapphire as a high-performance PIC platform, which enables a fully integrated solution to include a complete set of components with light source, modulator, light detection, passive devices, silicon on sapphire control circuit all-in-one sapphire platform to achieve high-performance low-cost mixed-signal optical links. In parallel to developing ac-tive components such as group III-V lasers on sapphire, in this work, the performance of group III-V straight waveguides on sapphire was systemically studied. The refractive indices contrast between GaAs, InP, GaSb, and sapphire are sufficiently high to achieve low loss over a broad optical wavelength. The calculated loss at wavelengths of 1330 nm, 1550 nm, and 2000 nm for the GaAs, InP, and GaSb rib waveguides are 0.32 dB/cm, 0.67 dB/cm, and 0.70 dB/cm, re-spectively. Since the fundamental element to construct all passive building blocks is the straight waveguide, results from this work would allow us to assess other basic passive building blocks.

physics.optics↗