arXiv subjects

I. V. Yaminsky

Publications and source records attributed to I. V. Yaminsky.

4 recordsLinked to original sources

arXiv2011

Quantitative methods for deconvolution of true topographical properties of object on the basis of AFM-images: Part 1. Contact tip-sample deformations

We assume that the sample height measured using AFM is reduced due to contact deformation. The Herz contact theory is applied for the quantitative description. General numerical solution is found. Analytical approximations for specific contact geometry are derived for the case of cylindrical sample. It is found that theoretical description are consistent with experimental data. The developed approach has allowed to determine elastic parameters of individual microobjects adsorbed on a surface of solid substrate.

cond-mat.mes-hall↗

arXiv2011

Quantitative methods for deconvolution of true topographical properties of object on the basis of measured AFM-images: Part 2. Broadening effect

Technique of the quantitative description of image broadening effect in AFM allowing to restore real geometrical parameters of object using two-parameters model (height and width at half-height) is developed. Application of the technique has allowed to receive the quantitative information about molecular structure of DNA-surfactant complexes.

cond-mat.mes-hall↗

arXiv2011

T4 DNA condensation in water-alcohol media

The process of compaction of high molecular weight DNA T4 is investigated directly in a AFM liquid cell. The AFM-images of globules formed by DNA molecules in the result of compaction in water-alcohol environments at high izopropanol concentration (80%) are received; it is found that at intermediate concentration of izopropanol (40-50%) the DNA molecules form partially compacted formations in which the separate coils of macromolecules twist in toroidal structures. It is shown using the technique of deconvolution of the AFM-images that the globule include only one closely packed DNA molecule. The model of DNA packing is proposed on the basis of AFM experiment.

cond-mat.soft↗

arXiv2011

Visualization of atomic structure using AFM: theoretical description

We suggest simple model of image formation in atomic force microscope (AFM) taking into account contact deformations of probe and sample during scanning. The model explains the possibility of AFM visualization of regular atomic or molecular structure when probe-sample contact area is greater than an area per atom or molecule in surface lattice. (This is usually the case when lattice to be studied has subnanometer unit cell parameters and AFM investigations are carried out in air in contact mode). Two special peculiarities of AFM visualization of two-dimensional lattice could be observed under such conditions: 1) the inversion of contrast of AFM images, and 2) visualization of "false atom" under single atomic vacancy of surface studied.

cond-mat.mtrl-sci↗