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Gholamreza Mohtashami Borzadaran

Publications and source records attributed to Gholamreza Mohtashami Borzadaran.

2 recordsLinked to original sources

Dependence control chart using maximum copula entropy

Statistical quality control methods are noteworthy to producing standard production in manufacturing processes. In this regard, there are many classical manners to control the process. Many of them have a global assumption around the distributions of the process data. They are supposed to be Normal, but it is clear that it is not always valid for all processes. Such control charts made some wrong decisions that waste funds. So, the main question while working with multivariate data set is how to find the multivariate distribution of the data set, which saves the original dependency between variables. To our knowledge, a copula function guarantees dependence on the result function. It is not enough when there is no other fundamental information about the statistical society, and we have just a data set. Therefore, we apply the maximum entropy concept to deal with this situation. In this paper, first of all, we get the joint distribution of a data set from a manufacturing process that needs to be in-control while running the production process. Then, we get an elliptical control limit via the maximum copula entropy. Finally, we represent a practical example using the method. Average run lengths are calculated for some means and shifts to show the ability of the maximum copula entropy. In the end, two practical data examples are presented, and the results of our method are compared with the traditional way based on Fisher distribution.

stat.AP↗

Profile control chart based on maximum entropy

Monitoring a process over time is so important in manufacturing processes to reduce the waste of money and time. Some charts as Shewhart, CUSUM, and EWMA are common to monitor a process with a single intended attribute which is used in different kinds of processes with various ranges of shifts. In some cases, the process quality is characterized by different types of profiles. The purpose of this article is to monitor profile coefficients instead of a process mean. In this paper, two methods are proposed for monitoring the intercept and slope of the simple linear profile, simultaneously. In this regard, two methods are compared here. The first one is the linear regression, and the one is the maximum entropy principle. The T2 Hotelling statistics is used to transfer two coefficients to a scalar. A simulation study is applied to compare the two methods in terms of the second type of error and average run length. Finally, two real examples are presented to demonstrate the applicability of the proposed chart. The first one is about semiconductors, and the second one is about pharmaceutical production processes. The performance of the methods is relatively similar. The maximum entropy plays an important role in correctly identifying differences in the pharmaceutical example, while linear regression did not correctly detect these changes.

stat.AP↗