SearcharxivSearch

arXiv subjects

Goerschwin Fey

Publications and source records attributed to Goerschwin Fey.

9 recordsLinked to original sources

Flowcean - Model Learning for Cyber-Physical Systems

Effective models of Cyber-Physical Systems (CPS) are crucial for their design and operation. Constructing such models is difficult and time-consuming due to the inherent complexity of CPS. As a result, data-driven model generation using machine learning methods is gaining popularity. In this paper, we present Flowcean, a novel framework designed to automate the generation of models through data-driven learning that focuses on modularity and usability. By offering various learning strategies, data processing methods, and evaluation metrics, our framework provides a comprehensive solution, tailored to CPS scenarios. Flowcean facilitates the integration of diverse learning libraries and tools within a modular and flexible architecture, ensuring adaptability to a wide range of modeling tasks. This streamlines the process of model generation and evaluation, making it more efficient and accessible.

cs.LG

Ageing Monitoring for Commercial Microcontrollers Based on Timing Windows

Microcontrollers are increasingly present in embedded deployments and dependable systems, for which malfunctions due to hardware ageing can have severe impact. The lack of deployable techniques for ageing monitoring on these devices has spread the application of guard bands to prevent timing errors due to degradation. Applying this static technique can limit performance and lead to sudden failures as devices age. In this paper, we follow a software-based self-testing approach to design monitoring of hardware degradation for microcontrollers. Deployable in the field, our technique leverages timing windows of variable lengths to determine the maximum operational frequency of the devices. We empirically validate the method on real hardware and find that it consistently detects temperature-induced degradations in maximum operating frequency of up to 13.79 % across devices for 60 {\deg}C temperature increase.

cs.AR

Data-Driven Probabilistic Evaluation of Logic Properties with PAC-Confidence on Mealy Machines

Cyber-Physical Systems (CPS) are complex systems that require powerful models for tasks like verification, diagnosis, or debugging. Often, suitable models are not available and manual extraction is difficult. Data-driven approaches then provide a solution to, e.g., diagnosis tasks and verification problems based on data collected from the system. In this paper, we consider CPS with a discrete abstraction in the form of a Mealy machine. We propose a data-driven approach to determine the safety probability of the system on a finite horizon of n time steps. The approach is based on the Probably Approximately Correct (PAC) learning paradigm. Thus, we elaborate a connection between discrete logic and probabilistic reachability analysis of systems, especially providing an additional confidence on the determined probability. The learning process follows an active learning paradigm, where new learning data is sampled in a guided way after an initial learning set is collected. We validate the approach with a case study on an automated lane-keeping system.

cs.AI

Switching Frequency as FPGA Monitor: Studying Degradation and Ageing Prognosis at Large Scale

The growing deployment of unhardened embedded devices in critical systems demands the monitoring of hardware ageing as part of predictive maintenance. In this paper, we study degradation on a large deployment of 298 naturally aged FPGAs operating in the European XFEL particle accelerator. We base our statistical analyses on 280 days of in-field measurements and find a generalized and continuous degradation of the switching frequency across all devices with a median value of 0.064%. The large scale of this study allows us to localize areas of the deployed FPGAs that are highly impacted by degradation. Moreover, by training machine learning models on the collected data, we are able to forecast future trends of frequency degradation with horizons of 60 days and relative errors as little as 0.002% over an evaluation period of 100 days.

cs.AR

Studying the Degradation of Propagation Delay on FPGAs at the European XFEL

An increasing number of unhardened commercial-off-the-shelf embedded devices are deployed under harsh operating conditions and in highly-dependable systems. Due to the mechanisms of hardware degradation that affect these devices, ageing detection and monitoring are crucial to prevent critical failures. In this paper, we empirically study the propagation delay of 298 naturally-aged FPGA devices that are deployed in the European XFEL particle accelerator. Based on in-field measurements, we find that operational devices show significantly slower switching frequencies than unused chips, and that increased gamma and neutron radiation doses correlate with increased hardware degradation. Furthermore, we demonstrate the feasibility of developing machine learning models that estimate the switching frequencies of the devices based on historical and environmental data.

cs.AR

Ageing Analysis of Embedded SRAM on a Large-Scale Testbed Using Machine Learning

Ageing detection and failure prediction are essential in many Internet of Things (IoT) deployments, which operate huge quantities of embedded devices unattended in the field for years. In this paper, we present a large-scale empirical analysis of natural SRAM wear-out using 154 boards from a general-purpose testbed. Starting from SRAM initialization bias, which each node can easily collect at startup, we apply various metrics for feature extraction and experiment with common machine learning methods to predict the age of operation for this node. Our findings indicate that even though ageing impacts are subtle, our indicators can well estimate usage times with an $R^2$ score of 0.77 and a mean error of 24% using regressors, and with an F1 score above 0.6 for classifiers applying a six-months resolution.

cs.AR

A Review of Techniques for Ageing Detection and Monitoring on Embedded Systems

Embedded digital devices are progressively deployed in dependable or safety-critical systems. These devices undergo significant hardware ageing, particularly in harsh environments. This increases their likelihood of failure. It is crucial to understand ageing processes and to detect hardware degradation early for guaranteeing system dependability. In this survey, we review the core ageing mechanisms, identify and categorize general working principles of ageing detection and monitoring techniques for Commercial-Off-The-Shelf (COTS) components that are prevalent in embedded systems: Field Programmable Gate Arrays (FPGAs), microcontrollers, System-on-Chips (SoCs), and their power supplies. From our review, we find that online techniques are more widely applied on FPGAs than on other components, and see a rising trend towards machine learning application for analysing hardware ageing. Based on the reviewed literature, we identify research opportunities and potential directions of interest in the field. With this work, we intend to facilitate future research by systematically presenting all main approaches in a concise way.

cs.AR

YAPS -- Your Open Examination System for Activating and emPowering Students

There are numerous e-assessment systems devoted to specific domains under diverse license models. Cost, extensibility, and maintainability are relevant issues for an institution. Ease of use and inclusion into courses are educator's main concerns. For students the user experience and fast transparent feedback plus "better" tests are most important. Many exams still focus on testing memorized knowledge, instead of improving and testing skills with competence-oriented learning support and examinations, respectively. We discuss design decisions and present the resulting architecture of YAPS - Your open Assessment system for emPowering Students. YAPS has been used for very diverse lectures in logistics, computer engineering, and algorithms for exams, but also for empowering students by fast feedback during the learning period. We report on results in a basic lecture on Computer Science for Mechanical Engineers.

cs.CY

Synthesizing Adaptive Test Strategies from Temporal Logic Specifications

Constructing good test cases is difficult and time-consuming, especially if the system under test is still under development and its exact behavior is not yet fixed. We propose a new approach to compute test strategies for reactive systems from a given temporal logic specification using formal methods. The computed strategies are guaranteed to reveal certain simple faults in every realization of the specification and for every behavior of the uncontrollable part of the system's environment. The proposed approach supports different assumptions on occurrences of faults (ranging from a single transient fault to a persistent fault) and by default aims at unveiling the weakest one. Based on well-established hypotheses from fault-based testing, we argue that such tests are also sensitive for more complex bugs. Since the specification may not define the system behavior completely, we use reactive synthesis algorithms with partial information. The computed strategies are adaptive test strategies that react to behavior at runtime. We work out the underlying theory of adaptive test strategy synthesis and present experiments for a safety-critical component of a real-world satellite system. We demonstrate that our approach can be applied to industrial specifications and that the synthesized test strategies are capable of detecting bugs that are hard to detect with random testing.

cs.SE