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Elizabeth Golightly

Publications and source records attributed to Elizabeth Golightly.

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Closing the ultrahigh temperature metrology gap: non-contact thermal conductivity ($\mathrm{k}$) and spectral emittance ($\mathrm{\varepsilon_{\lambda}}$) of molybdenum up to 3200 K

Advances in next-generation hypersonic hot structures, high heat-flux fusion or fission components, and laser based additive manufacturing depend on reliable solid state thermal conductivity data at high and ultrahigh temperatures, where conventional measurements become increasingly sensitive to contact resistances, uncertain boundary conditions, and nonlinear radiative losses. Building on our initial demonstration of ultrahigh temperature steady-state temperature differential radiometry (SSTDR), we present a substantially more robust platform aimed at making high temperature thermal and radiative property measurements more routine. The method integrates lock-in infrared thermography with a spatially localized, modulated perturbation laser to form a conduction dominant differential observable along with hyperspectral pyrometry and a validated 2D axisymmetric steady state heat transfer model. Using high purity molybdenum as a benchmark, we report solid state thermal conductivity k(T) from 1500 - 3000 K (to the onset of melting) with uncertainties of 7.9-11 % enabled by comprehensive uncertainty propagation, sensitivity analysis, and bounding studies. We additionally provide normal spectral emittance of molybdenum in both solid and liquid states over 500-1000 nm. These advances establish SSTDR as an accurate, non-contact route for closing the high temperature k(T) data gap while simultaneously producing much needed phase dependent radiative property data for melt adjacent and extreme heat-flux applications. Note: This is a shortened abstract; full version in manuscript.

cond-mat.mtrl-sci

Infrared Phonon Thermoreflectance in Polar Dielectrics

In this work, we investigate dielectric materials for thermoreflectance-based thermal sensing by extracting key optical parameters using temperature-dependent spectroscopic ellipsometry in the mid-infrared regime. Leveraging optical phonon resonances, we demonstrate that the thermoreflectance coefficients in polar dielectrics rival, and in some cases exceed by an order of magnitude, those observed in commonly used metals that are typically used as temperature transducers in thermoreflectance measurements. We introduce a transducer figure of merit (FOM) that combines pump absorption and probe reflectance modulation at different wavelengths, serving as a design-oriented screening metric for comparing thermoreflectance transducer performance across materials and spectral regions. Our results show that polar materials can exhibit performance up to eight times greater than that of metal transducers. To demonstrate practical capability, we perform transient thermoreflectance measurements on a 100 nm thermally grown SiO2 film on silicon. These results position dielectric materials as compelling candidates for next-generation thermal metrology, broadening the design space for optical thermometry, with strong implications for high-resolution thermal mapping and characterization of layered device structures based on phonon probing.

physics.optics