arXiv subjects

E. Harriet Åhlgren

Publications and source records attributed to E. Harriet Åhlgren.

5 recordsLinked to original sources

arXiv2026

Quantitative Analysis of Composition and Contamination of Atomically Thin Materials by Recoil-Projectile Coincidence in Ion Transmission

Surface contamination strongly affects the intrinsic properties of nanoscale materials, making its reliable identification and quantification crucial for both accurate experimental interpretation and nanofabrication. Although scanning transmission electron microscopy can resolve contaminants at atomic resolution within nanometer-scale regions, it cannot easily provide a quantitative, large-area contamination measure. Here, we introduce a minimally destructive recoil-projectile coincidence method for ion transmission experiments that enables element-specific identification and quantification of surface contaminants with isotopic resolution. We demonstrate this approach by comparing self-supporting graphene samples prepared using either a polymethylmethacrylate (PMMA)-based or a PMMA-free transfer process. Carbon and hydrogen are identified as the dominant surface contaminants. PMMA-free transferred graphene exhibits the lowest native contamination levels. Following in-situ thermal annealing at 400 °C for 1 h, the measured carbon areal density approaches the value expected for atomically clean single-layer graphene within the experimental uncertainty, while hydrogen coverage is strongly reduced. Unlike PMMA-transferred graphene, which rapidly recontaminates after annealing, PMMA-free transferred graphene remains nearly contamination-free for at least 140 min under ultra-high vacuum conditions ($p_{\mathrm{base}} = 2 \times 10^{-8}$ mbar). Beyond graphene, the presented method establishes a quantitative characterization platform for ultrathin materials, enabling studies of surface cleanliness, adsorption, implantation and surface interaction dynamics in such systems.

cond-mat.mtrl-sci↗

arXiv2026

Electron-beam induced methane decomposition for in-situ carbon doping of hexagonal boron nitride

Controlling the spatial incorporation of carbon into hexagonal boron nitride (hBN) is essential for engineering optically active defects, yet existing approaches lack nanoscale precision and control over the carbon supply. Here, we demonstrate a method for carbon doping of hBN using electron-beam irradiation in a low-pressure methane atmosphere, where the beam simultaneously generates vacancies and decomposes methane into individual carbon and hydrogen atoms. Using annular dark-field scanning transmission electron microscopy, we show that increasing the methane partial pressure suppresses pore growth and drives the formation of triangular boron-terminated pores through preferential hydrogen etching of nitrogen. Time-resolved electron energy-loss spectroscopy (EELS) mapping reveals progressive carbon incorporation into the lattice, accompanied by boron and nitrogen depletion. Carbon clustering occurs predominantly within the irradiated area: 84+-7% of carbon-rich regions are confined to the area exposed to the electron beam, while some carbon atoms are also found to diffuse up to an average distance of 4.7+-0.5 nm beyond it. The incorporated carbon atoms arrange in a hexagonal pattern within the lattice, forming patches that do not exceed ~1 nm in size. Analysis of the EELS fine structure indicates modifications to the local electronic environment within these regions, with implications for the optical properties of the resulting carbon-related defects.

cond-mat.mtrl-sci↗

arXiv2023

Two-dimensional few-atom noble gas clusters in a graphene sandwich

Van der Waals atomic solids of noble gases on metals at cryogenic temperatures were the first experimental examples of two-dimensional systems. Recently such structures have also been created on surfaces under encapsulation by graphene, allowing studies at elevated temperatures through scanning tunneling microscopy. However, for this technique, the encapsulation layer often obscures the actual arrangement of the noble gas atoms. Here, we create Kr and Xe clusters in between two suspended graphene layers, and uncover their atomic structure through direct imaging with transmission electron microscopy. We show that small crystals (N<9) arrange as expected based on the simple non-directional van der Waals interaction. Crystals larger than this show some deviations for the outermost atoms, possibly enabled by deformations in the encapsulating graphene lattice. We further discuss the dynamics of the clusters within the graphene sandwich, and show that while all Xe clusters with up to N~100 remain solid, Kr clusters with already N~16 turn occasionally fluid under our experimental conditions with an estimated pressure of ca. 0.3 GPa. This study opens a way for the so-far unexplored frontier of encapsulated two-dimensional van der Waals solids with exciting possibilities for fundamental condensed matter physics research and possible applications in quantum information technology.

cond-mat.mes-hall↗

arXiv2022

Atomic-scale Oxygen-mediated Etching of 2D MoS$_2$ and MoTe$_2$

Some of the materials are more affected by oxidation than others. To elucidate the oxidation-induced degradation mechanisms in transition metal chalcogenides, the chemical effects in single layer MoS$_2$ and MoTe$_2$ were studied in situ in an electron microscope under controlled low-pressure oxygen environments at room temperature.Oxidation is the main cause of degradation of many two-dimensional materials, including transition metal dichalcogenides, under ambient conditions. MoTe$_2$ is found to be reactive to oxygen, leading to significant degradation above a pressure of 1$\times 10^{-7}$ torr. Curiously, the common hydrocarbon contamination found on practically all surfaces accelerates the damage rate significantly, by up to a factor of forty. In contrast to MoTe$_2$, MoS$_2$ is found to be inert under oxygen environment, with all observed structural changes being caused by electron irradiation only, leading to well-defined pores with high proportion of molybdenum nanowire-terminated edges. Using density functional theory calculations, a further atomic-scale mechanism leading to the observed oxygen-related degradation in MoTe$_2$ is proposed and the role of the carbon in the etching is explored. Together, the results provide an important insight into the oxygen-related deterioration of two-dimensional materials under ambient conditions relevant in many fields.

cond-mat.mtrl-sci↗

arXiv2015

Xe Irradiation of Graphene on Ir(111): From Trapping to Blistering

Using X-ray photoelectron spectroscopy, thermal desorption spectroscopy, and scanning tunneling microscopy we show that upon keV Xe + irradiation of graphene on Ir(111), Xe atoms are trapped under the graphene. Upon annealing, aggregation of Xe leads to graphene bulges and blisters. The efficient trapping is an unexpected and remarkable phenomenon, given the absence of chemical binding of Xe to Ir and to graphene, the weak interaction of a perfect graphene layer with Ir(111), as well as the substantial damage to graphene due to irradiation. By combining molecular dynamics simulations and density functional theory calculations with our experiments, we uncover the mechanism of trapping. We describe ways to avoid blister formation during graphene growth, and also demonstrate how ion implantation can be used to intentionally create blisters without introducing damage to the graphene layer. Our approach may provide a pathway to synthesize new materials at a substrate - 2D material interface or to enable confined reactions at high pressures and temperatures.

cond-mat.mtrl-sci↗