Drift-free characterization of electro-optic tuning efficiency in lithium niobate photonic nanocavities
Lithium niobate photonic crystal nanobeam cavity (PCNBC) represents a premier platform for integrated electro-optics, offering deep sub-wavelength mode confinement, enhanced light-matter interactions, and ultralow power consumption. However, accurate characterization of the electro-optic (EO) tuning efficiency in such high-Q devices is fundamentally impeded by DC drift, a time-dependent spectral instability arising from charge redistribution, surface screening, or buffer layer relaxation under sustained electric fields. Here, we report the systematic analysis of DC drift dynamics in lithium niobate nanocavities and demonstrate that conventional quasi-static DC voltage scanning yields highly unreliable characterization data. To circumvent this limitation, we introduce a drift-free, dynamic measurement methodology that employs high-frequency triangular-wave voltage sweeps to effectively decouple the instantaneous electronic Pockels response from slow charge-relaxation processes. Validated across 35 devices with varying electrode geometries, our method delivers reproducible tuning efficiency of 4.3-4.5 pm/V with a low coefficient of variation of 1.1%, showing excellent quantitative agreement with three-dimensional finite-element simulations. This robust, drift-free measurement technique establishes a rigorous standard for the characterization and optimization of resonant cavity electro-optics, accelerating the development of high-performance thin-film lithium niobate photonic integrated circuits.