Revealing full molecular orientation distributions in organic thin films by nonlinear polarimetry
The performance of organic optoelectronic devices is critically dependent on how molecules orient within organic thin films. Yet, standard characterization techniques only reveal the first and second moments of the molecular orientation distribution. This limitation obscures the true molecular arrangement, as diverse distributions can yield identical low-order averages while exhibiting distinct functional properties. Here, we bridge this gap by combining multi-harmonic nonlinear polarimetry (second, third, and fourth harmonic) with the Maximum Entropy Method to reconstruct the probability distribution without any \textit{a priori} assumptions. This allows us to resolve features in the distribution such as asymmetry and bimodality, that remain invisible to conventional probes. Furthermore, we use this method to benchmark molecular dynamics simulations, revealing that these simulations often fail to capture the complex distribution despite correctly predicting the first and second moments. This work transforms molecular orientation from an inferred average into a precise observable, establishing essential validation standards for predictive material design.