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James L R Hickey

Publications and source records attributed to James L R Hickey.

2 recordsLinked to original sources

Heterogeneous local plastic deformation of interstitial free steel revealed using in-situ tensile testing and high angular resolution electron backscatter diffraction

Metals are important structural materials for transport and the built environment. Low carbon steels can fail through strain localisation due to the role of interstitial solute atoms (such as carbon and nitrogen) interacting with mobile dislocations, and this gives rise to the Portevin-Le Chatelier effect and the formation of Luders bands. In this work, we use in-situ tensile testing and observation with High Angular Resolution Electron Back Scatter Diffraction (HR-EBSD) to explore deformation patterning in two Interstitial Free (IF) steel samples. One of these steels was heat treated to trigger strain localisation and Luders bands whilst the other was heat treated to homogenise plastic strain and limit flow localisation. Our work reveals that flow localisation at the macroscopic scale is closely correlated with differences in the storage of dislocations at the microscale through analysis of the HR-EBSD derived fields of stored Geometrically Necessary Dislocations (GNDs). Homogeneous plastic flow correlates with more 'Face Centred Cubic (FCC)-like' deformation patterning in these Body Centred Cubic (BCC) materials, where work hardening is correlated with the association of dislocation networks which interact with triple junctions and grain boundaries, and our in-situ tests enable us to see how these fields develop. Our findings enable the modification of steel processing routes, and micromechanical models, based upon information obtained from these in-situ tests.

cond-mat.mtrl-sci↗

Understanding deformation with high angular resolution electron backscatter diffraction (HR-EBSD)

High angular resolution electron backscatter diffraction (HR-EBSD) affords an increase in angular resolution, as compared to 'conventional' Hough transform based EBSD, of two orders of magnitude, enabling measurements of relative misorientations of 1E-4 rads (~ 0.006 °) and changes in (deviatoric) lattice strain with a precision of 1E-4. This is achieved through direct comparison of two or more diffraction patterns using sophisticated cross-correlation based image analysis routines. Image shifts between zone axes in the two-correlated diffraction pattern are measured with sub-pixel precision and this realises the ability to measure changes in interplanar angles and lattice orientation with a high degree of sensitivity. These shifts are linked to strains and lattice rotations through simple geometry. In this manuscript, we outline the basis of the technique and two case studies that highlight its potential to tackle real materials science challenges, such as deformation patterning in polycrystalline alloys.

physics.ins-det↗