Searcharxiv⌕ Search

arXiv subjects

Hongwu Peng

Publications and source records attributed to Hongwu Peng.

38 records · Page 3Linked to original sources

Binary Complex Neural Network Acceleration on FPGA

Being able to learn from complex data with phase information is imperative for many signal processing applications. Today' s real-valued deep neural networks (DNNs) have shown efficiency in latent information analysis but fall short when applied to the complex domain. Deep complex networks (DCN), in contrast, can learn from complex data, but have high computational costs; therefore, they cannot satisfy the instant decision-making requirements of many deployable systems dealing with short observations or short signal bursts. Recent, Binarized Complex Neural Network (BCNN), which integrates DCNs with binarized neural networks (BNN), shows great potential in classifying complex data in real-time. In this paper, we propose a structural pruning based accelerator of BCNN, which is able to provide more than 5000 frames/s inference throughput on edge devices. The high performance comes from both the algorithm and hardware sides. On the algorithm side, we conduct structural pruning to the original BCNN models and obtain 20 $\times$ pruning rates with negligible accuracy loss; on the hardware side, we propose a novel 2D convolution operation accelerator for the binary complex neural network. Experimental results show that the proposed design works with over 90% utilization and is able to achieve the inference throughput of 5882 frames/s and 4938 frames/s for complex NIN-Net and ResNet-18 using CIFAR-10 dataset and Alveo U280 Board.

cs.LG↗

Improving DNN Fault Tolerance using Weight Pruning and Differential Crossbar Mapping for ReRAM-based Edge AI

Recent research demonstrated the promise of using resistive random access memory (ReRAM) as an emerging technology to perform inherently parallel analog domain in-situ matrix-vector multiplication -- the intensive and key computation in deep neural networks (DNNs). However, hardware failure, such as stuck-at-fault defects, is one of the main concerns that impedes the ReRAM devices to be a feasible solution for real implementations. The existing solutions to address this issue usually require an optimization to be conducted for each individual device, which is impractical for mass-produced products (e.g., IoT devices). In this paper, we rethink the value of weight pruning in ReRAM-based DNN design from the perspective of model fault tolerance. And a differential mapping scheme is proposed to improve the fault tolerance under a high stuck-on fault rate. Our method can tolerate almost an order of magnitude higher failure rate than the traditional two-column method in representative DNN tasks. More importantly, our method does not require extra hardware cost compared to the traditional two-column mapping scheme. The improvement is universal and does not require the optimization process for each individual device.

cs.LG↗