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G. Tassotto

Publications and source records attributed to G. Tassotto.

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Muon (g-2) Technical Design Report

The Muon (g-2) Experiment, E989 at Fermilab, will measure the muon anomalous magnetic moment a factor-of-four more precisely than was done in E821 at the Brookhaven National Laboratory AGS. The E821 result appears to be greater than the Standard-Model prediction by more than three standard deviations. When combined with expected improvement in the Standard-Model hadronic contributions, E989 should be able to determine definitively whether or not the E821 result is evidence for physics beyond the Standard Model. After a review of the physics motivation and the basic technique, which will use the muon storage ring built at BNL and now relocated to Fermilab, the design of the new experiment is presented. This document was created in partial fulfillment of the requirements necessary to obtain DOE CD-2/3 approval.

physics.ins-det

Beam Test of a Segmented Foil SEM Grid

A prototype Secondary-electron Emission Monitor (SEM) was installed in the 8 GeV proton transport line for the MiniBooNE experiment at Fermilab. The SEM is a segmented grid made with 5 um Ti foils, intended for use in the 120 GeV NuMI beam at Fermilab. Similar to previous workers, we found that the full collection of the secondary electron signal requires a bias voltage to draw the ejected electrons cleanly off the foils, and this effect is more pronounced at larger beam intensity. The beam centroid and width resolutions of the SEM were measured at beam widths of 3, 7, and 8 mm, and compared to calculations. Extrapolating the data from this beam test, we expect a centroid and width resolutions of 20um and 25 um, respectively, in the NuMI beam which has 1 mm spot size.

physics.ins-det

Segmented Foil SEM Grids at Fermilab

We present recent beam data from a new design of a profile monitor for proton beams at Fermilab. The monitors, consisting of grids of segmented Ti foils 5micrometers thick, are secondary-electron emission monitors (SEM's). We review data on the device's precision on beam centroid position, beam width, and on beam loss associated with the SEM material placed in the beam.

physics.ins-det