A simple and robust method to study after-pulses in Silicon Photomultipliers
The after-pulsing probability in Silicon Photomulti- pliers and its time constant are obtained measuring the mean number of photo-electrons in a variable time window following a light pulse. The method, experimentally simple and statistically robust due to the use of the Central Limit Theorem, has been applied to an HAMAMATSU MPPC S10362-11-100C.
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