arXiv subjects

Haiyong Chen

Publications and source records attributed to Haiyong Chen.

9 recordsLinked to original sources

arXiv2026

FuDU: A Fuzzy Dual-dimensional Uncertainty Framework for Streaming Active Learning in Industrial Defect Detection

Ensuring the reliability of deep learning models in real-time industrial defect detection is critical for high-stakes quality inspection. To mine uncertain samples within continuous industrial media streams, thereby enhancing the reliability of the detection system, this paper proposes a streaming active learning method based on the Fuzzy Dual-dimensional Uncertainty (FuDU) framework. Specifically, we first design a Prototype-based Global Uncertainty Quantification (PGUQ) module on the backbone to evaluate image-level uncertainty via normal/defective feature prototypes. A Dual-entropy defect Uncertainty Evaluator (DeUE) is then integrated into the detection head to quantify box-level uncertainty. Finally, by modeling uncertainty as systematic error, we propose a fuzzy dual-dimensional uncertainty-aware strategy that leverages fuzzy inference to fuse dual-dimensional uncertainties, enabling expert knowledge-driven adaptive sampling decisions. Comprehensive experiments demonstrate that FuDU is efficient and flexible, making it well-suited for challenging industrial inspection tasks such as the detection of nuclear fuel rod defects. Our code is publicly available at: https://github.com/wangzhaoyang-508/FuDU.

cs.CV↗

arXiv2026

MAOL: Morphology-Aware Ordinal Learning for Fine-Grained Industrial Defect Severity Grading

Fine-grained defect severity grading is essential for industrial inspection, yet remains challenging due to the ordinal nature of severity labels, the strong dependence on morphology-related cues, and the train-test discrepancy between clean annotated instances and noisy predicted instances in two-stage pipelines. We propose MAOL, a Morphology-Aware Ordinal Learning framework for fine-grained industrial defect severity grading. MAOL formulates severity grading as an instance-level ordinal learning task, incorporates explicit morphological features to enhance representation learning, introduces class-conditional adaptive ordinal thresholds to model defect-specific grading boundaries, and employs prediction-aware training via localization perturbation to improve robustness to imperfect predicted instances. Extensive experiments under both clean-ROI and predicted-instance settings demonstrate that MAOL consistently outperforms rule-based methods, nominal classification models, and existing ordinal baselines, especially in the predicted-instance setting. The proposed approach ranked third in the IDA 2026 Challenge on Fine-Grained Severity Grading for High-Precision Manufacturing.

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arXiv2026

ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing

This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization. To address these limitations, we design two complementary tracks: Track 1 (Cross-Scenario Defect Detection) targets accurate defect detection, localization, and classification across diverse unseen production environments; Track 2 (Fine-Grained Severity Grading) requires assigning each detected defect an industry-standard severity level, including Acceptable, Marginal NG, NG, and Gross NG. We construct a large-scale industrial dataset of high-resolution microscopic images spanning seven representative defect categories, comprising over 3,800 images with pixel-level instance annotations for Track 1 and over 2,600 images with severity-grade labels for Track 2. The challenge attracted 86 registered participants with 130 submissions; during the final testing phase, 21 teams submitted results and 12 teams provided models with technical reports. The resulting benchmark, together with the diverse and effective solutions contributed by participating teams, sets a new standard for industrial defect analysis research.

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arXiv2026

OOVDet: Low-Density Prior Learning for Zero-Shot Out-of-Vocabulary Object Detection

Zero-shot out-of-vocabulary detection (ZS-OOVD) aims to accurately recognize objects of in-vocabulary (IV) categories provided at zero-shot inference, while simultaneously rejecting undefined ones (out-of-vocabulary, OOV) that lack corresponding category prompts. However, previous methods are prone to overfitting the IV classes, leading to the OOV or undefined classes being misclassified as IV ones with a high confidence score. To address this issue, this paper proposes a zero-shot OOV detector (OOVDet), a novel framework that effectively detects predefined classes while reliably rejecting undefined ones in zero-shot scenes. Specifically, due to the model's lack of prior knowledge about the distribution of OOV data, we synthesize region-level OOV prompts by sampling from the low-likelihood regions of the class-conditional Gaussian distributions in the hidden space, motivated by the assumption that unknown semantics are more likely to emerge in low-density areas of the latent space. For OOV images, we further propose a Dirichlet-based gradient attribution mechanism to mine pseudo-OOV image samples, where the attribution gradients are interpreted as Dirichlet evidence to estimate prediction uncertainty, and samples with high uncertainty are selected as pseudo-OOV images. Building on these synthesized OOV prompts and pseudo-OOV images, we construct the OOV decision boundary through a low-density prior constraint, which regularizes the optimization of OOV classes using Gaussian kernel density estimation in accordance with the above assumption. Experimental results show that our method significantly improves the OOV detection performance in zero-shot scenes. The code is available at https://github.com/binyisu/OOV-detector.

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arXiv2025

Photovoltaic Defect Image Generator with Boundary Alignment Smoothing Constraint for Domain Shift Mitigation

Accurate defect detection of photovoltaic (PV) cells is critical for ensuring quality and efficiency in intelligent PV manufacturing systems. However, the scarcity of rich defect data poses substantial challenges for effective model training. While existing methods have explored generative models to augment datasets, they often suffer from instability, limited diversity, and domain shifts. To address these issues, we propose PDIG, a Photovoltaic Defect Image Generator based on Stable Diffusion (SD). PDIG leverages the strong priors learned from large-scale datasets to enhance generation quality under limited data. Specifically, we introduce a Semantic Concept Embedding (SCE) module that incorporates text-conditioned priors to capture the relational concepts between defect types and their appearances. To further enrich the domain distribution, we design a Lightweight Industrial Style Adaptor (LISA), which injects industrial defect characteristics into the SD model through cross-disentangled attention. At inference, we propose a Text-Image Dual-Space Constraints (TIDSC) module, enforcing the quality of generated images via positional consistency and spatial smoothing alignment. Extensive experiments demonstrate that PDIG achieves superior realism and diversity compared to state-of-the-art methods. Specifically, our approach improves Frechet Inception Distance (FID) by 19.16 points over the second-best method and significantly enhances the performance of downstream defect detection tasks.

cs.CV↗

arXiv2024

GDDS: A Single Domain Generalized Defect Detection Frame of Open World Scenario using Gather and Distribute Domain-shift Suppression Network

Efficient and intelligent surface defect detection of photovoltaic modules is crucial for improving the quality of photovoltaic modules and ensuring the reliable operation of large-scale infrastructure. However, the scenario characteristics of data distribution deviation make the construction of defect detection models for open world scenarios such as photovoltaic manufacturing and power plant inspections a challenge. Therefore, we propose the Gather and Distribute Domain shift Suppression Network (GDDS). It adopts a single domain generalized method that is completely independent of the test samples to address the problem of distribution shift. Using a one-stage network as the baseline network breaks through the limitations of traditional domain generalization methods that typically use two-stage networks. It not only balances detection accuracy and speed but also simplifies the model deployment and application process. The GDDS includes two modules: DeepSpine Module and Gather and Distribute Module. Specifically, the DeepSpine Module applies a wider range of contextual information and suppresses background style shift by acquiring and concatenating multi-scale features. The Gather and Distribute Module collects and distributes global information to achieve cross layer interactive learning of multi-scale channel features and suppress defect instance shift. Furthermore, the GDDS utilizes normalized Wasserstein distance for similarity measurement, reducing measurement errors caused by bounding box position deviations. We conducted a comprehensive evaluation of GDDS on the EL endogenous shift dataset and Photovoltaic inspection infrared image dataset. The experimental results showed that GDDS can adapt to defect detection in open world scenarios faster and better than other state-of-the-art methods.

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arXiv2021

SIGAN: A Novel Image Generation Method for Solar Cell Defect Segmentation and Augmentation

Solar cell electroluminescence (EL) defect segmentation is an interesting and challenging topic. Many methods have been proposed for EL defect detection, but these methods are still unsatisfactory due to the diversity of the defect and background. In this paper, we provide a new idea of using generative adversarial network (GAN) for defect segmentation. Firstly, the GAN-based method removes the defect region in the input defective image to get a defect-free image, while keeping the background almost unchanged. Then, the subtracted image is obtained by making difference between the defective input image with the generated defect-free image. Finally, the defect region can be segmented through thresholding the subtracted image. To keep the background unchanged before and after image generation, we propose a novel strong identity GAN (SIGAN), which adopts a novel strong identity loss to constraint the background consistency. The SIGAN can be used not only for defect segmentation, but also small-samples defective dataset augmentation. Moreover, we release a new solar cell EL image dataset named as EL-2019, which includes three types of images: crack, finger interruption and defect-free. Experiments on EL-2019 dataset show that the proposed method achieves 90.34% F-score, which outperforms many state-of-the-art methods in terms of solar cell defects segmentation results.

cs.CV↗

arXiv2021

BAF-Detector: An Efficient CNN-Based Detector for Photovoltaic Cell Defect Detection

The multi-scale defect detection for photovoltaic (PV) cell electroluminescence (EL) images is a challenging task, due to the feature vanishing as network deepens. To address this problem, an attention-based top-down and bottom-up architecture is developed to accomplish multi-scale feature fusion. This architecture, called Bidirectional Attention Feature Pyramid Network (BAFPN), can make all layers of the pyramid share similar semantic features. In BAFPN, cosine similarity is employed to measure the importance of each pixel in the fused features. Furthermore, a novel object detector is proposed, called BAF-Detector, which embeds BAFPN into Region Proposal Network (RPN) in Faster RCNN+FPN. BAFPN improves the robustness of the network to scales, thus the proposed detector achieves a good performance in multi-scale defects detection task. Finally, the experimental results on a large-scale EL dataset including 3629 images, 2129 of which are defective, show that the proposed method achieves 98.70% (F-measure), 88.07% (mAP), and 73.29% (IoU) in terms of multi-scale defects classification and detection results in raw PV cell EL images.

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arXiv2018

Solar Cell Surface Defect Inspection Based on Multispectral Convolutional Neural Network

Similar and indeterminate defect detection of solar cell surface with heterogeneous texture and complex background is a challenge of solar cell manufacturing. The traditional manufacturing process relies on human eye detection which requires a large number of workers without a stable and good detection effect. In order to solve the problem, a visual defect detection method based on multi-spectral deep convolutional neural network (CNN) is designed in this paper. Firstly, a selected CNN model is established. By adjusting the depth and width of the model, the influence of model depth and kernel size on the recognition result is evaluated. The optimal CNN model structure is selected. Secondly, the light spectrum features of solar cell color image are analyzed. It is found that a variety of defects exhibited different distinguishable characteristics in different spectral bands. Thus, a multi-spectral CNN model is constructed to enhance the discrimination ability of the model to distinguish between complex texture background features and defect features. Finally, some experimental results and K-fold cross validation show that the multi-spectral deep CNN model can effectively detect the solar cell surface defects with higher accuracy and greater adaptability. The accuracy of defect recognition reaches 94.30%. Applying such an algorithm can increase the efficiency of solar cell manufacturing and make the manufacturing process smarter.

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