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Hassen Souissi

Publications and source records attributed to Hassen Souissi.

3 recordsLinked to original sources

Electrically-injected room-temperature waveguide polariton laser

Exciton-polariton lasers are coherent light sources which do not require the population inversion (transparency) condition to be fulfilled. They have been conceptualized at the end of the XXth century but until now they operate almost exclusively under optical injection, which severely limits the widespread integration of the polariton-based devices implemented so far. Here we tackle this issue by reporting an electrically-pumped exciton-polariton laser based on GaN and operating at room temperature in a mode-locked regime. The laser architecture is close to the geometry of commercial ridge-waveguide GaN lasers, but based on a bulk GaN active region instead of quantum wells. Unique features of polariton lasers are demonstrated, in particular the breakdown of the transparency condition, which enables our polariton lasers to operate even when only a small fraction (20\%) of the cavity length is injected. Moreover, the large polaritonic gain allows for the operation of a short cavity length (60$μm$) compared to commercial lasers. From the very same sample, we also achieve polariton lasing under optical injection, confirming that the doped layers necessary for electrical injection do not prevent strong-coupling nor polariton lasing. Our results open a new perspective for polariton-based devices.

physics.optics↗

On the importance of Ni-Au-Ga interdiffusion in the formation of a Ni-Au / p-GaN ohmic contact

The Ni-Au-Ga interdiffusion mechanisms taking place during rapid thermal annealing (RTA) under oxygen atmosphere of a Ni-Au/p-GaN contact are investigated by high-resolution transmission electron microscopy (HR-TEM) coupled to energy dispersive X-ray spectroscopy (EDX). It is shown that oxygen-assisted, Ni diffusion to the top surface of the metallic contact through the formation of a nickel oxide (NiOx) is accompanied by Au diffusion down to the GaN surface, and by Ga out-diffusion through the GaN/metal interface. Electrical characterizations of the contact by Transmission Line Method (TLM) show that an ohmic contact is obtained as soon as a thin, Au-Ga interfacial layer is formed, even after complete diffusion of Ni or NiOx to the top surface of the contact. Our results clarify that the presence of Ni or NiOx at the interface is not the main origin of the ohmic-like behavior in such contacts. Auto-cleaning of the interface during the interdiffusion process may play a role, but TEM-EDX analysis evidences that the creation of Ga vacancies associated to the formation of a Ga-Au interfacial layer is crucial for reducing the Schottky barrier height, and maximizing the amount of current flowing through the contact.

cond-mat.mtrl-sci↗

Monolithic integration of ultraviolet microdisk lasers into photonic circuits in a III-nitride-on-silicon platform

Ultraviolet microdisk lasers are integrated monolithically into photonic circuits using a III-nitride on silicon platform with gallium nitride (GaN) as the main waveguiding layer. The photonic circuits consist of a microdisk and a pulley waveguide terminated by out-coupling gratings. We measure quality factors up to 3500 under continuous-wave excitation. Lasing is observed from 374 nm to 399 nm under pulsed excitation, achieving low threshold energies of $0.14 ~\text{mJ/cm}^2$ per pulse (threshold peak powers of $35 ~\text{kW/cm}^2$). A large peak to background dynamic of around 200 is observed at the out-coupling grating for small gaps of 50 nm between the disk and waveguide. These devices operate at the limit of what can be achieved with GaN in terms of operation wavelength.

physics.app-ph↗