arXiv subjects

E. Fohtung

Publications and source records attributed to E. Fohtung.

3 recordsLinked to original sources

arXiv2012

Probing the three-dimensional strain inhomogeneity and equilibrium elastic properties of single crystal Ni nanowires

We employ three dimensional x-ray coherent diffraction imaging to map the lattice strain distribution, and to probe the elastic properties of a single crystalline Ni (001) nanowire grown vertically on an amorphous Si02 || Si substrate. The reconstructed density maps show that with increasing wire width, the equilibrium compressive stress in the core region decreases sharply while the surface tensile strain increases, and gradually trends to a nonzero constant. We use the retrieved projection of lattice distortion to predict the Young's Modulus of the wire based on the elasticity theory.

cond-mat.mes-hall↗

arXiv2009

On the Computation and Applications of Bessel Functions with Pure Imaginary Indices

Bessel functions with pure imaginary index (order) play an important role in corpuscular optics where they govern the dynamics of charged particles in isotrajectory quadrupoles. Recently they were found to be of great importance in semiconductor material characterization as they are manifested in the strain state of crystalline material. A new algorithm which can be used for the computation of the normal and modifed Bessel functions with pure imaginary index is proposed. The developed algorithm is very fast to compute and for small arguments converges after a few iterations.

math-ph↗

arXiv2009

Selective coherent x-ray diffractive imaging of displacement fields in (Ga,Mn)As/GaAs periodical wires

Coherent x-ray diffractive imaging is extended to high resolution strain analysis in crystalline nanostructured devices. The application potential is demonstrated by determining the strain distribution in (Ga,Mn)As/GaAs nanowires. By separating diffraction signals in reciprocal spaces, individual parts of the device could be reconstructed independently by our inversion procedure. We demonstrate the method to be effective for material specific reconstruction of strain distribution in highly integrated devices.

cond-mat.mtrl-sci↗