arXiv subjects

E. Takacs

Publications and source records attributed to E. Takacs.

6 recordsLinked to original sources

arXiv2024

A Cryogen-Free Electron Beam Ion Trap for Astrophysically Relevant Spectroscopic Studies

The detailed design and operation of the Smithsonian Astrophysical Observatory's EBIT are described for the first time, including recent design upgrades that have led to improved system stability and greater user control, increasing the scope of possible experiments. Measurements of emission from highly charged Ar were taken to determine the spatial distribution of the ion cloud and electron beam. An optical setup consisting of two lenses, a narrow band filter, and a CCD camera was used to image visible light, while an X-ray pinhole and CCD camera were used to image X-rays. Measurements were used to estimate an effective electron density of 1.77 x 10$^{10}$ cm$^{-3}$. Additionally, observations of X-ray emission from background EBIT gases were measured with a Silicon Lithium detector. Measurements indicate the presence of Ba and Si, which are both easily removed by dumping the trap every 2 s or less.

astro-ph.IM↗

arXiv2020

On low-energy tail distortions in the detector responsefunction of x-ray microcalorimeter spectrometers

We use narrow spectral lines from the x-ray spectra of various highlycharged ions to measure low-energy tail-like deviations from a Gaussian responsefunction in a microcalorimter x-ray spectrometer with Au absorbers at energiesfrom 650 eV to 3320 eV. We review the literature on low energy tails in othermicrocalorimter x-ray spectrometers and present a model that explains all thereviewed tail fraction measurements. In this model a low energy tail arises fromthe combination of electron escape and energy trapping associated with Bi x-rayabsorbers.

physics.ins-det↗

arXiv2020

A Transition-edge Sensor-based X-ray Spectrometer for the Study of Highly Charged Ions at the National Institute of Standards and Technology Electron Beam Ion Trap

We report on the design, commissioning, and initial measurements of a Transition-edge Sensor (TES) x-ray spectrometer for the Electron Beam Ion Trap (EBIT) at the National Institute of Standards and Technology (NIST). Over the past few decades, the NIST EBIT has produced numerous studies of highly charged ions in diverse fields such as atomic physics, plasma spectroscopy, and laboratory astrophysics. The newly commissioned NIST EBIT TES Spectrometer (NETS) improves the measurement capabilities of the EBIT through a combination of high x-ray collection efficiency and resolving power. NETS utilizes 192 individual TES x-ray microcalorimeters (166/192 yield) to improve upon the collection area by a factor of ~30 over the 4-pixel neutron transmutation doped germanium-based microcalorimeter spectrometer previously used at the NIST EBIT. The NETS microcalorimeters are optimized for the x-ray energies from roughly 500 eV to 8,000 eV and achieve an energy resolution of 3.7 eV to 5.0 eV over this range, a more modest (<2X) improvement over the previous microcalorimeters. Beyond this energy range NETS can operate with various trade-offs, the most significant of which are reduced efficiency at lower energies and being limited to a subset of the pixels at higher energies. As an initial demonstration of the capabilities of NETS, we measured transitions in He-like and H-like O, Ne, and Ar as well as Ni-like W. We detail the energy calibration and data analysis techniques used to transform detector counts into x-ray spectra, a process that will be the basis for analyzing future data.

physics.ins-det↗

arXiv2020

Dielectronic resonances of LMn and LNn (n $\geq$ 4) series in highly-charged M-shell tungsten ions

We present spectroscopic measurements and detailed theoretical analysis of inner-shell LMn and LNn (n $\geq$ 4) dielectronic resonances in highly-charged M-shell ions of tungsten. The x-ray emission from W$^{49+}$ through W$^{64+}$ was recorded at the electron beam ion trap (EBIT) facility at the National Institute of Standards and Technology (NIST) with a high-purity Ge detector for electron beam energies between 6.8 keV and 10.8 keV. The measured spectra clearly show the presence of strong resonance features as well as direct excitation spectral lines. The analysis of the recorded spectra with large-scale collisional-radiative (CR) modeling of the EBIT plasma allowed us to unambiguously identify numerous dielectronic resonances associated with excitations of the inner-shell 2s$_{1/2}$, 2p$_{1/2}$, and 2p$_{3/2}$ electrons.

physics.atom-ph↗

arXiv2018

Measuring the Variation in Nuclear Charge Radius of Xe Isotopes by EUV Spectroscopy of Highly-Charged Na-like Ions

The variation in mean-square nuclear charge radius of xenon isotopes was measured utilizing a new method based on extreme ultraviolet spectroscopy of highly charged Na-like ions. The isotope shift of the Na-like D1 (3s $^{2}$S$_{1/2}$ - 3p $^2$P$_{1/2}$) transition between the $^{124}$Xe and $^{136}$Xe isotopes was experimentally determined using the electron beam ion trap facility at the National Institute of Standards and Technology. The mass shift and the field shift coefficients were calculated with enhanced precision by relativistic many-body perturbation theory and multi-configuration Dirac-Hartree-Fock method. The mean-square nuclear charge radius difference was found to be $δ ^{136, 124}$ = 0.269(0.042) fm$^2$. Our result has smaller uncertainty than previous experimental results and agrees with the recommended value by Angeli and Marinova [I. Angeli and K. P. Marinova, At. Data and Nucl. Data Tables {\bf 99}, 69-95 (2013)].

physics.atom-ph↗

arXiv2006

Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility

After a brief introduction to the NIST EBIT facility, we present the results of three different types of experiments that have been carried out there recently: EUV and visible spectroscopy in support of the microelectronics industry, laboratory astrophysics using an x-ray microcalorimeter, and charge exchange studies using extracted beams of highly charged ions.

physics.atom-ph↗