SearcharxivSearch

arXiv subjects

Jan Mistrik

Publications and source records attributed to Jan Mistrik.

2 recordsLinked to original sources

A comparison of phase change materials in reconfigurable silicon photonic directional couplers

The unique optical properties of phase change materials (PCMs) can be exploited to develop efficient reconfigurable photonic devices. Here, we design, model, and compare the performance of programmable 1X2 optical couplers based on: Ge$_2$Sb$_2$Te$_5$, Ge$_2$Sb$_2$Se$_4$Te$_1$, Sb$_2$Se$_3$, and Sb$_2$S$_3$ PCMs. Once programmed, these devices are passive, which can reduce the overall energy consumed compared to thermo-optic or electro-optic reconfigurable devices. Of all the PCMs studied, our ellipsometry refractive index measurements show that Sb$_2$S$_3$ has the lowest absorption in the telecommunications wavelength band. Moreover, Sb$_2$S$_3$-based couplers show the best overall performance, with the lowest insertion losses in both the amorphous and crystalline states. We show that by growth crystallization tuning at least four different coupling ratios can be reliably programmed into the Sb$_2$S$_3$ directional couplers. We used this effect to design a 2-bit tuneable Sb$_2$S$_3$ directional coupler with a dynamic range close to 32 dB. The bit-depth of the coupler appears to be limited by the crystallization stochasticity.

physics.optics

Investigation of the quality of an As35S65 grating by spectroscopic ellipsometry

The quality of an As35S65 chalcogenide glass (ChG) grating fabricated by electron beam lithography (EBL) was characterized by optical scatterometry based on spectroscopic ellipsometry (SE) in the visible and near infrared spectral range and complementary techniques providing direct images, especially atomic force microscopy (AFM). The geometric dimensions and the shape of patterned grating lines were determined by fitting modeled values (calculated by the Fourier modal method) to SE experimental data. A simple power-dependent function with only one variable parameter was successfully used to describe the shape of the patterned lines. The result yielded by SE is shown to correspond to AFM measurement with high accuracy, provided that optical constants of ChG modified by EBL were used in the fitting procedure. The line edge roughness (LER) of the grating was also investigated by further fitting the SE data to find out that no LER is optically detectable in the spectral range used, which is essential for the functionality of optical tools fabricated by EBL.

physics.optics