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Jan-Lucas Uslu

Publications and source records attributed to Jan-Lucas Uslu.

7 recordsLinked to original sources

Predict before you train: Scaling Laws for particle physics foundation models

The largest machine learning models in particle physics are also the most expensive to train, yet the return on scaling a given architecture cannot be estimated before that compute is spent. Scaling laws have been fit for jets, but none has yet been shown to predict the performance of models it was not fit on. We show that, for a generic transformer pretrained on collider jets, it can be forecast. Fitting a joint model-and-data scaling law on small models alone, spanning three orders of magnitude of training compute, we predict the loss of models trained afterward with more than one hundred times more compute to within one percent. We then connect the forecast to downstream physics performance: across two standard tagging benchmarks, lower pretraining loss yields systematically lower fine-tuning loss and higher background rejection after fine-tuning. Within this model family and these tasks, a compute budget can therefore be translated into expected physics performance before any large model is trained. The final frontier model is consistent with the published numbers for current state-of-the-art physics-aware foundation models trained on the same corpus, on accuracy, AUC, and quark/gluon rejection, with a residual edge for the physics-aware model only in the high-purity tail of top tagging. We release five pretrained models spanning multiple sizes, together with the complete training recipe and code.

hep-ex

Towards Engineering Scaling Laws with Pretraining Data Composition

Neural scaling laws describe how model performance improves as a power law in compute, model size, and dataset size. While well-established for large language models, these relationships are emerging for large models in particle physics. As with language, empirical studies show that the performance scales as a power law. However, unlike natural language or image domains, fundamental physics has high-fidelity simulators that produce synthetic data cheaply. This favors scaling regimes where additional data is cheaper than additional parameters, and allows the pretraining dataset itself to be engineered to influence the scaling. For the task of classifying hadronic jets produced in collisions of high-energy particle beams, we show that the scaling behavior can be engineered towards requiring more data rather than larger models by inclusion of pretraining data which is more diverse and better aligned with the downstream classification task.

hep-ex

Terminal-Bench: Benchmarking Agents on Hard, Realistic Tasks in Command Line Interfaces

AI agents may soon become capable of autonomously completing valuable, long-horizon tasks in diverse domains. Current benchmarks either do not measure real-world tasks, or are not sufficiently difficult to meaningfully measure frontier models. To this end, we present Terminal-Bench 2.0: a carefully curated hard benchmark composed of 89 tasks in computer terminal environments inspired by problems from real workflows. Each task features a unique environment, human-written solution, and comprehensive tests for verification. We show that frontier models and agents score less than 65\% on the benchmark and conduct an error analysis to identify areas for model and agent improvement. We publish the dataset and evaluation harness to assist developers and researchers in future work at https://www.tbench.ai/ .

cs.SE

Deep Learning to Automate Parameter Extraction and Model Fitting of Two-Dimensional Transistors

We present a deep learning approach to extract physical parameters (e.g., mobility, Schottky contact barrier height, defect profiles) of two-dimensional (2D) transistors from electrical measurements, enabling automated parameter extraction and technology computer-aided design (TCAD) fitting. To facilitate this task, we implement a simple data augmentation and pre-training approach by training a secondary neural network to approximate a physics-based device simulator. This method enables high-quality fits after training the neural network on electrical data generated from physics-based simulations of ~500 devices, a factor >40$\times$ fewer than other recent efforts. Consequently, fitting can be achieved by training on physically rigorous TCAD models, including complex geometry, self-consistent transport, and electrostatic effects, and is not limited to computationally inexpensive compact models. We apply our approach to reverse-engineer key parameters from experimental monolayer WS$_2$ transistors, achieving a median coefficient of determination ($R^2$) = 0.99 when fitting measured electrical data. We also demonstrate that this approach generalizes and scales well by reverse-engineering electrical data on high-electron-mobility transistors while fitting 35 parameters simultaneously. To facilitate future research on deep learning approaches for inverse transistor design, we have published our code and sample data sets online.

cs.LG

MaskTerial: A Foundation Model for Automated 2D Material Flake Detection

The detection and classification of exfoliated two-dimensional (2D) material flakes from optical microscope images can be automated using computer vision algorithms. This has the potential to increase the accuracy and objectivity of classification and the efficiency of sample fabrication, and it allows for large-scale data collection. Existing algorithms often exhibit challenges in identifying low-contrast materials and typically require large amounts of training data. Here, we present a deep learning model, called MaskTerial, that uses an instance segmentation network to reliably identify 2D material flakes. The model is extensively pre-trained using a synthetic data generator, that generates realistic microscopy images from unlabeled data. This results in a model that can to quickly adapt to new materials with as little as 5 to 10 images. Furthermore, an uncertainty estimation model is used to finally classify the predictions based on optical contrast. We evaluate our method on eight different datasets comprising five different 2D materials and demonstrate significant improvements over existing techniques in the detection of low-contrast materials such as hexagonal boron nitride.

cs.CV

Quantitative determination of twist angle and strain in Van der Waals moiré superlattices

Scanning probe techniques are popular, non-destructive ways to visualize the real space structure of Van der Waals moirés. The high lateral spatial resolution provided by these techniques enables extracting the moiré lattice vectors from a scanning probe image. We have found that the extracted values, while precise, are not necessarily accurate. Scan-to-scan variations in the behavior of the piezos which drive the scanning probe, and thermally-driven slow relative drift between probe and sample, produce systematic errors in the extraction of lattice vectors. In this Letter, we identify the errors and provide a protocol to correct for them. Applying this protocol to an ensemble of ten successive scans of near-magic-angle twisted bilayer graphene, we are able to reduce our errors in extracting lattice vectors to less than 1%. This translates to extracting twist angles with a statistical uncertainty less than 0.001° and uniaxial heterostrain with uncertainty on the order of 0.002%.

cond-mat.mtrl-sci

An open-source robust machine learning platform for real-time detection and classification of 2D material flakes

The most widely used method for obtaining high-quality two-dimensional materials is through mechanical exfoliation of bulk crystals. Manual identification of suitable flakes from the resulting random distribution of crystal thicknesses and sizes on a substrate is a time-consuming, tedious task. Here, we present a platform for fully automated scanning, detection, and classification of two-dimensional materials, the source code of which we make openly available. Our platform is designed to be accurate, reliable, fast, and versatile in integrating new materials, making it suitable for everyday laboratory work. The implementation allows fully automated scanning and analysis of wafers with an average inference time of 100 ms for images of 2.3 Mpixels. The developed detection algorithm is based on a combination of the flakes' optical contrast toward the substrate and their geometric shape. We demonstrate that it is able to detect the majority of exfoliated flakes of various materials, with an average recall (AR50) between 67% and 89%. We also show that the algorithm can be trained with as few as five flakes of a given material, which we demonstrate for the examples of few-layer graphene, WSe$_2$, MoSe$_2$, CrI$_3$, 1T-TaS$_2$ and hexagonal BN. Our platform has been tested over a two-year period, during which more than $10^6$ images of multiple different materials were acquired by over 30 individual researchers.

cond-mat.mes-hall