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Guillaume Guegan

Publications and source records attributed to Guillaume Guegan.

2 recordsLinked to original sources

Non-linear impedance spectroscopy applied to thermoelectric measurements: beyond the ZT estimation

Thermoelectric measurement of the dimensionless zT parameter requires multiple physical quantities to be measured, therefore there is great interest to find an experimental setup capable of measuring all these properties at once. Previous works on impedance spectroscopy have shown promising results in this direction, however, this technique does not lead to a complete characterization of the thermoelectric system without additional measurement. In order to extend impedance spectroscopy, we have investigated the measurement of the non-linear harmonic response of a Peltier device. The experiments are analyzed using an analytic model obtained by solving the heat equation in the frequency regime. Our work shows that fitting the experimental response of the system in the harmonic regime can lead to a complete characterization of the thermoelectric properties without the need of additional measurement.

physics.app-ph↗

Influence of homo-buffer layer on stress control of sputtered (Ba0.45,Sr0.55)TiO3 thin films on Pt-Si

To engineer strain relaxation of sputtered BST thin films on Pt-Si wafers, homo-buffer layer method was applied to eliminate Pt hillock formation. Thin BST homo-buffer layers were deposited at room temperature and subsequently the main BST layer was deposited at 650°C, Pt hillock free BST films were obtained with homo-buffer thickness above 5 nm. Relatively good electrical properties were obtained for BST thin films with 15 and 25 nm homo-buffer layer (T= 30 % at 5V and tan δ= 0.018).

cond-mat.mtrl-sci↗