Three-dimensional field of view of remote focusing microscopy system
Remote focusing (RF) microscopy is well known for its ability to sharply image a wide range of planes away from the working distance of the microscope objective. However, the exact nature of the three-dimensional (3D) field of view (FOV) is not known. In this letter we report an optical ray tracing based FOV study of a remote focusing microscopy system. We numerically simulate the Strehl ratio of two configurations of the remote focusing systems, and use this for the evaluation of the 3D FOV. The FOV tapers down as the sample plane moves away from the working distance. To cross-verify our simulation results, we experimentally measured the FOV at various offset planes. This rate of taper depends on the numerical aperture. We also discuss the advantages and limitations of remote focusing in microscopy.