Automated Grain Boundary Detection for Bright-Field Transmission Electron Microscopy Images via U-Net
Quantification of microstructures is crucial for understanding processing-structure and structure-property relationships in polycrystalline materials. Delineating grain boundaries in bright-field transmission electron micrographs, however, is challenging due to complex diffraction contrast in images. Conventional edge detection algorithms are inadequate; instead, manual tracing is usually required. This study demonstrates the first successful machine-learning approach for grain-boundary detection in bright-field transmission electron micrographs. The proposed methodology uses a U-Net convolutional neural network trained on carefully constructed data from bright-field images and hand-tracings available from prior studies, combined with targeted post-processing algorithms to preserve fine features of interest. The image processing pipeline accurately estimates grain-boundary positions, avoiding segmentation in regions with intragrain contrast and identifying low-contrast boundaries. Our approach is validated by directly comparing microstructural markers (i.e., grain centroids) identified in U-Net predictions with those identified in hand tracings; furthermore, the grain size distributions obtained from the two techniques show notable overlap when compared using t-, Kolmogorov-Smirnov, and Cramer-von Mises tests. The technique is then successfully applied to interpret new aluminum film microstructures having different image characteristics from the training data, and preliminary results from Pt and Pd microstructures are presented, highlighting the versatility of our approach for grain-boundary identification in bright-field micrographs.