SearcharxivSearch

arXiv subjects

Erica Magliano

Publications and source records attributed to Erica Magliano.

2 recordsLinked to original sources

Quantifying Perovskite Solar Cell Degradation via Machine Learning from Spatially Resolved Multimodal Luminescence Time Series

Perovskite solar cells achieve remarkable power conversion efficiencies, yet operational stability remains a major barrier to large-scale deployment. Reliable and rapid assessment of device state of health is therefore essential. Conventional electrical diagnostics, such as illuminated current-voltage (J--V) sweeps, provide accurate performance metrics but are time-consuming and do not resolve spatially localized degradation, motivating non-invasive imaging-based alternatives. A deep-learning framework is introduced to estimate PSC efficiency retention, $R_\mathrm{PCE}=\mathrm{PCE}_t/\mathrm{PCE}_0$, directly from multimodal luminescence imaging acquired during device aging. Each sample combines electroluminescence (EL), open-circuit photoluminescence (PLoc), and short-circuit photoluminescence (PLsc) at an aged state with device-specific reference images at $t=0$, enabling learning of degradation-relevant spatial changes. LumPerNet, a compact convolutional neural network, is benchmarked against a spatially homogenized control in which each luminescence channel is replaced by its spatial average while retaining the same learning framework and leakage-aware protocol. The comparison indicates that global luminescence evolution contains most of the predictive signal, while spatial information provides a secondary contribution to robustness. These results establish spatially resolved luminescence imaging as a practical route for accelerated stability testing and non-invasive degradation monitoring in perovskite photovoltaics.

cond-mat.mtrl-sci

Cracking in polymer substrates for flexible devices and its mitigation

Mechanical reliability plays an outsized role in determining the durability of flexible electronic devices because of the significant mechanical stresses they can experience during manufacturing and operation. These devices are typically built on sheets comprising stiff thin-film electrodes on compliant polymer substrates, and it is generally assumed that the high-toughness substrates do not crack easily. Contrary to this widespread assumption, here we reveal severe, pervasive, and extensive cracking in the polymer substrates during bending of electrode/substrate sheets, which compromises the overall mechanical integrity of the entire device. The substrate-cracking phenomenon appears to be general, and it is driven by the amplified stress intensity factor caused by the elastic mismatch at the film/substrate interface. To mitigate this substrate cracking, an interlayer-engineering approach is designed and experimentally demonstrated. This approach is generic, and it is potentially applicable to myriad flexible electronic devices that utilize stiff films on compliant substrates, for improving their durability and reliability.

cond-mat.mtrl-sci