arXiv subjects

Iaroslav Lutsyk

Publications and source records attributed to Iaroslav Lutsyk.

6 recordsLinked to original sources

arXiv2026

Thickness-dependent degradation and optical access in epitaxial 2H-MoTe2 protected by metallic capping layers

We investigate degradation and surface protection of epitaxial 2H-MoTe2 films grown by molecular beam epitaxy on GaAs(111)B substrates. Using X-ray photoelectron spectroscopy (XPS), scanning tunneling microscopy, atomic force microscopy (AFM), Kelvin probe microscopy (KPM), Raman spectroscopy, and density functional theory (DFT), we examine the structural, chemical, and electronic evolution of MoTe2 protected by Co and Ni capping layers. XPS shows that the metallic caps effectively suppress oxidation during short-term air transfer, while revealing a pronounced Te-rich near-surface composition. With time, the caps become increasingly difficult to remove, suggesting gradual interfacial bonding promoted by excess tellurium and defect-rich MoTe2 interfaces. AFM and KPM reveal pronounced thickness-dependent ageing, with ultrathin regions showing markedly different contact-potential evolution from thicker films. DFT calculations support the sensitivity of work function and density of states to thickness and surface chemistry. Raman measurements through approximately 20 nm thick metallic caps demonstrate partial optical access to the protected material. Additional AFM and Raman observations suggest local formation of Te-rich nanostructures under laser illumination or near mechanically damaged regions. These results provide practical guidelines for protecting, transferring, delaminating, and optically characterizing air-sensitive MoTe2 and related van der Waals materials.

cond-mat.mtrl-sci↗

arXiv2026

Overcoming contact resistance at metal-2D semiconductor interfaces: atomically clean MoS2/Au ohmic junctions

The application of two-dimensional (2D) semiconductors, such as monolayer MoS2, is limited by the high contact resistance commonly attributed to interfacial barriers at metal contacts. Furthermore, the dependence of electrical conductivity on MoS2 thickness is still unsettled, as both increasing and decreasing trends with layer number have been reported. By showing the contrast between electrical transport of mono- and multilayer MoS2 exfoliated on Au under ultra-high vacuum (UHV) and ambient conditions, we experimentally prove that, contrary to the prevailing view in the literature, the intrinsic MoS2/Au junction is highly conductive and exhibits ohmic behaviour. Our results indicate that interfacial contamination is responsible for the high contact resistances reported to date and affects the thickness dependence of electrical transport, explaining the discrepancies observed in the literature. We rationalize those findings using electrical transport simulations. Lastly, we show that local force-mediated lamination on lightly contaminated contacts can recover pristine, ohmic contacts, offering a route towards nanoscale patterning.

cond-mat.mes-hall↗

arXiv2024

Moiré plane wave expansion model for scanning tunneling microscopy simulations of incommensurate two-dimensional materials

Incommensurate heterostructures of two-dimensional (2D) materials, despite their attractive electronic behaviour, are challenging to simulate because of the absence of translation symmetry. Experimental investigations of these structures often employ scanning tunneling microscopy (STM), however there is to date no comprehensive theory to simulate an STM image in such systems. In this paper, we present a geometry-based method to generate STM images in incommensurate van der Waals (vdW) heterostructures, which we call the moiré plane wave expansion model (MPWEM). We generate the STM images using a weighted sum of three image terms: the non-interacting STM images of (1) the substrate layer, (2) the adsorbate layer, and (3) a semi-empirical Fourier expansion of the moiré wavevectors obtained analytically which results from the interaction of (1) and (2). We illustrate and benchmark the model using selected vdW 2D systems composed of structurally and electronically distinct crystals, and show that the method reproduces experimental STM images down to angstrom-scale details. The MPWEM, thanks to its simplicity, can serve as an initial prediction tool prior to more computationally expensive calculations which are often limited by the number of atoms and the requirement of periodic supercells, and thus offers a promising class of computationally-friendly STM simulations, of high relevance in the growing field of twistronics.

cond-mat.mes-hall↗

arXiv2024

Evidence of directional structural superlubricity and Lévy flights in a van der Waals heterostructure

Structural superlubricity is a special frictionless contact in which two crystals are in incommensurate arrangement such that relative in-plane translation is associated with vanishing energy barrier crossing. So far, it has been realized in multilayer graphene and other van der Waals two-dimensional crystals with hexagonal or triangular crystalline symmetries, leading to isotropic frictionless contacts. Directional structural superlubricity, to date unrealized in two-dimensional systems, is possible when the reciprocal lattices of the two crystals coincide in one direction only. Here, we evidence directional structural superlubricity a $α$-bismuthene/graphite van der Waals system, manifested by spontaneous hopping of the islands over hundreds of nanometres at room temperature, resolved by low-energy electron microscopy and supported by registry simulations. Statistical analysis of individual and collective $α$-bismuthene islands populations reveal a heavy-tailed distribution of the hopping lengths and sticking times indicative of L{é}vy flight dynamics, largely unobserved in condensed-matter systems.

cond-mat.mes-hall↗

arXiv2023

Fourier Transform-Based Post-Processing Drift Compensation and Calibration Method for Scanning Probe Microscopy

Scanning probe microscopy (SPM) is ubiquitous in nanoscale science allowing the observation of features in real space down to the angstrom resolution. The scanning nature of SPM, wherein a sharp tip rasters the surface during which a physical setpoint is maintained via a control feedback loop, often implies that the image is subject to drift effects, leading to distortion of the resulting image. While there are \emph{in-operando} methods to compensate for the drift, correcting the residual linear drift in obtained images is often neglected. In this paper, we present a reciprocal space-based technique to compensate the linear drift in atomically-resolved scanning probe microscopy images without distinction of the fast and slow scanning directions; furthermore this method does not require the set of SPM images obtained for the different scanning directions. Instead, the compensation is made possible by the a priori knowledge of the lattice parameters. The method can also be used to characterize and calibrate the SPM instrument.

physics.ins-det↗

arXiv2023

Graphene on quartz modified with rhenium oxide as a semitransparent electrode for organic electronic

Our research shows that commercially available graphene on quartz modified with rhenium oxide meets the requirements for its use as a conductive and transparent anode in optoelectronic devices. The cluster growth of rhenium oxide enables an increase in the work function of graphene by 1.3 eV up to 5.2 eV, which guarantees an appropriate adjustment to the energy levels of the organic semiconductors used in OLED devices.

physics.app-ph↗