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H. R. Schmidt

Publications and source records attributed to H. R. Schmidt.

10 recordsLinked to original sources
arXiv2023

From 3D to 5D tracking: SMX ASIC-based Double-Sided Micro-Strip detectors for comprehensive space, time, and energy measurements

We present the recent development of a lightweight detector capable of accurate spatial, timing, and amplitude resolution of charged particles. The technology is based on double-sided double-metal p+\,--\,n\,--\,n+ micro-strip silicon sensors, ultra-light long aluminum-polyimide micro-cables for the analogue signal transfer, and a custom-developed SMX read-out ASIC capable of measurement of the time ($Δt \lesssim 5 \,\mathrm{ns}$) and amplitude. Dense detector integration enables a material budget $>0.3\,\% X_0$. A sophisticated powering and grounding scheme keeps the noise under control. In addition to its primary application in Silicon Tracking System of the future CBM experiment in Darmstadt, our detector will be utilized in other research applications.

physics.ins-det↗
arXiv2021

Optical Inspection of the Silicon Micro-strip Sensors for the CBM Experiment employing Artificial Intelligence

Optical inspection of 1191 silicon micro-strip sensors was performed using a custom made optical inspection setup, employing a machine-learning based approach for the defect analysis and subsequent quality assurance. Furthermore, metrological control of the sensor's surface was performed. In this manuscript, we present the analysis of various sensor surface defects. Among these are implant breaks, p-stop breaks, aluminium strip opens, aluminium strip shorts, surface scratches, double metallization layer defects, passivation layer defects, bias resistor defects as well as dust particle identification. The defect detection was done using the application of Convolutional Deep Neural Networks (CDNNs). From this, defective strips and defect clusters were identified, as well as a 2D map of the defects using their geometrical positions on the sensor was performed. Based on the total number of defects found on the sensor's surface, a method for the estimation of sensor's overall quality grade and quality score was proposed.

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arXiv2021

Spark probability measurement of a single mask triple GEM detector

Triple Gas Electron Multiplier (GEM) detectors will be used as a tracking device in the first two stations of CBM MUon CHamber (MUCH), where the maximum particle rate is expected to reach ~1 MHz/cm2 for central Au-Au collisions at 8 AGeV. Therefore, the stable operation of the detector is very important. Discharge probability has been measured of a single mask triple GEM detector at the CERN SPS/H4 beam-line facility with a pion beam of ~150 GeV/c and also in an environment of highly ionizing shower particles. The spark probability as a function of gain has been studied for different particle rates. The details of the experimental setup, method of spark identification and results are presented in this paper.

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arXiv2018

High-Precision Contactless Optical 3D-Metrology of Silicon Sensors

We describe a setup and procedures for contactless optical 3D-metrology of silicon micro-strip sensors. Space points are obtained by video microscopy and a high precision XY-table. The XY-dimensions are obtained from the movement of the table and pattern recognition, while the Z-dimension results from a Fast Fourier Transformation analyses of microscopic images taken at various distances of the optical system from the object under investigation. The setup is employed to measure the position of silicon sensors mounted onto a carbon fibre structure with a precision of a few microns.

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arXiv2018

Advanced Methods for the Optical Quality Assurance of Silicon Sensors

We describe a setup for optical quality assurance of silicon microstrip sensors. Pattern recognition algorithms were developed to analyze microscopic scans of the sensors for defects. It is shown that the software has a recognition and classification rate of $>$~90\% for defects like scratches, shorts, broken metal lines etc. We have demonstrated that advanced image processing based on neural network techniques is able to further improve the recognition and defect classification rate.

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arXiv2015

Systematic measurements of the gain and the energy resolution of single and double mask GEM detectors

Systematic studies on the gain and the energy resolution have been carried out varying the voltage across the GEM foils for both single mask and double mask triple GEM detector prototypes. Variation of the gain and the energy resolution have also been measured varying either the drift voltage, transfer voltage and induction voltage keeping other voltages constant. The results of the systematic measurements has been presented.

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arXiv2014

Study of the characteristics of GEM detectors for the future FAIR experiment CBM

Characteristics of triple GEM detector have been studied systematically. The variation of the effective gain and energy resolution of GEM with variation of the applied voltage has been measured with Fe55 X-ray source for different gas mixtures and with different gas flow rates. Long-term test of the GEM has also been performed.

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arXiv2013

Development of a GEM based detector for the CBM Muon Chamber (MUCH)

The characteristics of triple GEM detectors have been studied systematically by using cosmic ray muons. The minimum ionizing particle (MIP) spectra has been taken for different GEM voltage setting. Efficiency of GEM detector has been measured for cosmic ray. At high rate operation of GEMs the value of the protection resistor influences the gain and the stability. This feature has been investigated varying both the rate and the value of the protection resistor. This measurement has been performed using both X-ray generator and Fe55 source. The ageing and long-term stability of GEM based detectors has been studied employing both X-ray generator and Fe55 source. The ageing study of one GEM module is performed by using a 8 keV Cu X-ray generator to verify the stability and integrity of the GEM detectors over a longer period of time. The accumulated charge on the detector is calculated from the rate of the X-ray and the average gain of the detector. The details of the measurement and results has been described in this article.

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arXiv2009

Getting Ready for Physics - Commissioning of the ALICE Experiment

ALICE at CERN-LHC is an experiment dedicated to the study of high-energy heavy-ion collision. In this paper we will briefly describe the experimental layout and give an overview on the installation status of the ALICE detector components including an outlook towards the completion of the staged detector setup. We will review the commissioning of the detector components with emphasis on the central detectors, in particular the time projection chamber (TPC). The commissioning took place in summer 2008 awaiting the first beams from the LHC in the fall. The result from commissioning are compared with the performance figures, which are outlined in the ALICE Physics Performance Reports.

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