arXiv subjects

Ilya Olevsko

Publications and source records attributed to Ilya Olevsko.

3 recordsLinked to original sources

arXiv2026

Label-Free Microrefractometry of Interfacial Processes Using Fluorescent Smart Coverslips

Molecular dipoles near interfaces emit highly directional radiation due to near-field interactions, making surface-bound fluorophores sensitive probes of local physicochemical changes. We introduce smart coverslips, stably coated with uniform, brightly fluorescent nanobead films, that exploit refractive-index-dependent emission shifts for sensitive micro-refractometry in small volumes. Supercritical-angle fluorescence refractometry uses single back-focal-plane images to allow us real-time RI sensing and nanometric thin-film height measurements without the need for multi-angle or multi-wavelength acquisition. Our fast, label-free, and non-invasive approach allows measurements of thin-film properties and monitoring of interfacial dynamics on a standard inverted microscope and is broadly applicable to nanobiophotonics, chemical sensing, and in-situ materials analysis.

physics.optics↗

arXiv2026

Universal Nano-Bead Emitter Inks for Programmable Nanometric Fluorescent Architectures

Fabricating brightly fluorescent layers with nanometric thickness and digitally controlled lateral structuration remains a challenge for next-generation photonic devices, optical calibration standards, and biocompatible interfaces. Here, we introduce Nano-Bead Emitters (NBEs), hydrogel nanoparticles covalently functionalized with fluorophores, as a universal, water-processable ink platform for fabricating programmable nanometric fluorescent architectures. By immobilizing fluorophores within a charged nanohydrogel scaffold, the platform entirely decouples film morphology from dye solubility. This molecule-independent strategy enables spectrally distinct, inherently water-insoluble dyes to be processed using a single, standardized aqueous ink formulation. Combined with laser-induced forward transfer (LIFT) printing, this additive approach yields highly uniform fluorescent layers (~7 nm thickness, sub-nanometric roughness). This structural invariance produces complex multicolor patterns sharing identical thickness and surface morphology across all spectral channels, a critical requirement for quantitative optical calibration. Furthermore, LIFT printing provides programmable, layer-by-layer control over fluorescence intensity via successive deposition cycles, yielding precisely tunable brightness without aggregation-caused quenching. This maskless technique enables rapid, high-fidelity printing of both monochromatic and multicolor patterns over macroscopic areas with absolute spatial resolution. Finally, these universally compatible NBE inks stably deposit onto diverse substrates (glass, polymers, semiconductors, metasurfaces), effectively bridging scalable manufacturing with high-performance integrated photonic systems.

physics.optics↗

arXiv2023

A Colour-Encoded Nanometric Ruler for Axial Super-Resolution Microscopies

Recent progress has boosted the resolving power of optical microscopies to spatial dimensions well below the diffraction limit. Yet, axial super-resolution and axial single-molecule localisation typically require more complicated implementations than their lateral counterparts. In the present work, we propose a simple solution for axial metrology by providing a multi-layered single-excitation, dual-emission test slide, in which axial distance is colour-encoded. Our test slide combines on a standard microscope coverslip substrate two flat, thin, uniform and brightly emitting fluorophore layers, separated by a nanometric transparent spacer layer having a refractive index close to a biological cell. The ensemble is sealed in an index-matched protective polymer. As a proof-of-principle, we estimate the light confinement resulting from evanescent-wave excitation in total internal reflection fluorescence (TIRF) microscopy. Our test sample permits, even for the non-expert user, a facile axial metrology at the sub-100-nm scale, a critical requirement for axial super-resolution, as well as near-surface imaging, spectroscopy and sensing.

physics.optics↗