arXiv subjects

Eric Viklund

Publications and source records attributed to Eric Viklund.

4 recordsLinked to original sources

arXiv2026

Microstructural Characterization of Nb3Sn Thin Films Using FIB Tomography

The accelerating gradient of Nb3Sn superconducting radiofrequency (SRF) cavities is currently limited, and the underlying cause remains an open question in the field. One leading hypothesis attributes this limitation to the presence of tin-deficient regions within the Nb3Sn coating, which can suppress the superheating field. Due to the relatively large coherence length of Nb3Sn, defects near the surface may significantly interact with the RF field. However, these subsurface defects have proven difficult to characterize. This research aims to investigate the structure and distribution of subsurface Sn deficient regions to better understand their influence on cavity performance. We employ focused ion beam (FIB) tomography to analyze the subsurface microstructure of Nb3Sn thin films. This technique enables three-dimensional reconstruction of both the tin distribution and the grain structure within the film. By correlating Sn content with grain structure, we find that Sn deficient regions are more prevalent that previously thought. However, the Sn deficient regions are consistently located below the surface of the film where RF fields are strongly attenuated by supercurrent screening and are likely not a limiting factor for cavity performance.

cond-mat.mtrl-sci↗

arXiv2025

Analysis of Niobium Electropolishing Using a Generalized Distribution of Relaxation Times Method

Using electrochemical impedance spectroscopy, we have devised a method of sensing the microscopic surface conditions on the surface of niobium as it is undergoing an electrochemical polishing (EP) treatment. The method uses electrochemical impedance spectroscopy (EIS) to gather information on the surface state of the electrode without disrupting the polishing reaction. The EIS data is analyzed using a so-called distribution of relaxation times (DRT) method. Using DRT, the EIS data can be deconvolved into discrete relaxation time peaks without any a priori knowledge of the electrode dynamics. By analyzing the relaxation time peaks, we are able to distinguish two distinct modes of the EP reaction. As the polishing voltage is increased, the electrode transitions from the low voltage EP mode, characterized by a single relaxation time peaks, to the high voltage EP mode, characterized by two relaxation time peaks. We theorize that this second peak is caused by the formation of an oxide layer on the electrode. We also find that this oxide induced peak transitions from to a negative relaxation time, which is indicative of a blocking electrode process. By analyzing EPed samples, we show that samples polished in the low voltage mode have significantly higher surface roughness due to grain etching and faceting. We find that the surface roughness of the samples only improves when the oxide film peak is present and in the negative relaxation time region. This shows that EIS combined with DRT analysis can be used to predict etching on EPed Nb. This method can also be performed before or during the EP, which could allow for adjustment of polishing parameters to guarantee a smooth cavity surface finish.

cond-mat.mtrl-sci↗

arXiv2024

Healing Gradient Degradation in Nb3Sn SRF Cavities Using a Recoating Method

Despite having advantageous superconducting properties, Nb3Sn superconducting radiofrequency (SRF) cavities still have practical challenges compared to Nb SRF cavities due to the brittle nature of Nb3Sn. Performance degradation can occur when a Nb3Sn SRF cavity experiences mechanical stresses such as during handling and tuning of the cavity. In this study, we present a potential treatment for SRF cavities that have experienced stress induced performance degradation that involves a recoating procedure. The degraded cavity is coated with a small amount of Sn using a single step vapor-diffusion methodology. Using this approach we can recover a significant portion of the lost performance of a Nb3Sn SRF cavity.

physics.acc-ph↗

arXiv2023

Improving Nb3Sn Cavity Performance Using Centrifugal Barrel Polishing

In this study we will show a new method of polishing for Nb3Sn cavities known as centrifugal barrel polishing (CBP). Using this method, Nb3Sn coated samples are polished to a surface roughness comparable to a traditional Nb cavity after electropolishing (EP). We also investigate different methods of cleaning the Nb3Sn surface after CBP to remove residual abrasive particles. The polished Nb3Sn surface is analyzed using confocal laser microscopy, and scanning electron microscopy (SEM) is used to image the surface and measure the surface roughness after polishing. Transmission electron microscopy (TEM) is also used for high resolution analysis of the surface after polishing. Finally, we show that centrifugal barrel polishing can improve the performance of a Nb3Sn SRF cavity.

physics.acc-ph↗