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Dongliang Zhao

Publications and source records attributed to Dongliang Zhao.

2 recordsLinked to original sources

SeriCrypt: An LLM-Driven Context-Aware Serialization Framework for Cryptographic Protocols

Constructing syntactically correct and cryptographically valid message sequences is essential for protocol state machine learning, conformance testing, and fuzzing. Unlike plaintext protocols, cryptographic protocols involve complex cross-message state dependencies and cryptographic computation constraints. Existing automated approaches predominantly target text-based or plaintext protocols, leaving cryptographic message construction largely manual. We present SeriCrypt, an LLM-driven, context-aware serialization framework for cryptographic protocols. It employs a large language model to extract field constraints, state dependencies, and cryptographic computation rules from unstructured protocol specifications into a unified structured intermediate representation, formally characterized by a domain-specific language for cryptographic protocols (CDSL). A protocol-agnostic execution engine parses CDSL declarations, automating field value resolution, cryptographic primitive invocation, and byte-stream serialization. As case studies in protocol security testing, we use the framework to construct violation messages targeting specification-defined security constraints and to support protocol fuzzing, evaluating it on mainstream implementations of TLS 1.2/1.3, IKEv1/v2, SSH, and TLCP. SeriCrypt generated message sequences accepted by all evaluated implementations and completed handshakes in every scenario. Security constraint testing revealed five specification violations, and fuzzing reached deeper protocol states with higher code coverage than mainstream fuzzers under the same time budget, demonstrating the framework's practical value for cryptographic protocol security testing.

cs.CR

Measurement Techniques for Thermal Conductivity and Interfacial Thermal Conductance of Bulk and Thin Film Materials

Thermal conductivity and interfacial thermal conductance play crucial roles in the design of engineering systems where temperature and thermal stress are of concerns. To date, a variety of measurement techniques are available for both bulk and thin film solid-state materials with a broad temperature range. For thermal characterization of bulk material, the steady-state absolute method, laser flash diffusivity method, and transient plane source method are most used. For thin film measurement, the 3ω method and transient thermoreflectance technique including both frequency-domain and time-domain analysis are employed widely. This work reviews several most commonly used measurement techniques. In general, it is a very challenging task to determine thermal conductivity and interface contact resistance with less than 5% error. Selecting a specific measurement technique to characterize thermal properties need to be based on: 1) knowledge on the sample whose thermophysical properties is to be determined, including the sample geometry and size, and preparation method; 2) understanding of fundamentals and procedures of the testing technique and equipment, for example, some techniques are limited to samples with specific geometrics and some are limited to specific range of thermophysical properties; 3) understanding of the potential error sources which might affect the final results, for example, the convection and radiation heat losses.

cond-mat.mtrl-sci