J. P. Reed | Searcharxiv

arXiv2009

Ultrafast Imaging and the "Phase Problem" for Inelastic X-Ray Scattering

We describe a new method for imaging ultrafast dynamics in condensed matter using inelastic x-ray scattering (IXS). We use the concepts of causality and irreversibility to construct a general solution to the inverse scattering problem (or "phase problem") for inelastic x-ray scattering, which enables direct imaging of dynamics of the electron density with resolutions of ~1 attosecond (10-18 sec) in time and < 1 A in space. This method is not a Fourier transform of IXS data, but a means to impose causality on the data and reconstruct the charge propagator. The method can also be applied to inelastic electron or neutron scattering. We give a general outline of phenomena that can and cannot be studied with this technique, and provide an outlook for the future.

cond-mat.other↗

arXiv2009

Implicit spatial averaging in inversion of inelastic x-ray scattering data

Inelastic x-ray scattering (IXS) now a widely used technique for studying the dynamics of electrons in condensed matter. We previously posed a solution to the phase problem for IXS [P. Abbamonte, et. al., Phys. Rev. Lett. {\bf 92}, 237401 (2004)], that allows explicit reconstruction of the density propagator of a system. The propagator represents, physically, the response of the system to an idealized, point perturbation, so provides direct, real-time images of electron motion with attosecond time resolution and $Å$-scale spatial resolution. Here we show that the images generated by our procedure, as it was originally posed, are spatial averages over all source locations. Within an idealized, atomic-like model, we show that in most cases a simple relationship to the complete, un-averaged response can still be determined. We illustrate this concept for recent IXS measurements of single crystal graphite.

cond-mat.str-el↗