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Farbod Shafiei

Publications and source records attributed to Farbod Shafiei.

6 recordsLinked to original sources

Enhanced Interband Optical Nonlinearities from Coupled Quantum Wells

The recent, rapid advances in nonlinear chipscale nanophotonics in the visible and near-infrared have been largely driven by manipulating the local dielectric environment proximate to decades-old workhorse bulk nonlinear optical materials, rather than increasing the inherent strength of their nonlinear response. While proposed decades ago, we demonstrate the first experimental realization of a new class of designer nonlinear materials that leverage the interband optical transition in asymmetric structures to provide strong second order susceptibility, $χ^{(2)}$. Using simple AlGaAs/GaAs coupled quantum wells operating in the near-infrared as a prototype, we observed strong second harmonic generation enhancement of 1550 nm to 775 nm over bulk controls. Extracted $χ^{(2)}$ values were as high as 2750 pm/V, which is $>$7x that of bulk GaAs. Furthermore, measured susceptibilities agreed well with quantum mechanical calculations of $χ^{(2)}$ using layer profiles extracted from electron microscopy. Growth interruptions were employed to improve interfacial abruptness in response to electron microscopy characterization, resulting in increased $χ^{(2)}$ toward the simulation predictions for ideal heterointerfaces. More complex layer designs showed predicted $χ^{(2)}$ up to 7 nm/V. Such materials are anticipated to find myriad applications, including entangled photon generation at telecommunications wavelengths for chipscale quantum information processing.

physics.optics

Observation of Fundamental Limit of Light Localization

In disordered media light can be localized in the spaces between scattering sites which average to an optical mean free path (MFP). However the fundamental question of the smallest MFP that can support Anderson localization of light remains unanswered due to fabrication complexity of a scattering medium with controlled nano-scale gaps and lack of required resolution by far-field methods. Here we use scanning probe microscopy technique to collect localized light created at gaps between scattering crystallographic defects in a large variety set of nano-gap III-V medium. No localized spots correlated to MFP below ~14.5 nm is observed at second-harmonic collection at 390 nm. Experiment and simulation resulted in the first direct observation of suppression of Anderson light localization correlated to ~13 nm optical MFP that reveals a fundamental constraint in electromagnetism and photonics.

physics.optics

Collection of Propagating Electromagnetic Fields by Uncoated Probe

Understanding light-matter interaction at the nanoscale by observation of fine details of electromagnetic fields is achieved by bringing nanoscale probes into the nearfield of light sources, capturing information that is lost in the far field. Although metal coated probes are often used for nearfield microscopy, they strongly perturb the electromagnetic fields under study. Here, through experiment and simulation, we detail light collection by uncoated fiber probes, which minimize such perturbation. Second-harmonic light from intensely-irradiated sub-wavelength sub-surface features was imaged to avoid otherwise dominating fundamental light background, yielding clear nearfield details through a 50 nm aperture uncoated probe with ~23 nm optical resolution. Simulations shows how a metallic coating distorts optical nearfields and limits optical coupling into the probe in comparison to an uncoated probe.

physics.optics

Atomic-Scale Defect Detection by Nonlinear Light Scattering and Localization

Hetero-epitaxial crystalline films underlie many electronic and optical technologies but are prone to forming defects at their hetero-interfaces. Atomic-scale defects such as threading dislocations that propagate into a film impede the flow of charge carriers and light degrading electrical-optical performance of devices. Diagnosis of subsurface defects traditionally requires time consuming invasive techniques such as cross sectional transmission electron microscopy. Using III-V films grown on Si, we have demonstrated noninvasive, bench-top diagnosis of sub-surface defects by optical second-harmonic scanning probe microscope. We observed a high-contrast pattern of sub-wavelength hot spots caused by scattering and localization of fundamental light by defect scattering sites. Size of these observed hotspots are strongly correlated to the density of dislocation defects. Our results not only demonstrate a global and versatile method for diagnosing sub-surface scattering sites but uniquely elucidate optical properties of disordered media. An extension to third harmonics would enable irregularities detection in non-X(2) materials making the technique universally applicable.

physics.app-ph

From Self-Assembly to Controlled-Assembly, From Optical Manipulation to AFM Manipulation

Moving nanoparticles/atoms to study the nearfield interaction between them is one of the many approaches to explore the optical and electrical properties of these assemblies. Traditional approach included the self assembly by spinning or drying nanoparticles in aqua on the substrate is well practiced. Lithography technique is another popular approach to deposit limited nano/micro patterns on substrates. Later optical and mechanical manipulations were used to have more control over moving individual elements of nano and microstructures and even atoms. Optical tweezers, optical trapping and AFM manipulation are examples of these precise approaches.

cond-mat.mes-hall

Measurement of the separation dependence of resonant energy transfer between CdSe/ZnS core/shell nanocrystallite quantum dots

The separation dependence of the interaction between two resonant groups of CdSe/ZnS nanocrystallite quantum dots is studied at room temperature. A near-field scanning optical microscope is used to bring a group of mono-disperse ~6.5 nm diameter nanocrystallite quantum dots which are attached to the microscope probe, into close proximity of `~8.5 nm diameter group of nanocrystallite quantum dots which are deposited on a solid immersion lens. Information extracted from photoluminescence, photoluminescence excitation and absorption curves as well as numerical calculations of the energy levels, show that the third excited excitonic energy level of the large quantum dots nearly matches the ground excitonic energy level for the small quantum dots. Quenching of the small quantum dots photoluminescence signal has been observed as they approach the large quantum dots. On average, the separation between microscope probe and solid immersion lens changed in the 15-50 nm range. The transition probability between these two groups of quantum dots is calculated to be (2.60 x 10-47 m6)/R6, within the (0.70 x 10-47 m6)/R6 - (11.0 x 10-47 m6)/R6 experimentally obtained range of transition probabilities. The Förster radius, as a signature of energy transfer efficiency, is experimentally found to be in the 14-22 nm range.

cond-mat.mes-hall