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Hangil Park

Publications and source records attributed to Hangil Park.

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Contrastive Knowledge Distillation for Anomaly Detection in Multi-Illumination/Focus Display Images

In this paper, we tackle automatic anomaly detection in multi-illumination and multi-focus display images. The minute defects on the display surface are hard to spot out in RGB images and by a model trained with only normal data. To address this, we propose a novel contrastive learning scheme for knowledge distillation-based anomaly detection. In our framework, Multiresolution Knowledge Distillation (MKD) is adopted as a baseline, which operates by measuring feature similarities between the teacher and student networks. Based on MKD, we propose a novel contrastive learning method, namely Multiresolution Contrastive Distillation (MCD), which does not require positive/negative pairs with an anchor but operates by pulling/pushing the distance between the teacher and student features. Furthermore, we propose the blending module that transforms and aggregate multi-channel information to the three-channel input layer of MCD. Our proposed method significantly outperforms competitive state-of-the-art methods in both AUROC and accuracy metrics on the collected Multi-illumination and Multi-focus display image dataset for Anomaly Detection (MMdAD).

cs.CV

Generalist Multi-Class Anomaly Detection via Distillation to Two Heterogeneous Student Networks

Anomaly detection (AD) plays an important role in various real-world applications. Recent advancements in AD, however, are often biased towards industrial inspection, struggle to generalize to broader tasks like semantic anomaly detection and vice versa. Although recent methods have attempted to address general anomaly detection, their performance remains sensitive to dataset-specific settings and single-class tasks. In this paper, we propose a novel dual-model ensemble approach based on knowledge distillation (KD) to bridge this gap. Our framework consists of a teacher and two student models: an Encoder-Decoder model, specialized in detecting patch-level minor defects for industrial AD and an Encoder-Encoder model, optimized for semantic AD. Both models leverage a shared pre-trained encoder (DINOv2) to extract high-quality feature representations. The dual models are jointly learned using the Noisy-OR objective, and the final anomaly score is obtained using the joint probability via local and semantic anomaly scores derived from the respective models. We evaluate our method on eight public benchmarks under both single-class and multi-class settings: MVTec-AD, MVTec-LOCO, VisA and Real-IAD for industrial inspection and CIFAR-10/100, FMNIST and View for semantic anomaly detection. The proposed method achieved state-of-the-art accuracies in both domains, in multi-class as well as single-class settings, demonstrating generalization across multiple domains of anomaly detection. Our model achieved an image-level AUROC of 99.7% on MVTec-AD and 97.8% on CIFAR-10, which is significantly better than the prior general AD models in multi-class settings and even higher than the best specialist models on individual benchmarks.

cs.CV