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Hasan Hassan

Publications and source records attributed to Hasan Hassan.

At least 19 recordsLinked to original sources

Sectored DRAM: A Practical Energy-Efficient and High-Performance Fine-Grained DRAM Architecture

We propose Sectored DRAM, a new, low-overhead DRAM substrate that reduces wasted energy by enabling fine-grained DRAM data transfers and DRAM row activation. Sectored DRAM leverages two key ideas to enable fine-grained data transfers and row activation at low chip area cost. First, a cache block transfer between main memory and the memory controller happens in a fixed number of clock cycles where only a small portion of the cache block (a word) is transferred in each cycle. Sectored DRAM augments the memory controller and the DRAM chip to execute cache block transfers in a variable number of clock cycles based on the workload access pattern with minor modifications to the memory controller's and the DRAM chip's circuitry. Second, a large DRAM row, by design, is already partitioned into smaller independent physically isolated regions. Sectored DRAM provides the memory controller with the ability to activate each such region based on the workload access pattern via small modifications to the DRAM chip's array access circuitry. Activating smaller regions of a large row relaxes DRAM power delivery constraints and allows the memory controller to schedule DRAM accesses faster. Compared to a system with coarse-grained DRAM, Sectored DRAM reduces the DRAM energy consumption of highly-memory-intensive workloads by up to (on average) 33% (20%) while improving their performance by up to (on average) 36% (17%). Sectored DRAM's DRAM energy savings, combined with its system performance improvement, allows system-wide energy savings of up to 23%. Sectored DRAM's DRAM chip area overhead is 1.7% the area of a modern DDR4 chip. We hope and believe that Sectored DRAM's ideas and results will help to enable more efficient and high-performance memory systems. To this end, we open source Sectored DRAM at https://github.com/CMU-SAFARI/Sectored-DRAM.

cs.AR

PiDRAM: A Holistic End-to-end FPGA-based Framework for Processing-in-DRAM

Processing-using-memory (PuM) techniques leverage the analog operation of memory cells to perform computation. Several recent works have demonstrated PuM techniques in off-the-shelf DRAM devices. Since DRAM is the dominant memory technology as main memory in current computing systems, these PuM techniques represent an opportunity for alleviating the data movement bottleneck at very low cost. However, system integration of PuM techniques imposes non-trivial challenges that are yet to be solved. Design space exploration of potential solutions to the PuM integration challenges requires appropriate tools to develop necessary hardware and software components. Unfortunately, current specialized DRAM-testing platforms, or system simulators do not provide the flexibility and/or the holistic system view that is necessary to deal with PuM integration challenges. We design and develop PiDRAM, the first flexible end-to-end framework that enables system integration studies and evaluation of real PuM techniques. PiDRAM provides software and hardware components to rapidly integrate PuM techniques across the whole system software and hardware stack (e.g., necessary modifications in the operating system, memory controller). We implement PiDRAM on an FPGA-based platform along with an open-source RISC-V system. Using PiDRAM, we implement and evaluate two state-of-the-art PuM techniques: in-DRAM (i) copy and initialization, (ii) true random number generation. Our results show that the in-memory copy and initialization techniques can improve the performance of bulk copy operations by 12.6x and bulk initialization operations by 14.6x on a real system. Implementing the true random number generator requires only 190 lines of Verilog and 74 lines of C code using PiDRAM's software and hardware components.

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Improving DRAM Performance, Reliability, and Security by Rigorously Understanding Intrinsic DRAM Operation

DRAM is the primary technology used for main memory in modern systems. Unfortunately, as DRAM scales down to smaller technology nodes, it faces key challenges in both data integrity and latency, which strongly affect overall system reliability, security, and performance. To develop reliable, secure, and high-performance DRAM-based main memory for future systems, it is critical to rigorously characterize, analyze, and understand various aspects (e.g., reliability, retention, latency, RowHammer vulnerability) of existing DRAM chips and their architecture. The goal of this dissertation is to 1) develop techniques and infrastructures to enable such rigorous characterization, analysis, and understanding, and 2) enable new mechanisms to improve DRAM performance, reliability, and security based on the developed understanding. To this end, in this dissertation, we 1) design, implement, and prototype a new practical-to-use and flexible FPGA-based DRAM characterization infrastructure (called SoftMC), 2) use the DRAM characterization infrastructure to develop a new experimental methodology (called U-TRR) to uncover the operation of existing proprietary in-DRAM RowHammer protection mechanisms and craft new RowHammer access patterns to efficiently circumvent these RowHammer protection mechanisms, 3) propose a new DRAM architecture, called SelfManaging DRAM, for enabling autonomous and efficient in-DRAM maintenance operations that enable not only better performance, efficiency, and reliability but also faster and easier adoption of changes to DRAM chips, and 4) propose a versatile DRAM substrate, called the Copy-Row (CROW) substrate, that enables new mechanisms for improving DRAM performance, energy consumption, and reliability.

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MetaSys: A Practical Open-Source Metadata Management System to Implement and Evaluate Cross-Layer Optimizations

This paper introduces the first open-source FPGA-based infrastructure, MetaSys, with a prototype in a RISC-V core, to enable the rapid implementation and evaluation of a wide range of cross-layer techniques in real hardware. Hardware-software cooperative techniques are powerful approaches to improve the performance, quality of service, and security of general-purpose processors. They are however typically challenging to rapidly implement and evaluate in real hardware as they require full-stack changes to the hardware, OS, system software, and instruction-set architecture (ISA). MetaSys implements a rich hardware-software interface and lightweight metadata support that can be used as a common basis to rapidly implement and evaluate new cross-layer techniques. We demonstrate MetaSys's versatility and ease-of-use by implementing and evaluating three cross-layer techniques for: (i) prefetching for graph analytics; (ii) bounds checking in memory unsafe languages, and (iii) return address protection in stack frames; each technique only requiring ~100 lines of Chisel code over MetaSys. Using MetaSys, we perform the first detailed experimental study to quantify the performance overheads of using a single metadata management system to enable multiple cross-layer optimizations in CPUs. We identify the key sources of bottlenecks and system inefficiency of a general metadata management system. We design MetaSys to minimize these inefficiencies and provide increased versatility compared to previously-proposed metadata systems. Using three use cases and a detailed characterization, we demonstrate that a common metadata management system can be used to efficiently support diverse cross-layer techniques in CPUs.

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DRAM Bender: An Extensible and Versatile FPGA-based Infrastructure to Easily Test State-of-the-art DRAM Chips

To understand and improve DRAM performance, reliability, security and energy efficiency, prior works study characteristics of commodity DRAM chips. Unfortunately, state-of-the-art open source infrastructures capable of conducting such studies are obsolete, poorly supported, or difficult to use, or their inflexibility limit the types of studies they can conduct. We propose DRAM Bender, a new FPGA-based infrastructure that enables experimental studies on state-of-the-art DRAM chips. DRAM Bender offers three key features at the same time. First, DRAM Bender enables directly interfacing with a DRAM chip through its low-level interface. This allows users to issue DRAM commands in arbitrary order and with finer-grained time intervals compared to other open source infrastructures. Second, DRAM Bender exposes easy-to-use C++ and Python programming interfaces, allowing users to quickly and easily develop different types of DRAM experiments. Third, DRAM Bender is easily extensible. The modular design of DRAM Bender allows extending it to (i) support existing and emerging DRAM interfaces, and (ii) run on new commercial or custom FPGA boards with little effort. To demonstrate that DRAM Bender is a versatile infrastructure, we conduct three case studies, two of which lead to new observations about the DRAM RowHammer vulnerability. In particular, we show that data patterns supported by DRAM Bender uncovers a larger set of bit-flips on a victim row compared to the data patterns commonly used by prior work. We demonstrate the extensibility of DRAM Bender by implementing it on five different FPGAs with DDR4 and DDR3 support. DRAM Bender is freely and openly available at https://github.com/CMU-SAFARI/DRAM-Bender.

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Uncovering In-DRAM RowHammer Protection Mechanisms: A New Methodology, Custom RowHammer Patterns, and Implications

The RowHammer vulnerability in DRAM is a critical threat to system security. To protect against RowHammer, vendors commit to security-through-obscurity: modern DRAM chips rely on undocumented, proprietary, on-die mitigations, commonly known as Target Row Refresh (TRR). At a high level, TRR detects and refreshes potential RowHammer-victim rows, but its exact implementations are not openly disclosed. Security guarantees of TRR mechanisms cannot be easily studied due to their proprietary nature. To assess the security guarantees of recent DRAM chips, we present Uncovering TRR (U-TRR), an experimental methodology to analyze in-DRAM TRR implementations. U-TRR is based on the new observation that data retention failures in DRAM enable a side channel that leaks information on how TRR refreshes potential victim rows. U-TRR allows us to (i) understand how logical DRAM rows are laid out physically in silicon; (ii) study undocumented on-die TRR mechanisms; and (iii) combine (i) and (ii) to evaluate the RowHammer security guarantees of modern DRAM chips. We show how U-TRR allows us to craft RowHammer access patterns that successfully circumvent the TRR mechanisms employed in 45 DRAM modules of the three major DRAM vendors. We find that the DRAM modules we analyze are vulnerable to RowHammer, having bit flips in up to 99.9% of all DRAM rows. We make U-TRR source code openly and freely available at [106].

cs.CR

HiRA: Hidden Row Activation for Reducing Refresh Latency of Off-the-Shelf DRAM Chips

DRAM is the building block of modern main memory systems. DRAM cells must be periodically refreshed to prevent data loss. Refresh operations degrade system performance by interfering with memory accesses. As DRAM chip density increases with technology node scaling, refresh operations also increase because: 1) the number of DRAM rows in a chip increases; and 2) DRAM cells need additional refresh operations to mitigate bit failures caused by RowHammer, a failure mechanism that becomes worse with technology node scaling. Thus, it is critical to enable refresh operations at low performance overhead. To this end, we propose a new operation, Hidden Row Activation (HiRA), and the HiRA Memory Controller (HiRA-MC). HiRA hides a refresh operation's latency by refreshing a row concurrently with accessing or refreshing another row within the same bank. Unlike prior works, HiRA achieves this parallelism without any modifications to off-the-shelf DRAM chips. To do so, it leverages the new observation that two rows in the same bank can be activated without data loss if the rows are connected to different charge restoration circuitry. We experimentally demonstrate on 56% real off-the-shelf DRAM chips that HiRA can reliably parallelize a DRAM row's refresh operation with refresh or activation of any of the 32% of the rows within the same bank. By doing so, HiRA reduces the overall latency of two refresh operations by 51.4%. HiRA-MC modifies the memory request scheduler to perform HiRA when a refresh operation can be performed concurrently with a memory access or another refresh. Our system-level evaluations show that HiRA-MC increases system performance by 12.6% and 3.73x as it reduces the performance degradation due to periodic refreshes and refreshes for RowHammer protection (preventive refreshes), respectively, for future DRAM chips with increased density and RowHammer vulnerability.

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BlockHammer: Preventing RowHammer at Low Cost by Blacklisting Rapidly-Accessed DRAM Rows

Aggressive memory density scaling causes modern DRAM devices to suffer from RowHammer, a phenomenon where rapidly activating a DRAM row can cause bit-flips in physically-nearby rows. Recent studies demonstrate that modern DRAM chips, including chips previously marketed as RowHammer-safe, are even more vulnerable to RowHammer than older chips. Many works show that attackers can exploit RowHammer bit-flips to reliably mount system-level attacks to escalate privilege and leak private data. Therefore, it is critical to ensure RowHammer-safe operation on all DRAM-based systems. Unfortunately, state-of-the-art RowHammer mitigation mechanisms face two major challenges. First, they incur increasingly higher performance and/or area overheads when applied to more vulnerable DRAM chips. Second, they require either proprietary information about or modifications to the DRAM chip design. In this paper, we show that it is possible to efficiently and scalably prevent RowHammer bit-flips without knowledge of or modification to DRAM internals. We introduce BlockHammer, a low-cost, effective, and easy-to-adopt RowHammer mitigation mechanism that overcomes the two key challenges by selectively throttling memory accesses that could otherwise cause RowHammer bit-flips. The key idea of BlockHammer is to (1) track row activation rates using area-efficient Bloom filters and (2) use the tracking data to ensure that no row is ever activated rapidly enough to induce RowHammer bit-flips. By doing so, BlockHammer (1) makes it impossible for a RowHammer bit-flip to occur and (2) greatly reduces a RowHammer attack's impact on the performance of co-running benign applications. Compared to state-of-the-art RowHammer mitigation mechanisms, BlockHammer provides competitive performance and energy when the system is not under a RowHammer attack and significantly better performance and energy when the system is under attack.

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Self-Managing DRAM: A Low-Cost Framework for Enabling Autonomous and Efficient in-DRAM Operations

The memory controller is in charge of managing DRAM maintenance operations (e.g., refresh, RowHammer protection, memory scrubbing) to reliably operate modern DRAM chips. Implementing new maintenance operations often necessitates modifications in the DRAM interface, memory controller, and potentially other system components. Such modifications are only possible with a new DRAM standard, which takes a long time to develop, likely leading to slow progress in the adoption of new architectural techniques in DRAM chips. We propose a new low-cost DRAM architecture, Self-Managing DRAM (SMD), that enables autonomous in-DRAM maintenance operations by transferring the responsibility for controlling maintenance operations from the memory controller to the SMD chip. To enable autonomous maintenance operations, we make a single modification to the DRAM interface, such that an SMD chip rejects memory controller accesses to DRAM regions under maintenance, while allowing memory accesses to others. Thus, SMD enables 1) implementing new in-DRAM maintenance mechanisms (or modifying existing ones) with no further changes in the DRAM interface or other system components, and 2) overlapping the latency of a maintenance operation in one DRAM region with the latency of accessing data in another. We evaluate SMD and show that it 1) can be implemented without adding new pins to the DDRx interface with low latency and area overhead, 2) achieves 4.1% average speedup across 20 four-core memory-intensive workloads over a DDR4-based system/DRAM co-design technique that intelligently parallelizes maintenance operations with memory accesses, and 3) guarantees forward progress for rejected memory accesses. We believe and hope SMD can enable innovations in DRAM architecture to rapidly come to fruition. We open source all SMD source code and data at https://github.com/CMU-SAFARI/SelfManagingDRAM.

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Understanding RowHammer Under Reduced Wordline Voltage: An Experimental Study Using Real DRAM Devices

RowHammer is a circuit-level DRAM vulnerability, where repeatedly activating and precharging a DRAM row, and thus alternating the voltage of a row's wordline between low and high voltage levels, can cause bit flips in physically nearby rows. Recent DRAM chips are more vulnerable to RowHammer: with technology node scaling, the minimum number of activate-precharge cycles to induce a RowHammer bit flip reduces and the RowHammer bit error rate increases. Therefore, it is critical to develop effective and scalable approaches to protect modern DRAM systems against RowHammer. To enable such solutions, it is essential to develop a deeper understanding of the RowHammer vulnerability of modern DRAM chips. However, even though the voltage toggling on a wordline is a key determinant of RowHammer vulnerability, no prior work experimentally demonstrates the effect of wordline voltage (VPP) on the RowHammer vulnerability. Our work closes this gap in understanding. This is the first work to experimentally demonstrate on 272 real DRAM chips that lowering VPP reduces a DRAM chip's RowHammer vulnerability. We show that lowering VPP 1) increases the number of activate-precharge cycles needed to induce a RowHammer bit flip by up to 85.8% with an average of 7.4% across all tested chips and 2) decreases the RowHammer bit error rate by up to 66.9% with an average of 15.2% across all tested chips. At the same time, reducing VPP marginally worsens a DRAM cell's access latency, charge restoration, and data retention time within the guardbands of system-level nominal timing parameters for 208 out of 272 tested chips. We conclude that reducing VPP is a promising strategy for reducing a DRAM chip's RowHammer vulnerability without requiring modifications to DRAM chips.

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DR-STRaNGe: End-to-End System Design for DRAM-based True Random Number Generators

Random number generation is an important task in a wide variety of critical applications including cryptographic algorithms, scientific simulations, and industrial testing tools. True Random Number Generators (TRNGs) produce truly random data by sampling a physical entropy source that typically requires custom hardware and suffers from long latency. To enable high-bandwidth and low-latency TRNGs on commodity devices, recent works propose TRNGs that use DRAM as an entropy source. Although prior works demonstrate promising DRAM-based TRNGs, integration of such mechanisms into real systems poses challenges. We identify three challenges for using DRAM-based TRNGs in current systems: (1) generating random numbers can degrade system performance by slowing down concurrently-running applications due to the interference between RNG and regular memory operations in the memory controller (i.e., RNG interference), (2) this RNG interference can degrade system fairness by unfairly prioritizing applications that intensively use random numbers (i.e., RNG applications), and (3) RNG applications can experience significant slowdowns due to the high RNG latency. We propose DR-STRaNGe, an end-to-end system design for DRAM-based TRNGs that (1) reduces the RNG interference by separating RNG requests from regular requests in the memory controller, (2) improves the system fairness with an RNG-aware memory request scheduler, and (3) hides the large TRNG latencies using a random number buffering mechanism with a new DRAM idleness predictor that accurately identifies idle DRAM periods. We evaluate DR-STRaNGe using a set of 186 multiprogrammed workloads. Compared to an RNG-oblivious baseline system, DR-STRaNGe improves the average performance of non-RNG and RNG applications by 17.9% and 25.1%, respectively. DR-STRaNGe improves average system fairness by 32.1% and reduces average energy consumption by 21%.

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PiDRAM: An FPGA-based Framework for End-to-end Evaluation of Processing-in-DRAM Techniques

DRAM-based main memory is used in nearly all computing systems as a major component. One way of overcoming the main memory bottleneck is to move computation near memory, a paradigm known as processing-in-memory (PiM). Recent PiM techniques provide a promising way to improve the performance and energy efficiency of existing and future systems at no additional DRAM hardware cost. We develop the Processing-in-DRAM (PiDRAM) framework, the first flexible, end-to-end, and open source framework that enables system integration studies and evaluation of real PiM techniques using real DRAM chips. We demonstrate a prototype of PiDRAM on an FPGA-based platform (Xilinx ZC706) that implements an open-source RISC-V system (Rocket Chip). To demonstrate the flexibility and ease of use of PiDRAM, we implement two PiM techniques: (1) RowClone, an in-DRAM copy and initialization mechanism (using command sequences proposed by ComputeDRAM), and (2) D-RaNGe, an in-DRAM true random number generator based on DRAM activation-latency failures. Our end-to-end evaluation of RowClone shows up to 14.6X speedup for copy and 12.6X initialization operations over CPU copy (i.e., conventional memcpy) and initialization (i.e., conventional calloc) operations. Our implementation of D-RaNGe provides high throughput true random numbers, reaching 8.30 Mb/s throughput. Over the Verilog and C++ basis provided by PiDRAM, implementing the required hardware and software components, implementing RowClone end-to-end takes 198 (565) and implementing D-RaNGe end-to-end takes 190 (78) lines of Verilog (C++) code. PiDRAM is open sourced on Github: https://github.com/CMU-SAFARI/PiDRAM.

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A Deeper Look into RowHammer`s Sensitivities: Experimental Analysis of Real DRAM Chips and Implications on Future Attacks and Defenses

RowHammer is a circuit-level DRAM vulnerability where repeatedly accessing (i.e., hammering) a DRAM row can cause bit flips in physically nearby rows. The RowHammer vulnerability worsens as DRAM cell size and cell-to-cell spacing shrink. Recent studies demonstrate that modern DRAM chips, including chips previously marketed as RowHammer-safe, are even more vulnerable to RowHammer than older chips such that the required hammer count to cause a bit flip has reduced by more than 10X in the last decade. Therefore, it is essential to develop a better understanding and in-depth insights into the RowHammer vulnerability of modern DRAM chips to more effectively secure current and future systems. Our goal in this paper is to provide insights into fundamental properties of the RowHammer vulnerability that are not yet rigorously studied by prior works, but can potentially be $i$) exploited to develop more effective RowHammer attacks or $ii$) leveraged to design more effective and efficient defense mechanisms. To this end, we present an experimental characterization using 248~DDR4 and 24~DDR3 modern DRAM chips from four major DRAM manufacturers demonstrating how the RowHammer effects vary with three fundamental properties: 1)~DRAM chip temperature, 2)~aggressor row active time, and 3)~victim DRAM cell's physical location. Among our 16 new observations, we highlight that a RowHammer bit flip 1)~is very likely to occur in a bounded range, specific to each DRAM cell (e.g., 5.4% of the vulnerable DRAM cells exhibit errors in the range 70C to 90C), 2)~is more likely to occur if the aggressor row is active for longer time (e.g., RowHammer vulnerability increases by 36% if we keep a DRAM row active for 15 column accesses), and 3)~is more likely to occur in certain physical regions of the DRAM module under attack (e.g., 5% of the rows are 2x more vulnerable than the remaining 95% of the rows).

cs.CR

CODIC: A Low-Cost Substrate for Enabling Custom In-DRAM Functionalities and Optimizations

DRAM is the dominant main memory technology used in modern computing systems. Computing systems implement a memory controller that interfaces with DRAM via DRAM commands. DRAM executes the given commands using internal components (e.g., access transistors, sense amplifiers) that are orchestrated by DRAM internal timings, which are fixed foreach DRAM command. Unfortunately, the use of fixed internal timings limits the types of operations that DRAM can perform and hinders the implementation of new functionalities and custom mechanisms that improve DRAM reliability, performance and energy. To overcome these limitations, we propose enabling programmable DRAM internal timings for controlling in-DRAM components. To this end, we design CODIC, a new low-cost DRAM substrate that enables fine-grained control over four previously fixed internal DRAM timings that are key to many DRAM operations. We implement CODIC with only minimal changes to the DRAM chip and the DDRx interface. To demonstrate the potential of CODIC, we propose two new CODIC-based security mechanisms that outperform state-of-the-art mechanisms in several ways: (1) a new DRAM Physical Unclonable Function (PUF) that is more robust and has significantly higher throughput than state-of-the-art DRAM PUFs, and (2) the first cold boot attack prevention mechanism that does not introduce any performance or energy overheads at runtime.

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Refresh Triggered Computation: Improving the Energy Efficiency of Convolutional Neural Network Accelerators

To employ a Convolutional Neural Network (CNN) in an energy-constrained embedded system, it is critical for the CNN implementation to be highly energy efficient. Many recent studies propose CNN accelerator architectures with custom computation units that try to improve energy-efficiency and performance of CNNs by minimizing data transfers from DRAM-based main memory. However, in these architectures, DRAM is still responsible for half of the overall energy consumption of the system, on average. A key factor of the high energy consumption of DRAM is the refresh overhead, which is estimated to consume 40% of the total DRAM energy. In this paper, we propose a new mechanism, Refresh Triggered Computation (RTC), that exploits the memory access patterns of CNN applications to reduce the number of refresh operations. We propose three RTC designs (min-RTC, mid-RTC, and full-RTC), each of which requires a different level of aggressiveness in terms of customization to the DRAM subsystem. All of our designs have small overhead. Even the most aggressive RTC design (i.e., full-RTC) imposes an area overhead of only 0.18% in a 16 Gb DRAM chip and can have less overhead for denser chips. Our experimental evaluation on six well-known CNNs show that RTC reduces average DRAM energy consumption by 24.4% and 61.3%, for the least aggressive and the most aggressive RTC implementations, respectively. Besides CNNs, we also evaluate our RTC mechanism on three workloads from other domains. We show that RTC saves 31.9% and 16.9% DRAM energy for Face Recognition and Bayesian Confidence Propagation Neural Network (BCPNN), respectively. We believe RTC can be applied to other applications whose memory access patterns remain predictable for a sufficiently long time.

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GateKeeper: A New Hardware Architecture for Accelerating Pre-Alignment in DNA Short Read Mapping

Motivation: High throughput DNA sequencing (HTS) technologies generate an excessive number of small DNA segments -- called short reads -- that cause significant computational burden. To analyze the entire genome, each of the billions of short reads must be mapped to a reference genome based on the similarity between a read and "candidate" locations in that reference genome. The similarity measurement, called alignment, formulated as an approximate string matching problem, is the computational bottleneck because: (1) it is implemented using quadratic-time dynamic programming algorithms, and (2) the majority of candidate locations in the reference genome do not align with a given read due to high dissimilarity. Calculating the alignment of such incorrect candidate locations consumes an overwhelming majority of a modern read mapper's execution time. Therefore, it is crucial to develop a fast and effective filter that can detect incorrect candidate locations and eliminate them before invoking computationally costly alignment operations. Results: We propose GateKeeper, a new hardware accelerator that functions as a pre-alignment step that quickly filters out most incorrect candidate locations. GateKeeper is the first design to accelerate pre-alignment using Field-Programmable Gate Arrays (FPGAs), which can perform pre-alignment much faster than software. GateKeeper can be integrated with any mapper that performs sequence alignment for verification. When implemented on a single FPGA chip, GateKeeper maintains high accuracy (on average >96%) while providing up to 90-fold and 130-fold speedup over the state-of-the-art software pre-alignment techniques, Adjacency Filter and Shifted Hamming Distance (SHD), respectively. The addition of GateKeeper as a pre-alignment step can reduce the verification time of the mrFAST mapper by a factor of 10. Availability: https://github.com/BilkentCompGen/GateKeeper

q-bio.GN

Bit-Exact ECC Recovery (BEER): Determining DRAM On-Die ECC Functions by Exploiting DRAM Data Retention Characteristics

Increasing single-cell DRAM error rates have pushed DRAM manufacturers to adopt on-die error-correction coding (ECC), which operates entirely within a DRAM chip to improve factory yield. The on-die ECC function and its effects on DRAM reliability are considered trade secrets, so only the manufacturer knows precisely how on-die ECC alters the externally-visible reliability characteristics. Consequently, on-die ECC obstructs third-party DRAM customers (e.g., test engineers, experimental researchers), who typically design, test, and validate systems based on these characteristics. To give third parties insight into precisely how on-die ECC transforms DRAM error patterns during error correction, we introduce Bit-Exact ECC Recovery (BEER), a new methodology for determining the full DRAM on-die ECC function (i.e., its parity-check matrix) without hardware tools, prerequisite knowledge about the DRAM chip or on-die ECC mechanism, or access to ECC metadata (e.g., error syndromes, parity information). BEER exploits the key insight that non-intrusively inducing data-retention errors with carefully-crafted test patterns reveals behavior that is unique to a specific ECC function. We use BEER to identify the ECC functions of 80 real LPDDR4 DRAM chips with on-die ECC from three major DRAM manufacturers. We evaluate BEER's correctness in simulation and performance on a real system to show that BEER is effective and practical across a wide range of on-die ECC functions. To demonstrate BEER's value, we propose and discuss several ways that third parties can use BEER to improve their design and testing practices. As a concrete example, we introduce and evaluate BEEP, the first error profiling methodology that uses the known on-die ECC function to recover the number and bit-exact locations of unobservable raw bit errors responsible for observable post-correction errors.

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Revisiting RowHammer: An Experimental Analysis of Modern DRAM Devices and Mitigation Techniques

In order to shed more light on how RowHammer affects modern and future devices at the circuit-level, we first present an experimental characterization of RowHammer on 1580 DRAM chips (408x DDR3, 652x DDR4, and 520x LPDDR4) from 300 DRAM modules (60x DDR3, 110x DDR4, and 130x LPDDR4) with RowHammer protection mechanisms disabled, spanning multiple different technology nodes from across each of the three major DRAM manufacturers. Our studies definitively show that newer DRAM chips are more vulnerable to RowHammer: as device feature size reduces, the number of activations needed to induce a RowHammer bit flip also reduces, to as few as 9.6k (4.8k to two rows each) in the most vulnerable chip we tested. We evaluate five state-of-the-art RowHammer mitigation mechanisms using cycle-accurate simulation in the context of real data taken from our chips to study how the mitigation mechanisms scale with chip vulnerability. We find that existing mechanisms either are not scalable or suffer from prohibitively large performance overheads in projected future devices given our observed trends of RowHammer vulnerability. Thus, it is critical to research more effective solutions to RowHammer.

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