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Doaa Abdelbarey

Publications and source records attributed to Doaa Abdelbarey.

2 recordsLinked to original sources

Cooling-path-selected self-assembly of telecom InAsP quantum dots

Epitaxial quantum dots are leading solid-state sources of quantum light, but reproducible growth on indium phosphide (InP) remains challenging because dot-formation windows are narrow and emission wavelengths are difficult to predict. Here we report a new epitaxial route for InAsP quantum dots on InP(001), in which the cooling path selects the final morphology without intentional deposition of group-III dot material. High-temperature As exposure forms a shallow near-surface InAsP layer through As-P exchange; the cooling path and continued As supply determine whether three-dimensional islands form. Surface-sensitive spectroscopy shows near-surface As enrichment, while cross-sectional STEM/EELS identifies graded, As-rich InAsP islands. The capped emitters span 1.2-1.6 micrometers, with single-photon emission observed up to 100 K. Across 20 wafers, the surface-effective exchange dose D provides a practical calibration for targeting the median emission wavelength. These results establish cooling as an active epitaxial step for telecom InAsP quantum-dot formation and wavelength control.

quant-ph↗

Unveiling the 3D Morphology of Epitaxial GaAs/AlGaAs Quantum Dots

Strain-free GaAs/AlGaAs semiconductor quantum dots (QDs) grown by droplet etching and nanohole infilling (DENI) are highly promising candidates for the on-demand generation of indistinguishable and entangled photon sources. The spectroscopic fingerprint and quantum optical properties of QDs are significantly influenced by their morphology. The effects of nanohole geometry and infilled material on the exciton binding energies and fine structure splitting are well understood. However, a comprehensive understanding of GaAs/AlGaAs QD morphology remains elusive. To address this, we employ high-resolution scanning transmission electron microscopy (STEM) and reverse engineering through selective chemical etching and atomic force microscopy (AFM). Cross-sectional STEM of uncapped QDs reveals an inverted conical nanohole with Al-rich sidewalls and defect-free interfaces. Subsequent selective chemical etching and AFM measurements further reveal asymmetries in element distribution. This study enhances the understanding of DENI QD morphology and provides a fundamental three-dimensional structural model for simulating and optimizing their optoelectronic properties.

quant-ph↗