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Guodong Meng

Publications and source records attributed to Guodong Meng.

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FEcMD: A multi-physics and multi-scale computational program for dynamic coupling molecular dynamics simulations with transient electric field and heat conduction in metal nanostructures

Field emission coupled with molecular dynamics simulation (FEcMD) software package is a computational tool for studying atomic structure evolution, structural deformation, phase transitions, recrystallization as well as electron emission characteristics of micro- and nano-protrusions and nanowires consisting of elemental metals or multi-component alloys by means of multi-physics and multi-scale methodology. Current implementations of molecular dynamics simulation coupled with multi-scale electrodynamics (ED) and heat conduction (HC) in FEcMD program are advanced mainly in the two aspects as follows. In electrodynamics, the FEcMD program incorporates the space charge interactions (space charge potential and exchange-correlation effects) in the self-consistent solved Poisson-Schr\"odinger equation with Wentzel-Kramers-Brillouin-Jeffreys (WKBJ) approximation to evaluate the field emission current density and the related resistive heating process more reliably for nanowires or nano-protrusions especially for nano-gaps between two metal electrodes. Meanwhile, the two-temperature heat conduction model is implemented in electrodynamics coupled with molecular dynamics simulations (ED-MD), providing more dedicated descriptions for the hierarchical electron-phonon two-channel heat conduction mechanism and the temperature evolutions of electron and phonon subsystems under the radiofrequency (RF) or pulse electric fields. Benchmark tests are performed for some key implementations in FEcMD software to validate the numerical results, and also to demonstrate the use of program to study the atomic structure evolution of metal nano-structures under electric field and heating processes.

physics.comp-ph

In-situ observation of field-induced nano-protrusion growth on a carbon-coated tungsten nanotip

Nano-protrusion (NP) on metal surface and its inevitable contamination layer under high electric field is often considered as the primary precursor that leads to vacuum breakdown, which plays an extremely detrimental effect for high energy physics equipment and many other devices. Yet, the NP growth has never been experimentally observed. Here, we conduct field emission (FE) measurements along with in-situ Transmission Electron Microscopy (TEM) imaging of an amorphous-carbon (a-C) coated tungsten nanotip at various nanoscale vacuum gap distances. We find that under certain conditions, the FE current-voltage (I-V) curves switch abruptly into an enhanced-current state, implying the growth of an NP. We then run field emission simulations, demonstrating that the temporary enhanced-current I-V is perfectly consistent with the hypothesis that a NP has grown at the apex of the tip. This hypothesis is also confirmed by the repeatable in-situ observation of such a nano-protrusion and its continued growth during successive FE measurements in TEM. We tentatively attribute this phenomenon to field-induced biased diffusion of surface a-C atoms, after performing a finite element analysis that excludes the alternative possibility of field-induced plastic deformation.

cond-mat.mtrl-sci